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The ferroelectricity in $\mathrm{HfO}_2$ thin films is widely attributed to the formation of a polar orthorhombic phase named OIII phase. However, the complexity of OIII phase originated from its low symmetry becomes an obstacle for…

Materials Science · Physics 2026-03-17 Chenxi Yu , Jiajia Zhang , Xujin Song , Fei Liu , Jinfeng Kang

The discovery of ferroelectricity in both pure and doped HfO$_2$-based thin films have revitalized the interest in using ferroelectrics for nanoscale device applications. To take advantage of this silicon-compatible ferroelectric,…

Materials Science · Physics 2019-05-22 Shi Liu , Brendan M Hanrahan

A comparative theoretical study is presented for the rhombohedral R3 and R3m phase HfO2, of two possible forms in its heavily Zr-doped ferroelectric thin films found recently in experiments. Their structural stability and polarization under…

Materials Science · Physics 2023-07-03 Wenbin Ouyang , Fanghao Jia , Wei Ren

Hafnia (HfO$_2$)-based thin films have promising applications in nanoscale electronic devices due to their robust ferroelectricity and integration with silicon. However, HfO$_2$ has various stable and metastable polymorphs with quite…

Ferroelectric HfO$_2$ has emerged as a highly promising material for high-density nonvolatile memory and nanoscale transistor applications. However, the uncertain origin of polarization in HfO$_2$ limits our ability to fully understand and…

Materials Science · Physics 2026-03-11 Seongjoo Jung , Turan Birol

The question of whether one can systematically identify (previously unknown) ferroelectric phases of a given material is addressed, taking hafnia (HfO$_2$) as an example. Low free energy phases at various pressures and temperatures are…

Materials Science · Physics 2014-08-28 Tran Doan Huan , Vinit Sharma , George A. Rossetti, , Rampi Ramprasad

HfO$_2$- and ZrO$_2$-based ferroelectric thin films have emerged as promising candidates for the gate oxides of next generation electronic devices. Recent work has experimentally demonstrated that a tetragonal/orthorhombic (t/o-) phase…

Mesoscale and Nanoscale Physics · Physics 2024-03-11 Prabhat Kumar , Michael Hoffmann , Andrew Nonaka , Sayeef Salahuddin , Zhi Yao

The metastable nature of the ferroelectric phase of HfO$_2$ is a significant impediment to its industrial application as a functional ferroelectric material. In fact, no polar phases exist in the bulk phase diagram of HfO$_2$, which shows a…

Materials Science · Physics 2024-01-11 Binayak Mukherjee , Natalya S. Fedorova , Jorge Íñiguez-González

The discovery of ferroelectric HfO2 in thin films and more recently in bulk is an important breakthrough because of its silicon-compatibility and unexpectedly persistent polarization at low dimensions, but the origin of its ferroelectricity…

Computational Physics · Physics 2021-06-24 Ri He , Hongyu Wu , Shi Liu , Houfang Liu , X. Renshaw Wang , Zhicheng Zhong

Ferroelectric memories experienced a revival in the last decade due to the discovery of ferroelectricity in HfO$_2$-based nanometer-thick thin films. These films exhibit exceptional silicon compatibility, overcoming the scaling and…

Materials Science · Physics 2024-08-27 Tianyuan Zhu , Shiqing Deng , Shi Liu

Since its discovery, ferroelectric hafnia has been extensively studied due to its CMOS-compatibility and ability to remain polarized at sub-10 nm thicknesses. The ferroelectric behaviour is generally attributed to a polar orthorhombic…

Materials Science · Physics 2026-04-17 Johanna van Gent Gonzalez , Ewout van der Veer , Yulei Li , Daniel A. Chaney , Beatriz Noheda

Ferroelectric HfO2 films are usually polycrystalline and contain a mixture of polar and nonpolar phases. This challenges the understanding and control of polar phase stabilization and ferroelectric properties. Several factors such as…

Materials Science · Physics 2023-12-14 Tingfeng Song , Veniero Lenzi , José P. B. Silva , Luís Marques , Ignasi Fina , Florencio Sánchez

In this work, we carry out first-principles calculations and lattice mode analysis to investigate the polarization switching mechanism in HfO$_2$. Because the stability of the polar orthorhombic $Pca2_1$ phase of HfO$_2$ arises from a…

Materials Science · Physics 2021-08-31 Yubo Qi , Sobhit Singh , Karin M. Rabe

HfO2, a simple binary oxide, holds ultra-scalable ferroelectricity integrable into silicon technology. Polar orthorhombic (Pbc21) form in ultra-thin-films ascribes as the plausible root-cause of the astonishing ferroelectricity, which has…

Hafnia (HfO2) is a silicon-compatible dielectric material, yet stabilizing its desired but metastable ferroelectric phase remains challenging. Phase stability predictions by density functional theory (DFT) have provided crucial guidance,…

Materials Science · Physics 2026-04-21 Yiheng Shen , Chang Liu , Wei Xie , Wei Ren

Phase stabilization continues to be a critical issue in hafnium oxide (HfO$_2$) due to the interdependence of various contributing factors. Using first-principles calculations, we analyze the effects of strain and doping on stabilizing the…

Materials Science · Physics 2025-01-03 Adedamola D. Aladese , Xiao Shen

Ferroelectric hafnia is being explored for next generation electronics due to its robust ferroelectricity in nanoscale samples and its compatibility with silicon. However, its ferroelectricity is not understood. Other ferroelectrics usually…

Materials Science · Physics 2022-04-15 Aldo Raeliarijaona , R. E. Cohen

The rotational instability of the electric polarization P during phase transformations between ferroelectric phases is of great practical interest, since it may be accompanied by extremely large values of the piezoelectric coefficient, and…

Materials Science · Physics 2016-02-24 F. Cordero , H. T. Langhammer , T. Müller , V. Buscaglia , P. Nanni

The discovery of ferroelectric polarization in HfO2-based ultrathin films has spawned a lot of interest due to their potential applications in data storage. Recently, a new R3m rhombohedral phase was proposed to be responsible for the…

Materials Science · Physics 2020-07-29 Yuke Zhang , Qiong Yang , Lingling Tao , Evgeny Y. Tsymbal , Vitaly Alexandrov

Ferroelectric HfO2 is a promising candidate for next-generation memory devices due to its CMOS compatibility and ability to retain polarization at nanometer scales. However, the polar orthorhombic phase (Pca2_1) responsible for…

Materials Science · Physics 2026-03-27 Jian Huang , Gwan Yeong Jung , Pravan Omprakash , Guodong Ren , Xin Li , Du Li , Xiaoshan Xu , Li Yang , Rohan Mishra
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