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Deep metric learning (DML) aims to minimize empirical expected loss of the pairwise intra-/inter- class proximity violations in the embedding space. We relate DML to feasibility problem of finite chance constraints. We show that minimizer…

Computer Vision and Pattern Recognition · Computer Science 2023-09-08 Yeti Z. Gurbuz , Ogul Can , A. Aydin Alatan

The performance of supervised deep learning methods for medical image segmentation is often limited by the scarcity of labeled data. As a promising research direction, semi-supervised learning addresses this dilemma by leveraging unlabeled…

Image and Video Processing · Electrical Eng. & Systems 2024-05-13 Zihang Liu , Chunhui Zhao

Metric and kernel learning are important in several machine learning applications. However, most existing metric learning algorithms are limited to learning metrics over low-dimensional data, while existing kernel learning algorithms are…

Machine Learning · Computer Science 2009-11-02 Prateek Jain , Brian Kulis , Jason V. Davis , Inderjit S. Dhillon

Incorporating symmetries can lead to highly data-efficient and generalizable models by defining equivalence classes of data samples related by transformations. However, characterizing how transformations act on input data is often…

Machine Learning · Computer Science 2022-07-04 Jung Yeon Park , Ondrej Biza , Linfeng Zhao , Jan Willem van de Meent , Robin Walters

This work studies deep metric learning under small to medium scale data as we believe that better generalization could be a contributing factor to the improvement of previous fine-grained image retrieval methods; it should be considered…

Computer Vision and Pattern Recognition · Computer Science 2018-12-11 Nam Vo , James Hays

Deep-learning metrics have recently demonstrated extremely good performance to match image patches for stereo reconstruction. However, training such metrics requires large amount of labeled stereo images, which can be difficult or costly to…

Computer Vision and Pattern Recognition · Computer Science 2016-12-06 Stepan Tulyakov , Anton Ivanov , Francois Fleuret

Deep metric learning has been effectively used to learn distance metrics for different visual tasks like image retrieval, clustering, etc. In order to aid the training process, existing methods either use a hard mining strategy to extract…

Computer Vision and Pattern Recognition · Computer Science 2021-08-24 Bhavya Vasudeva , Puneesh Deora , Saumik Bhattacharya , Umapada Pal , Sukalpa Chanda

Unsupervised Deep Distance Metric Learning (UDML) aims to learn sample similarities in the embedding space from an unlabeled dataset. Traditional UDML methods usually use the triplet loss or pairwise loss which requires the mining of…

Computer Vision and Pattern Recognition · Computer Science 2020-09-10 Binh X. Nguyen , Binh D. Nguyen , Gustavo Carneiro , Erman Tjiputra , Quang D. Tran , Thanh-Toan Do

We present a novel self-taught framework for unsupervised metric learning, which alternates between predicting class-equivalence relations between data through a moving average of an embedding model and learning the model with the predicted…

Computer Vision and Pattern Recognition · Computer Science 2022-05-05 Sungyeon Kim , Dongwon Kim , Minsu Cho , Suha Kwak

Deep learning has achieved unprecedented success in various object detection tasks with huge amounts of labeled data. However, obtaining large-scale annotations for medical images is extremely challenging due to the high demand of labour…

Image and Video Processing · Electrical Eng. & Systems 2022-03-21 Zhizhong Chai , Luyang Luo , Huangjing Lin , Hao Chen , Anjia Han , Pheng-Ann Heng

Deep metric learning (DML) aims to learn a discriminative high-dimensional embedding space for downstream tasks like classification, clustering, and retrieval. Prior literature predominantly focuses on pair-based and proxy-based methods to…

Computer Vision and Pattern Recognition · Computer Science 2024-07-04 Xiruo Jiang , Yazhou Yao , Xili Dai , Fumin Shen , Xian-Sheng Hua , Heng-Tao Shen

Metric learning aims to embed one metric space into another to benefit tasks like classification and clustering. Although a greatly distorted metric space has a high degree of freedom to fit training data, it is prone to overfitting and…

Machine Learning · Computer Science 2015-05-12 Renjie Liao , Jianping Shi , Ziyang Ma , Jun Zhu , Jiaya Jia

While nowadays deep neural networks achieve impressive performances on semantic segmentation tasks, they are usually trained by optimizing pixel-wise losses such as cross-entropy. As a result, the predictions outputted by such networks…

Computer Vision and Pattern Recognition · Computer Science 2019-05-07 Yifu Chen , Arnaud Dapogny , Matthieu Cord

Deep learning (DL) inverse techniques have increased the speed of artificial electromagnetic material (AEM) design and improved the quality of resulting devices. Many DL inverse techniques have succeeded on a number of AEM design tasks, but…

Machine Learning · Computer Science 2021-12-21 Simiao Ren , Ashwin Mahendra , Omar Khatib , Yang Deng , Willie J. Padilla , Jordan M. Malof

Supervised anomaly detection methods perform well in identifying known anomalies that are well represented in the training set. However, they often struggle to generalise beyond the training distribution due to decision boundaries that lack…

Machine Learning · Computer Science 2025-11-18 Zahra Zamanzadeh Darban , Qizhou Wang , Charu C. Aggarwal , Geoffrey I. Webb , Ehsan Abbasnejad , Mahsa Salehi

Metric learning is a fundamental problem in computer vision whereby a model is trained to learn a semantically useful embedding space via ranking losses. Traditionally, the effectiveness of a ranking loss depends on the minibatch size, and…

Computer Vision and Pattern Recognition · Computer Science 2023-03-31 Thalaiyasingam Ajanthan , Matt Ma , Anton van den Hengel , Stephen Gould

Deep learning in remote sensing has become an international hype, but it is mostly limited to the evaluation of optical data. Although deep learning has been introduced in Synthetic Aperture Radar (SAR) data processing, despite successful…

Image and Video Processing · Electrical Eng. & Systems 2024-10-30 Xiao Xiang Zhu , Sina Montazeri , Mohsin Ali , Yuansheng Hua , Yuanyuan Wang , Lichao Mou , Yilei Shi , Feng Xu , Richard Bamler

Deep Learning shows very good performance when trained on large labeled data sets. The problem of training a deep net on a few or one sample per class requires a different learning approach which can generalize to unseen classes using only…

Machine Learning · Computer Science 2018-08-23 Jinchao Liu , Stuart J. Gibson , Margarita Osadchy

During the training of networks for distance metric learning, minimizers of the typical loss functions can be considered as "feasible points" satisfying a set of constraints imposed by the training data. To this end, we reformulate distance…

Computer Vision and Pattern Recognition · Computer Science 2023-07-18 Oğul Can , Yeti Ziya Gürbüz , A. Aydın Alatan

Learning the distance metric between pairs of samples has been studied for image retrieval and clustering. With the remarkable success of pair-based metric learning losses, recent works have proposed the use of generated synthetic points on…

Computer Vision and Pattern Recognition · Computer Science 2020-04-24 Byungsoo Ko , Geonmo Gu
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