Related papers: TrustMAE: A Noise-Resilient Defect Classification …

Robustness to label noise is a critical property for weakly-supervised classifiers trained on massive datasets. Robustness to label noise is a critical property for weakly-supervised classifiers trained on massive datasets. In this paper,…

Diffusion autoencoders (DAEs) are typically formulated as a noise prediction model and trained with a linear-$\beta$ noise schedule that spends much of its sampling steps at high noise levels. Because high noise levels are associated with…

In the recent times, autoencoders, besides being used for compression, have been proven quite useful even for regenerating similar images or help in image denoising. They have also been explored for anomaly detection in a few cases.…

Imbalanced data classification problem has always been a popular topic in the field of machine learning research. In order to balance the samples between majority and minority class. Oversampling algorithm is used to synthesize new minority…

The study of label noise in sound event recognition has recently gained attention with the advent of larger and noisier datasets. This work addresses the problem of missing labels, one of the big weaknesses of large audio datasets, and one…

In this paper, we propose Normality-Calibrated Autoencoder (NCAE), which can boost anomaly detection performance on the contaminated datasets without any prior information or explicit abnormal samples in the training phase. The NCAE…

A maximally stable extreme region (MSER) analysis based convolutional neural network (CNN) for unified defect detection framework is proposed in this paper. Our proposed framework utilizes the generality and stability of MSER to generate…

Under the semi-supervised framework, we propose an end-to-end memory-based segmentation network (MemSeg) to detect surface defects on industrial products. Considering the small intra-class variance of products in the same production line,…

Anomaly detection in tabular data remains challenging due to complex feature interactions and the scarcity of anomalous examples. Denoising autoencoders rely on fixed-magnitude noise, limiting adaptability to diverse data distributions.…

The proliferation of sophisticated AI-generated deepfakes poses critical challenges for digital media authentication and societal security. While existing detection methods perform well within specific generative domains, they exhibit…

Restoring images affected by various types of degradation, such as noise, blur, or improper exposure, remains a significant challenge in computer vision. While recent trends favor complex monolithic all-in-one architectures, these models…

Improper or erroneous labelling can pose a hindrance to reliable generalization for supervised learning. This can have negative consequences, especially for critical fields such as healthcare. We propose an effective new approach for…

Recent advances in the industrial inspection of textured surfaces-in the form of visual inspection-have made such inspections possible for efficient, flexible manufacturing systems. We propose an unsupervised feature memory rearrangement…

State-of-the-art, high capacity deep neural networks not only require large amounts of labelled training data, they are also highly susceptible to label errors in this data, typically resulting in large efforts and costs and therefore…

Denoising autoencoders (DAE) are trained to reconstruct their clean inputs with noise injected at the input level, while variational autoencoders (VAE) are trained with noise injected in their stochastic hidden layer, with a regularizer…

Data-driven fault diagnostics of safety-critical systems often faces the challenge of a complete lack of labeled data associated with faulty system conditions (i.e., fault types) at training time. Since an unknown number and nature of fault…

In our previous work, we proposed a discriminative autoencoder (DcAE) for speech recognition. DcAE combines two training schemes into one. First, since DcAE aims to learn encoder-decoder mappings, the squared error between the reconstructed…

In semiconductor manufacturing, wafer defect maps (WDMs) play a crucial role in diagnosing issues and enhancing process yields by revealing critical defect patterns. However, accurately categorizing WDM defects presents significant…

Data-driven software engineering processes, such as vulnerability prediction heavily rely on the quality of the data used. In this paper, we observe that it is infeasible to obtain a noise-free security defect dataset in practice. Despite…

Missing data is a recurrent and challenging problem, especially when using machine learning algorithms for real-world applications. For this reason, missing data imputation has become an active research area, in which recent deep learning…