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In deep metric learning (DML), high-level input data are represented in a lower-level representation (embedding) space, such that samples from the same class are mapped close together, while samples from disparate classes are mapped further…

Computer Vision and Pattern Recognition · Computer Science 2023-04-03 Ryan Furlong , Vincent O'Brien , James Garland , Daniel Palacios-Alonso , Francisco Dominguez-Mateos

Few-shot image classification is a challenging problem that aims to achieve the human level of recognition based only on a small number of training images. One main solution to few-shot image classification is deep metric learning. These…

Computer Vision and Pattern Recognition · Computer Science 2022-06-28 Xiaoxu Li , Xiaochen Yang , Zhanyu Ma , Jing-Hao Xue

Zero-shot learning (ZSL) can be formulated as a cross-domain matching problem: after being projected into a joint embedding space, a visual sample will match against all candidate class-level semantic descriptions and be assigned to the…

Computer Vision and Pattern Recognition · Computer Science 2018-12-12 Lei Zhang , Peng Wang , Lingqiao Liu , Chunhua Shen , Wei Wei , Yannning Zhang , Anton Van Den Hengel

Deep Metric Learning (DML) serves to learn an embedding function to project semantically similar data into nearby embedding space and plays a vital role in many applications, such as image retrieval and face recognition. However, the…

Computer Vision and Pattern Recognition · Computer Science 2022-08-02 Lizhao Liu , Shangxin Huang , Zhuangwei Zhuang , Ran Yang , Mingkui Tan , Yaowei Wang

Recognition of objects with subtle differences has been used in many practical applications, such as car model recognition and maritime vessel identification. For discrimination of the objects in fine-grained detail, we focus on deep…

Computer Vision and Pattern Recognition · Computer Science 2019-07-23 Kaan Karaman , Erhan Gundogdu , Aykut Koc , A. Aydin Alatan

Distance metric learning (DML) aims to find an appropriate way to reveal the underlying data relationship. It is critical in many machine learning, pattern recognition and data mining algorithms, and usually require large amount of label…

Machine Learning · Statistics 2018-11-13 Yong Luo , Yonggang Wen , Ling-Yu Duan , Dacheng Tao

Despite the success of deep neural networks, there are still many challenges in deep representation learning due to the data scarcity issues such as data imbalance, unseen distribution, and domain shift. To address the above-mentioned…

Computer Vision and Pattern Recognition · Computer Science 2022-04-01 Zhi Hou , Baosheng Yu , Dacheng Tao

Deep learning methods have played a more and more important role in hyperspectral image classification. However, the general deep learning methods mainly take advantage of the information of sample itself or the pairwise information between…

Computer Vision and Pattern Recognition · Computer Science 2021-03-30 Zhiqiang Gong , Weidong Hu , Xiaoyong Du , Ping Zhong , Panhe Hu

Metric learning seeks to embed images of objects suchthat class-defined relations are captured by the embeddingspace. However, variability in images is not just due to different depicted object classes, but also depends on other latent…

Computer Vision and Pattern Recognition · Computer Science 2019-09-26 Karsten Roth , Biagio Brattoli , Björn Ommer

Metric Learning for visual similarity has mostly adopted binary supervision indicating whether a pair of images are of the same class or not. Such a binary indicator covers only a limited subset of image relations, and is not sufficient to…

Computer Vision and Pattern Recognition · Computer Science 2019-04-23 Sungyeon Kim , Minkyo Seo , Ivan Laptev , Minsu Cho , Suha Kwak

Embedded spaces are a key feature in deep learning. Good embedded spaces represent the data well to support classification and advanced techniques such as open-set recognition, few-short learning and explainability. This paper presents a…

Machine Learning · Computer Science 2024-08-06 Stefan Scholl

In many domains where data are represented as graphs, learning a similarity metric among graphs is considered a key problem, which can further facilitate various learning tasks, such as classification, clustering, and similarity search.…

Machine Learning · Computer Science 2020-10-06 Guixiang Ma , Nesreen K. Ahmed , Theodore L. Willke , Philip S. Yu

Much like humans, robots should have the ability to leverage knowledge from previously learned tasks in order to learn new tasks quickly in new and unfamiliar environments. Despite this, most robot learning approaches have focused on…

Robotics · Computer Science 2018-10-09 Stephen James , Michael Bloesch , Andrew J. Davison

In this paper, we present a novel deep metric learning method to tackle the multi-label image classification problem. In order to better learn the correlations among images features, as well as labels, we attempt to explore a latent space,…

Computer Vision and Pattern Recognition · Computer Science 2020-07-28 Changsheng Li , Chong Liu , Lixin Duan , Peng Gao , Kai Zheng

Metric-based meta-learning has attracted a lot of attention due to its effectiveness and efficiency in few-shot learning. Recent studies show that metric scaling plays a crucial role in the performance of metric-based meta-learning…

Machine Learning · Computer Science 2020-08-27 Jiaxin Chen , Li-Ming Zhan , Xiao-Ming Wu , Fu-lai Chung

Metric learning has the aim to improve classification accuracy by learning a distance measure which brings data points from the same class closer together and pushes data points from different classes further apart. Recent research has…

Machine Learning · Computer Science 2018-07-17 Benjamin Paaßen , Claudio Gallicchio , Alessio Micheli , Barbara Hammer

Meta-learning has been proposed as a framework to address the challenging few-shot learning setting. The key idea is to leverage a large number of similar few-shot tasks in order to learn how to adapt a base-learner to a new task for which…

Computer Vision and Pattern Recognition · Computer Science 2019-04-10 Qianru Sun , Yaoyao Liu , Tat-Seng Chua , Bernt Schiele

Deep neural network models have demonstrated their effectiveness in classifying multi-label data from various domains. Typically, they employ a training mode that combines mini-batches with optimizers, where each sample is randomly selected…

Machine Learning · Computer Science 2024-03-28 Ao Zhou , Bin Liu , Jin Wang , Grigorios Tsoumakas

Metric learning involves learning a discriminative representation such that embeddings of similar classes are encouraged to be close, while embeddings of dissimilar classes are pushed far apart. State-of-the-art methods focus mostly on…

Deep metric learning (DML) aims to learn a discriminative high-dimensional embedding space for downstream tasks like classification, clustering, and retrieval. Prior literature predominantly focuses on pair-based and proxy-based methods to…

Computer Vision and Pattern Recognition · Computer Science 2024-07-04 Xiruo Jiang , Yazhou Yao , Xili Dai , Fumin Shen , Xian-Sheng Hua , Heng-Tao Shen
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