Related papers: Phase Reconstruction of a Cu(001) Seed Layer from …
The step-wise growth of epitaxial Fe on Cu(001)/Si(001), investigated by in-situ polarized neutron reflectometry is presented. A sputter deposition system was integrated into the neutron reflectometer AMOR at the Swiss neutron spallation…
The reconstructions of the InP(001) surface prepared by molecular beam epitaxy have been studied with in situ reflection high-energy electron diffraction (RHEED) and scanning tunneling microscopy (STM). The growth chamber contains a highly…
The scattering length density profile for a thin film structure can be determined uniquely if both modulus and phase of the reflection coefficient is known. Here, we describe a method for recovering the phase information which utilize a…
Phase reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction of both radiation-resistant and beam-sensitive materials. We…
We present a new method for real- and complex-valued image reconstruction from two intensity measurements made in the Fourier plane: the Fourier magnitude of the unknown image, and the intensity of the interference pattern arising from…
In many areas of imaging science, it is difficult to measure the phase of linear measurements. As such, one often wishes to reconstruct a signal from intensity measurements, that is, perform phase retrieval. In this paper, we provide a…
In this work, we propose a novel method for the detailed reconstruction of transparent objects by exploiting polarimetric cues. Most of the existing methods usually lack sufficient constraints and suffer from the over-smooth problem. Hence,…
Polarized neutron reflectometry is a powerful technique to interrogate the structures of multilayered magnetic materials with depth sensitivity and nanometer resolution. However, reflectometry profiles often inhabit a complicated objective…
Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other methods have also been worked out based on measurement of…
Imaging 3D nano-structures at very high resolution is crucial in a variety of scientific fields. However, due to fundamental limitations of light propagation we can only measure the object indirectly via 2D intensity measurements of the 3D…
In the past decade, several neutron reflectometry methods for determining the modulus and phase of the complex reflection coefficient of an unknown multilayer thin film have been worked out among which the method of variation of…
We present a setup for complete characterization of femtosecond pulses generated by seeded free-electron lasers (FEL's) in the extreme-ultraviolet spectral region. Two delayed and spectrally shifted replicas are produced and used for…
Highly confined vectorial electromagnetic field distributions represent an excellent tool for detailed studies in nano-optics and high resolution microscopy, such as nonlinear microscopy, advanced fluorescence imaging or nanoplasmonics.…
Magnetic materials phase reconstruction from Lorentz transmission electron microscopy (LTEM) measurements has traditionally been achieved using longstanding methods such as off-axis holography (OAH) and the transport-of-intensity equation…
Signal recovery from nonlinear measurements involves solving an iterative optimization problem. In this paper, we present a framework to optimize the sensing parameters to improve the quality of the signal recovered by the given iterative…
We experimentally demonstrate how to solve the phase problem of diffraction using multi-wave interference with standard diffraction experimental setups without the need for taking any auxiliary data. In particular, we show that the phases…
In this study we explore the possibility to use deep learning for the reconstruction of phase images from 4D scanning transmission electron microscopy (4D-STEM) data. The process can be divided into two main steps. First, the complex…
While characterization of coherent wavefields is essential to laser, x-ray and electron imaging, sensors measure the squared magnitude of the field, rather than the field itself. Holography or phase retrieval must be used to characterize…
Conventional deep learning-based image reconstruction methods require a large amount of training data which can be hard to obtain in practice. Untrained deep learning methods overcome this limitation by training a network to invert a…
We introduce a novel reflection-mode diffraction tomography technique that enables simultaneous recovery of forward and backward scattering information for high-resolution 3D refractive index reconstruction. Our technique works by imaging a…