Related papers: Electron beam transverse phase space tomography us…
We present a method to measure transverse size and position of an electron or proton beam, close to the injection point in plasma wakefields, where other diagnostics are not available. We show that transverse size measurements are in…
Spatio-temporal shaping of electron beams is a bold frontier in electron microscopy, enabling new routes toward spatial-resolution enhancement, selective probing, low-dose imaging and faster data acquisition. Over the last decade, shaping…
Achieving high-quality electron beams from laser wakefield accelerators critically relies on density tailoring to control electron dynamics during injection, acceleration, and extraction. We report on the experimental observation of…
A non-invasive, compact laserwire system has been developed to measure the transverse emittance of an H- beam and has been demonstrated at the new LINAC4 injector for the LHC at CERN. Light from a low power, pulsed laser source is conveyed…
2D and 4D transverse phase-space of a low-energy ion-beam is measured with two of the most common emittance scanners. The article covers the description of the installation, the setup, the settings, the experiment and the benchmark of the…
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and precise measurement methods with very high spatial resolution.…
Nanometer-sharp metallic tips are known to be excellent electron emitters. They are used in highest-resolution electron microscopes in cold field emission mode to generate the most coherent electron beam in continuous-wave operation. For…
In this letter, a simple technique is proposed to induce strong density modulation into the electron beam with small energy modulation. By using the combination of a transversely dispersed electron beam and a wave-front tilted seed laser,…
The time-resolved electron beam envelope parameters including sectional distribution and position are important and necessary for the study of beam transmission characteristics in the magnetic field and verifying the magnetic field setup…
The transverse emittance of a charged particle beam is an important figure of merit for many accelerator applications, such as ultra-fast electron diffraction, free electron lasers and the operation of new compact accelerator concepts in…
We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…
Watching the motion of electrons on their natural nanometre length- and femtosecond time scales is a fundamental goal and an open challenge of contemporary ultrafast science. Optical techniques and electron microscopy currently mostly…
Controlling the phase space of particle beams is essential for the generation of high-quality, ultrashort electron beams in plasma-based accelerators. Accurately diagnosing the transient energy chirp, which evolves rapidly at the onset of…
Beams with cross-plane coupling or extreme asymmetries between the two transverse phase spaces are often encountered in particle accelerators. Flat beams with large transverse-emittance ratios are critical for future linear colliders.…
Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…
Not long after the laser was invented, it has been marked as a candidate source of strong, high-frequency electromagnetic radiation for acceleration of particles. Indeed, while the complex particle accelerator facilities today are an…
Electrical pulse stimulation drives many important physical phenomena in condensed matter as well as in electronic systems and devices. Often, nanoscopic and mesoscopic mechanisms are hypothesized, but methods to image electrically driven…
Coherent electrons such as those in electron microscopes, exhibit wave phenomena and may be described by the paraxial wave equation. In analogy to light-waves, governed by the same equation, these electrons share many of the fundamental…
We developed a process to fabricate nanoscale metallic gate electrodes on scanning probe cantilevers, including on the irregular surface of protruding cantilever tips. The process includes a floating-layer technique to coat the cantilevers…
Photoinjectors are the main high brightness electron sources for X-ray free electron lasers (XFEL). Photoinjector emittance reduction is one of the key knobs for improving XFEL lasing, so precise emittance measurement is critical. It's well…