Related papers: Silicon Dating
The increase in the number of counterfeit and recycled microelectronic chips in recent years has created significant security and safety concerns in various applications. Hence, detecting such counterfeit chips in electronic systems is…
Many commercially available memory chips are fabricated worldwide in untrusted facilities. Therefore, a counterfeit memory chip can easily enter into the supply chain in different formats. Deploying these counterfeit memory chips into an…
With the outsourcing of design flow, ensuring the security and trustworthiness of integrated circuits has become more challenging. Among the security threats, IC counterfeiting and recycled ICs have received a lot of attention due to their…
A physical unclonable function (PUF), analogous to a human fingerprint, has gained an enormous amount of attention from both academia and industry. SRAM PUF is among one of the popular silicon PUF constructions that exploits random initial…
Due to the globalization in the semiconductor supply chain, counterfeit dynamic random-access memory (DRAM) chips/modules have been spreading worldwide at an alarming rate. Deploying counterfeit DRAM modules into an electronic system can…
Data recovery has long been a focus of the electronics industry for decades by security experts, focusing on hard disk recovery, a type of non-volatile memory. Unfortunately, none of the existing research, neither from academia, industry,…
Electronic counterfeiting is a longstanding problem with adverse long-term effects for many sectors, remaining on the rise. This article presents a novel low-cost technique to embed watermarking in devices with resistive-RAM (ReRAM) by…
We propose Schmitt-Trigger (ST) based recycling sensor that are tailored to amplify the aging mechanisms and detect fine grained recycling (minutes to seconds). We exploit the susceptibility of ST to process variations to realize…
This paper reports a novel approach that uses transistor aging in an integrated circuit (IC) to detect hardware Trojans. When a transistor is aged, it results in delays along several paths of the IC. This increase in delay results in timing…
Particle identification using the energy loss in silicon detectors is a powerful technique for probing the Standard Model (SM) as well as searching for new particles beyond the SM. Traditionally, such techniques use the truncated mean of…
Ageing detection and failure prediction are essential in many Internet of Things (IoT) deployments, which operate huge quantities of embedded devices unattended in the field for years. In this paper, we present a large-scale empirical…
Reliability has become an increasing concern in modern computing. Integrated circuits (ICs) are the backbone of modern computing devices across industries, including artificial intelligence (AI), consumer electronics, healthcare,…
This article introduces a novel, low-cost technique for hiding data in commercially available resistive-RAM (ReRAM) chips. The data is kept hidden in ReRAM cells by manipulating its analog physical properties through switching…
Future extreme-scale computer systems may expose silent data corruption (SDC) to applications, in order to save energy or increase performance. However, resilience research struggles to come up with useful abstract programming models for…
With the increasing complexity of embedded systems, the firmware has become a valuable asset. At the same time, pressure for cost reductions in hardware is imminent. These two aspects are united at the heart of the system, i.e., the…
Silicon is a leading qubit platform thanks to the exceptional coherence times that can be achieved and to the available commercial manufacturing platform for integration. Building scalable quantum processing architectures relies on accurate…
Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…
Non-intrusive load monitoring (NILM) is a modern and still expanding technique, helping to understand fundamental energy consumption patterns and appliance characteristics. Appliance event detection is an elementary step in the NILM…
With increasingly sophisticated cyber-adversaries able to access a wider repertoire of mechanisms to implant malware such as ransomware, CPU/GPU keyloggers, and stealthy kernel rootkits, there is an urgent need for techniques to detect and…
The emergence of distributed manufacturing ecosystems for electronic hardware involving untrusted parties has given rise to diverse trust issues. In particular, IP piracy, overproduction, and hardware Trojan attacks pose significant threats…