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There are two main projections used to transform, and reconstruct, field ion micrographs or atom probe tomography data into atomic coordinates at the specimen surface and, subsequently, in three-dimensions. In this article, we present a…

Instrumentation and Detectors · Physics 2017-05-24 Frédéric De Geuser , Baptiste Gault

Atom interferometers are promising tools for precision measurement with applications ranging from geophysical exploration to tests of the equivalence principle of general relativity, or the detection of gravitational waves. Their optimal…

We demonstrate improved detection of small trapped atomic ensembles through advanced post-processing and optimal analysis of absorption images. A fringe removal algorithm reduces imaging noise to the fundamental photon-shot-noise level and…

Atomic Physics · Physics 2010-12-17 C. F. Ockeloen , A. F. Tauschinsky , R. J. C. Spreeuw , S. Whitlock

Space-based direct imaging provides prospects for detection and spectral characterization of exoplanets at optical and near-infrared wavelengths. Integral field spectrographs (IFS) have been historically baselined for these mission…

Earth and Planetary Astrophysics · Physics 2024-03-26 Jingwen Zhang , Michael Bottom , Eugene Serabyn

The {\AA}ngstr\"om-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition.…

Porous microstructures, while central to many functional materials, remain difficult to characterize quantitatively by atom probe tomography (APT). Although several strategies have been proposed over the past decade, most remain constrained…

Instrumentation and Detectors · Physics 2025-10-28 Lukas Worch , James O. Douglas , Kavin Arunasalam , Baptiste Gault , Valeria Nicolosi , Michele Shelly Conroy

Utilizing the Pauli equation based multislice method, introduced in Phys. Rev. Lett. 116, 127203 (2016), we study the atomic resolution differential phase contrast (DPC) imaging on an example of a hard magnet FePt with in-plane…

Materials Science · Physics 2019-06-05 Alexander Edström , Axel Lubk , Ján Rusz

Time-resolved atom interferometry, as employed in applications such as gravitational wave detection and searches for ultra-light dark matter, requires precise control over systematic effects. In this work, we investigate phase noise arising…

Atomic Physics · Physics 2025-11-25 Noam Mouelle , Jeremiah Mitchell , Valerie Gibson , Ulrich Schneider

Molecular-level understanding of the interactions between the constituents of an atomic structure is essential for designing novel materials in various applications. This need goes beyond the basic knowledge of the number and types of…

Nuclear spin imaging at the atomic level is essential for the understanding of fundamental biological phenomena and for applications such as drug discovery. The advent of novel nano-scale sensors has given hope of achieving the…

Quantum Physics · Physics 2015-11-25 Ashok Ajoy , Ulf Bissbort , Mikhail D. Lukin , Ronald L. Walsworth , Paola Cappellaro

High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…

Mesoscale and Nanoscale Physics · Physics 2014-08-27 Prokop Hapala , Georgy Kichin , Christian Wagner , F. Stefan Tautz , Ruslan Temirov , Pavel Jelinek

We report on an ion-optical system that serves as a microscope for ultracold ground state and Rydberg atoms. The system is designed to achieve a magnification of up to 1000 and a spatial resolution in the 100 nm range, thereby surpassing…

Atomic Physics · Physics 2017-07-17 Markus Stecker , Hannah Schefzyk , József Fortágh , Andreas Günther

Coherent interactions between electromagnetic and matter waves lie at the heart of quantum science and technology. However, the diffraction nature of light has limited the scalability of many atom-light based quantum systems. Here, we use…

Atomic Physics · Physics 2018-01-23 Mingjie Xin , Wui Seng Leong , Zilong Chen , Shau-Yu Lan

Transmission electron microscopy and spectroscopy currently enable the acquisition of spatially resolved spectral information from a specimen by focusing electron beams down to a sub-Angstrom spot and then analyzing the energy of the…

Materials Science · Physics 2022-09-12 Andrea Konečná , Fadil Iyikanat , F. Javier García de Abajo

Optically pumped magnetometers (OPMs) have emerged as a powerful technique for high-resolution magnetic field imaging. However, achieving sub-millimeter spatial resolution at sub-picotesla sensitivities ($\mathrm{< 1\,pT/\sqrt{Hz}}$)…

We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…

Chemical Physics · Physics 2016-09-28 Yuval Ebenstein , Eyal Yoskovitz , Ronny Costi , Asaf Aharoni , Uri Banin

Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…

Instrumentation and Detectors · Physics 2025-06-10 Simon Laflamme , Bugrahan Guner , Omur E. Dagdeviren

High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) is a vital tool for characterizing single-atom catalysts (SACs). However, reliable elemental identification of different atoms remains challenging because…

Materials Science · Physics 2025-05-09 Yangfan Li , Yue Pan , Xincheng Lei , Weiwei Chen , Yang Shen , Mengshu Ge , Xiaozhi Liu , Dong Su

Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…

Materials Science · Physics 2008-08-04 Jannik C. Meyer , C. O. Girit , M. F. Crommie , A. Zettl

Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…

Applied Physics · Physics 2020-07-31 M. Chighizola , L. Puricelli , L. Bellon , A. Podestà