Related papers: Quantitative powder diffraction using a (2+3) surf…
One-dimensional single-wire chamber was developed to provide high position resolution for powder diffraction experiments with synchrotron radiation. A diffraction test using the sample of SiO2 has been accomplished at 1W2B laboratory of…
The structural complexity and instability of many interference phase microscopy methods are the major obstacles toward high-precision phase measurement. In this vein, improving more efficient configurations as well as proposing new methods…
Light-absorbing materials are widely used, and their optical properties are an important factor. Snell's law does not hold in materials that partially absorb light. Hence, the optical path in refraction is calculated from Maxwell's law. We…
The presence of gas pores in metal feedstock powder for additive manufacturing greatly affects the final AM product. Since current porosity analysis often involves lengthy X-ray computed tomography (XCT) scans with a full rotation around…
Precision measurements of diffraction have been performed by the H1 and ZEUS experiments at the HERA collider with high statistics for a wide kinematic range of photon virtuality $Q^2$. The diffractive parton densities are extracted by…
Tracer tests in natural porous media sometimes show abnormalities that suggest considering a fractional variant of the Advection Diffusion Equation supplemented by a time derivative of non-integer order. We are describing an inverse method…
Solving crystal structures from powder X-ray diffraction (XRD) is a central challenge in materials characterization. In this work, we study the powder XRD-to-structure mapping using gradient descent optimization, with the goal of recovering…
One of the most important techniques for astrophysics with adaptive optics is the ability to do spectroscopy at diffraction limited scales. The extreme difficulty of positioning a faint target accurately on a very narrow slit can be avoided…
The X-ray diffractometer in the laboratory is a crucial instrument for analyzing materials in science. It can be used on almost any crystal material, and if the machine parameters are appropriately controlled, it can offer a lot of…
Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…
When x-rays penetrate soft matter, their phase changes more rapidly than their amplitude. In- terference effects visible with high brightness sources creates higher contrast, edge enhanced images. When the object is piecewise smooth (made…
Refraction of an optical probe beam by a plasma can be measured with angular filter refractometry (AFR), which produces an image containing intensity contours that correspond to curves of constant refraction angle. Further analysis is…
Spectra of Seyfert Is are commonly modelled as emission from an X-ray illuminated flat accretion disc orbiting a central black hole. This provides both a reprocessed and direct component of the X-ray emission as required by observations of…
We developed a setup using a two dimensional camera for Grazing Incidence x-ray Diffraction (GIXD) on Langmuir monolayers and more generally for surface diffraction on two dimensional powders. Compared to the classical setup using a linear…
Spectropolarimetry from the near IR to the far UV of light scattered by dust provides a valuable diagnostic of the dust composition, grain size distribution and spatial distribution. To facilitate the use of this diagnostic, we present…
We propose a high resolution spatial diagnostic method via inserting a millimeter-gap grating into the collimated terahertz beam to monitor the minute variation of the terahertz beam in strong-field terahertz sources, which is difficult to…
Intensity interferometry (II) exploits the second-order correlation to acquire the spatial frequency information of an object, which has been used to observe distant stars since 1950s. However, due to unreliability of employed imaging…
When an X-ray area detector based on a single crystalline material, for instance, a state of the art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the…
A new instrument for spot profile analysis of electron diffraction - SPA-LEED - has been set up. The instrument works either with a transparent phosphor screen for visual inspection of the pattern or in its main mode with a channeltron for…
In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a…