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The NEXT-DEMO++ detector, a high-pressure xenon gas time projection chamber serving as a prototype for the NEXT-100 experiment, was used to measure the electroluminescence (EL) yield as a function of reduced electric field ($E/p$) across…

Instrumentation and Detectors · Physics 2026-04-20 NEXT Collaboration , J. Renner , J. D. Villamil , N. López-March , K. Mistry , P. Novella , A. Simón , V. Álvarez , J. M. Benlloch-Rodríguez , M. Cid , C. Cortes-Parra , R. Esteve , F. Kellerer , J. Martín-Albo , A. Martínez , G. Martínez-Lema , M. Martínez-Vara , M. Querol , P. Saharia , M. Sorel , S. Teruel-Pardo , H. Almazán , L. Arazi , I. J. Arnquist , F. Auria-Luna , S. Ayet , Y. Ayyad , C. D. R. Azevedo , F. Ballester , J. E. Barcelon , M. del Barrio-Torregrosa , F. I. G. M. Borges , A. Brodoline , N. Byrnes , A. Castillo , E. Church , X. Cid , C. A. N. Conde , F. P. Cossío , R. Coupe , E. Dey , P. Dietz , C. Echeverria , M. Elorza , R. Felkai , L. M. P. Fernandes , P. Ferrario , P. Ferrero Mancheño , F. W. Foss , Z. Freixa , J. García-Barrena , J. J. Gómez-Cadenas , J. W. R. Grocott , R. Guenette , J. Hauptman , C. A. O. Henriques , J. A. Hernando Morata , P. Herrero-Gómez , V. Herrero , C. Hervés Carrete , Y. Ifergan , A. F. B. Isabel , B. J. P. Jones , L. Larizgoitia , A. Larumbe , P. Lebrun , F. Lopez , R. Madigan , R. D. P. Mano , A. Marauri , A. P. Marques , R. L. Miller , J. Molina-Canteras , F. Monrabal , C. M. B. Monteiro , F. J. Mora , K. E. Navarro , D. R. Nygren , E. Oblak , I. Osborne , J. Palacio , B. Palmeiro , A. Para , I. Parmaksiz , A. Pazos , J. Pelegrin , M. Pérez Maneiro , I. Rivilla , C. Rogero , L. Rogers , B. Romeo , C. Romo-Luque , E. Ruiz-Chóliz , F. P. Santos , J. M. F. dos Santos , M. Seemann , I. Shomroni , A. L. M. Silva , P. A. O. C. Silva , S. R. Soleti , J. Soto-Oton , J. M. R. Teixeira , J. F. Toledo , C. Tonnelé , S. Torelli , J. Torrent , A. Trettin , P. R. G. Valle , M. Vanga , P. Vázquez Cabaleiro , J. F. C. A. Veloso , L. M. Villar Padruno , J. Waiton , A. Yubero-Navarro

On- and off-axis electron energy loss spectroscopy (EELS) is a powerful method for probing local electronic structure on single atom level. However, many materials undergo electron-beam induced transformation during the scanning…

Materials Science · Physics 2023-10-23 Kevin M. Roccapriore , Riccardo Torsi , Joshua Robinson , Sergei V. Kalinin , Maxim Ziatdinov

We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…

Instrumentation and Detectors · Physics 2023-07-06 Binbin Wang , David W. McComb

The use of coherent x-ray beams has been greatly developing for the past decades. They are now used by a wide scientific community to study biological materials, phase transitions in crystalline materials, soft matter, magnetism, strained…

Materials Science · Physics 2010-09-01 V. L. R. Jacques , S. Ravy , D. Le Bolloc'h , E. Pinsolle , M. Sauvage-Simkin , F. Livet

The atomic number contrast imaging technique reveals an increase in intensity at interfaces of a high and low-density material in case of relatively thick samples. Elastic scattering factors and absorption coefficients are incorporated in a…

Computational Physics · Physics 2019-12-25 Aniruddha Dutta , Helge Heinrich

Contrast Enhanced Spectral Mammography (CESM) is a dual-energy mammographic imaging technique that first needs intravenously administration of an iodinated contrast medium; then, it collects both a low-energy image, comparable to standard…

Image and Video Processing · Electrical Eng. & Systems 2026-03-13 Aurora Rofena , Valerio Guarrasi , Marina Sarli , Claudia Lucia Piccolo , Matteo Sammarra , Bruno Beomonte Zobel , Paolo Soda

Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons…

Instrumentation and Detectors · Physics 2021-11-04 Akshay Agarwal , John Simonaitis , Vivek K. Goyal , Karl K. Berggren

The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…

Materials Science · Physics 2024-11-12 Trygve Magnus Ræder , Urko Petralanda , Thomas Olsen , Hugh Simons

NSLS-II x-ray diagnostics will provide continuous online data of electron beam dimensions, which will be used to derive electron beam emittance and energy spread. It will also provide information of electron beam tilt for coupling…

Accelerator Physics · Physics 2013-03-18 Petr Ilinski

We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…

Instrumentation and Detectors · Physics 2026-03-19 Akira Yasuhara , Takumi Sannomiya , Ryoichi Horisaki

With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous works have previously highlighted and contrasted performance…

Instrumentation and Detectors · Physics 2023-08-09 Tiarnan Mullarkey , Matthew Geever , Jonathan J. P. Peters , Ian Griffiths , Peter D. Nellist , Lewys Jones

A Scintillator Deposited CCD (SDCCD) is a wide-band X-ray detector consisting of a CCD and a scintillator directly attached to each other. We assembled the newly developed SDCCD that the scintillator CsI(Tl) is below the fully depleted CCD.…

Instrumentation and Methods for Astrophysics · Physics 2010-10-01 Hiroshi Tsunemi , Shutaro Ueda , Kazuo Shigeyama , Koji Mori , Shoichi Aoyama , Shin'ichiro Takagi

Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…

Materials Science · Physics 2026-03-05 A. Benhadjira , C. Detlefs , S. Borgi , V. Favre-Nicolin , C. Yildirim

Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…

Image and Video Processing · Electrical Eng. & Systems 2020-02-06 Thanuja D. Ambegoda , Julien N. P. Martel , Jozef Adamcik , Matthew Cook , Richard H. R. Hahnloser

We report the first measurements of the absolute ionization yield of nuclear recoils in liquid xenon, as a function of energy and electric-field. Independent experiments were carried out with two dual-phase time projection chamber…

We demonstrate the structural sensitivity and accuracy of the standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO2 of Mo/Si multilayers.…

The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a…

Diffuse optical imaging (DOI) offers valuable insights into scattering mediums, but the quest for high-resolution imaging often requires dense sampling strategies, leading to higher imaging errors and lengthy acquisition times. This work…

Optics · Physics 2025-04-07 Ben Wiesel , Shlomi Arnon

Solar flare X-ray spectra are typically dominated by thermal bremsstrahlung emission in the soft X-ray ($\lesssim$10 keV) energy range; for hard X-ray energies ($\gtrsim$30 keV), emission is typically non-thermal from beams of electrons.…

Solar and Stellar Astrophysics · Physics 2020-04-08 James M. McTiernan , Amir Caspi , Harry P. Warren

The NaI:Tl crystals were early investigated and used for wide application fields due to high light yield and crystal growth advantages. So far, the absolute light yields of NaI:Tl crystal have typically been known to be 40 ph/keV. However,…

High Energy Physics - Experiment · Physics 2024-04-30 Nguyen Thanh Luan , Kim Hong Joo , Lee Hyun Su , Jin Jegal , Lam Tan Truc , Khan Arshad , Nguyen Duc Ton