Related papers: Precision of silicon oxynitride refractive-index p…
Image reconstruction under multiple light scattering is crucial in a number of applications such as diffraction tomography. The reconstruction problem is often formulated as a nonconvex optimization, where a nonlinear measurement model is…
We present a simple algorithm for differentiable rendering of surfaces represented by Signed Distance Fields (SDF), which makes it easy to integrate rendering into gradient-based optimization pipelines. To tackle visibility-related…
This paper introduces a novel multi-view 6 DoF object pose refinement approach focusing on improving methods trained on synthetic data. It is based on the DPOD detector, which produces dense 2D-3D correspondences between the model vertices…
Estimating the reflectance layer from a single image is a challenging task. It becomes more challenging when the input image contains shadows or specular highlights, which often render an inaccurate estimate of the reflectance layer.…
In this work, we demonstrate an integrated platform comprising a refractive index (RI) sensor based on Photonic Molecule (PM) that effectively mitigates the influence of environmental perturbations using a differential measurement scheme…
Near surface silver nanoparticles embedded in silicon oxide were obtained by 40 keV silver negative ion implantation without the requirement of an annealing step. Ion beam induced local heating within the film leads to an exo-diffusion of…
Refractive Index Tomography is the inverse problem of reconstructing the continuously-varying 3D refractive index in a scene using 2D projected image measurements. Although a purely refractive field is not directly visible, it bends light…
This study delves into the radiation pattern synthesis of reconfigurable intelligent surfaces (RIS) / reflection metasurfaces. Through superimposing multiple single-reflection profiles, which comprise the amplitude and/or phase settings of…
The ZnO films, 25 nm thick were deposited by e-beam evaporation of ZnO (99.9%) pellets onto native oxide covered silicon (100) substrates. Details of the interface chemical composition and the chemical depth profile have been deduced as…
Future NASA X-ray spectroscopy missions will require high throughput, high resolution grating spectrometers. Off-plane reflection gratings are capable of meeting the performance requirements needed to realize the scientific goals of these…
We demonstrate first- and second-order spatial differentiation of an optical beam transverse profile using thin suspended subwavelength gratings. Highly reflective one-dimensional gratings are patterned on suspended 200 nm-thick silicon…
This paper presents a method to detect reflection of 3D light detection and ranging (Lidar) scans and uses it to classify the points and also map objects outside the line of sight. Our software uses several approaches to analyze the point…
Measurements of microscale surface patterns are essential for process and quality control in industries across semiconductors, micro-machining, and biomedicines. However, the development of miniaturized and intelligent profiling systems…
For erbium-doped amorphous oxides, such as those that are used in compact lightwave devices interfaced with silicon, values of the refractive indices are commonly obtained empirically. This work, combining experimental and theoretical…
Intelligent reflecting surface (IRS), which consists of a large number of tunable reflective elements, is capable of enhancing the wireless propagation environment in a cellular network by intelligently reflecting the electromagnetic waves…
X-ray absorption spectroscopy and resonant soft x-ray reflectivity show a non-uniform distribution of oxygen holes in a La2NiO4 - La2CuO4 (LNO-LCO) superlattice, with excess holes concentrated in the LNO layers. Weak ferromagnetism with Tc…
Removing undesired reflection from an image captured through a glass surface is a very challenging problem with many practical application scenarios. For improving reflection removal, cascaded deep models have been usually adopted to…
A method is proposed which allows a complete determination of the complex reflection coefficient for any free unknown real potential (i.e., in the case where there is no effective absorption). In this method the unknown layer mounted on top…
We present the results of variable-angle spectroscopic ellipsometry and transmittance measurements to determine the variation of the complex refractive index of ion implanted single-crystal diamond. An increase is found in both real and…
An accurate control of the optical properties of single crystal diamond during microfabrication processes such as ion implantation plays a crucial role in the engineering of integrated photonic devices. In this work we present a systematic…