Related papers: Estimation of friction force in an oscillator mode…
We study the velocity dependence of the frictional force of the tip of an atomic force microscope as it is dragged across a surface, taking into account memory effects and thermal fluctuations. Memory effects are described by a coupling of…
Active control of friction by ultrasonic vibration is a well-known effect with numerous technical applications ranging from press forming to micromechanical actuators. Reduction of friction is observed with vibration applied in any of the…
The interaction between a rapidly oscillating atomic force microscope tip and a soft material surface is described using both elastic and viscous forces with a moving surface model. We derive the simplest form of this model, motivating it…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
We model friction acting on the tip of an atomic force microscope as it is dragged across a surface at non-zero temperatures. We find that stick-slip motion occurs and that the average frictional force follows $|\ln v|^{2/3}$, where $v$ is…
The dynamics of a non-autonomous oscillator in which the phase and frequency of the external force depend on the dynamical variable is studied. Such a control of the phase and frequency of the external force leads to the appearance of…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
We study in detail the recent suggestions by Tshiprut et al. [Phys. Rev. Lett. 95, 016101 (2005)] to tune tribological properties at the nanoscale by subjecting a substrate to periodic mechanical oscillations. We show that both in…
The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…
Small oscillation amplitudes in dynamic atomic force microscopy can lead to invasive and high resolution imaging. Here we discuss small oscillation amplitude imaging in the context of ambient conditions and simultaneously excite the second…
Sliding friction is ubiquitous in nature as are harmonic oscillators. However, when treating harmonic oscillators the effect of sliding friction is often neglected. Here, we propose a simple analytical model to include both viscous and…
The influence of out-of-plane oscillations on friction is a well-known phenomenon that has been studied extensively with various experimental methods, e.g. pin-on-disk tribometers. However, existing theoretical models have yet achieved only…
We propose a two-frequency driving scheme in dynamic atomic force microscopy that maximizes the interaction time between tip and sample. Using a stochastic description of the cantilever dynamics, we predict large classical squeezing and a…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…
The influence of out-of-plane and in-plane contact vibrations and temperature on the friction force acting on a sharp tip elastically pulled on a crystal surface is studied using a generalized Prandtl- Tomlinson model. The average friction…
Friction is the basic, ubiquitous mechanical interaction between two surfaces that results in resistance to motion and energy dissipation. In spite of its technological and economic significance, our ability to control friction remains…
If an oscillator is driven by a force that switches between two frequencies, the dynamics it exhibits depends on the precise manner of switching. Here we take a one-dimensional oscillator and consider scenarios in which switching occurs:…
We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in Non-Contact Atomic Force Microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…