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Deep metric learning has yielded impressive results in tasks such as clustering and image retrieval by leveraging neural networks to obtain highly discriminative feature embeddings, which can be used to group samples into different classes.…

Computer Vision and Pattern Recognition · Computer Science 2020-07-21 Ismail Elezi , Sebastiano Vascon , Alessandro Torcinovich , Marcello Pelillo , Laura Leal-Taixe

Deep metric learning seeks to define an embedding where semantically similar images are embedded to nearby locations, and semantically dissimilar images are embedded to distant locations. Substantial work has focused on loss functions and…

Computer Vision and Pattern Recognition · Computer Science 2020-03-20 Hong Xuan , Abby Stylianou , Robert Pless

Deep Metric Learning (DML) is arguably one of the most influential lines of research for learning visual similarities with many proposed approaches every year. Although the field benefits from the rapid progress, the divergence in training…

Computer Vision and Pattern Recognition · Computer Science 2020-08-04 Karsten Roth , Timo Milbich , Samarth Sinha , Prateek Gupta , Björn Ommer , Joseph Paul Cohen

Contrastive learning has become a key component of self-supervised learning approaches for computer vision. By learning to embed two augmented versions of the same image close to each other and to push the embeddings of different images…

Computer Vision and Pattern Recognition · Computer Science 2020-12-07 Yannis Kalantidis , Mert Bulent Sariyildiz , Noe Pion , Philippe Weinzaepfel , Diane Larlus

Deep metric learning (DML) is a popular approach for images retrieval, solving verification (same or not) problems and addressing open set classification. Arguably, the most common DML approach is with triplet loss, despite significant…

Machine Learning · Computer Science 2019-12-02 Istvan Fehervari , Avinash Ravichandran , Srikar Appalaraju

Contrastive learning has gained significant attention as a method for self-supervised learning. The contrastive loss function ensures that embeddings of positive sample pairs (e.g., different samples from the same class or different views…

Not all positive pairs are beneficial to time series contrastive learning. In this paper, we study two types of bad positive pairs that can impair the quality of time series representation learned through contrastive learning: the noisy…

Machine Learning · Computer Science 2024-03-29 Xiang Lan , Hanshu Yan , Shenda Hong , Mengling Feng

Objective functions that optimize deep neural networks play a vital role in creating an enhanced feature representation of the input data. Although cross-entropy-based loss formulations have been extensively used in a variety of supervised…

Computer Vision and Pattern Recognition · Computer Science 2023-12-19 Deen Dayal Mohan , Bhavin Jawade , Srirangaraj Setlur , Venu Govindaraj

Deep clustering successfully provides more effective features than conventional ones and thus becomes an important technique in current unsupervised learning. However, most deep clustering methods ignore the vital positive and negative…

Computer Vision and Pattern Recognition · Computer Science 2021-03-10 Zhiyuan Dang , Cheng Deng , Xu Yang , Heng Huang

The goal of metric learning is to learn a function that maps samples to a lower-dimensional space where similar samples lie closer than dissimilar ones. Particularly, deep metric learning utilizes neural networks to learn such a mapping.…

Computer Vision and Pattern Recognition · Computer Science 2021-06-14 Jenny Seidenschwarz , Ismail Elezi , Laura Leal-Taixé

Contrastive learning is a major studied topic in metric learning. However, sampling effective contrastive pairs remains a challenge due to factors such as limited batch size, imbalanced data distribution, and the risk of overfitting. In…

Computer Vision and Pattern Recognition · Computer Science 2023-08-02 Bolun Cai , Pengfei Xiong , Shangxuan Tian

Deep distance metric learning (DDML), which is proposed to learn image similarity metrics in an end-to-end manner based on the convolution neural network, has achieved encouraging results in many computer vision tasks.$L2$-normalization in…

Computer Vision and Pattern Recognition · Computer Science 2018-03-29 Xuefei Zhe , Shifeng Chen , Hong Yan

In this paper, we explore the application of mean field theory, a technique from statistical physics, to deep metric learning and address the high training complexity commonly associated with conventional metric learning loss functions. By…

Machine Learning · Computer Science 2023-06-28 Takuya Furusawa

Deep embeddings answer one simple question: How similar are two images? Learning these embeddings is the bedrock of verification, zero-shot learning, and visual search. The most prominent approaches optimize a deep convolutional network…

Computer Vision and Pattern Recognition · Computer Science 2018-01-17 Chao-Yuan Wu , R. Manmatha , Alexander J. Smola , Philipp Krähenbühl

Learning to rank has recently emerged as an attractive technique to train deep convolutional neural networks for various computer vision tasks. Pairwise ranking, in particular, has been successful in multi-label image classification,…

Computer Vision and Pattern Recognition · Computer Science 2017-06-02 Yuncheng Li , Yale Song , Jiebo Luo

This paper presents a hardness-aware deep metric learning (HDML) framework. Most previous deep metric learning methods employ the hard negative mining strategy to alleviate the lack of informative samples for training. However, this mining…

Computer Vision and Pattern Recognition · Computer Science 2019-12-05 Wenzhao Zheng , Zhaodong Chen , Jiwen Lu , Jie Zhou

Intelligent diagnosis method based on data-driven and deep learning is an attractive and meaningful field in recent years. However, in practical application scenarios, the imbalance of time-series fault is an urgent problem to be solved.…

Machine Learning · Computer Science 2021-07-15 Xingtai Gui , Jiyang Zhang

Mining informative negative instances are of central importance to deep metric learning (DML), however this task is intrinsically limited by mini-batch training, where only a mini-batch of instances is accessible at each iteration. In this…

Machine Learning · Computer Science 2020-04-22 Xun Wang , Haozhi Zhang , Weilin Huang , Matthew R. Scott

Nowadays, deep learning is the standard approach for a wide range of problems, including biometrics, such as face recognition and speech recognition, etc. Biometric problems often use deep learning models to extract features from images,…

Computer Vision and Pattern Recognition · Computer Science 2022-02-14 Pedro Silva , Gladston Moreira , Vander Freitas , Rodrigo Silva , David Menotti , Eduardo Luz

Learning the distance metric between pairs of samples has been studied for image retrieval and clustering. With the remarkable success of pair-based metric learning losses, recent works have proposed the use of generated synthetic points on…

Computer Vision and Pattern Recognition · Computer Science 2020-04-24 Byungsoo Ko , Geonmo Gu