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Laser cutting of semiconductor wafers and transparent dielectrics has become a dominant process in manufacturing industries, encompassing a wide range of applications from flat display panels to microelectronic chips. Limited by the…

A method is presented for the registration and correlation of intrinsic property maps of materials, including data from nanoindentation hardness, Electron Back-Scattered Diffraction (EBSD), Electron Micro-Probe Analysis (EPMA). This highly…

Materials Science · Physics 2021-01-05 C. M. Magazzeni , H. M. Gardner , I. Howe , P. Gopon , J. C. Waite , D. Rugg , D. E. J. Armstrong , A. J. Wilkinson

We investigate how dust foreground complexity can affect measurements of the tensor-to-scalar ratio, $r$, in the context of the Simons Observatory, using a cross-spectrum component separation analysis. Employing a suite of simulations with…

We propose a framework for indexing of grain and sub-grain structures in electron backscatter diffraction (EBSD) images of polycrystalline materials. The framework is based on a previously introduced physics-based forward model by Callahan…

Computer Vision and Pattern Recognition · Computer Science 2015-03-04 Yu-Hui Chen , Se Un Park , Dennis Wei , Gregory Newstadt , Michael Jackson , Jeff P. Simmons , Marc De Graef , Alfred O. Hero

One-dimensional photonic crystals (1DPCs) are widely used platforms for guiding, filtering, and enhancing light at the nanoscale. Traditionally, designs have favored high refractive index contrast to maximize the photonic band gap (PBG)…

The theoretically observable limit of electron density distribution by single-crystal X-ray diffraction is discussed. When F_{orb} and {\delta}F are defined as, respectively, the partial structure factor for an orbital and the deviation of…

Polycrystalline materials, such as metals, are comprised of heterogeneously oriented crystals. Observed crystal orientations are modelled as a sample from an orientation distribution function (ODF), which determines a variety of material…

Applications · Statistics 2020-12-10 James Matuk , Oksana Chkrebtii , Stephen Niezgoda

Wavefront sensing with a thin diffuser has emerged as a potential low-cost alternative to a lenslet array for aberrometry. Diffuser wavefront sensors (DWS) have previously relied on tracking speckle displacement and consequently require…

Optics · Physics 2019-01-01 Gregory N. McKay , Faisal Mahmood , Nicholas J. Durr

We measured the local composition and thickness of SiO2-based glass material from diffraction. By using four dimensional scanning transmission electron microscopy (4D-STEM), we obtained diffraction at each scanning point. Comparing the…

Materials Science · Physics 2020-05-20 K. Nakazawa , K. Mitsuishi , K. Shibata , S. Amma , T. Mizoguchi

The orientation of luminescent molecules in organic light-emitting diodes (OLEDs) strongly influences device performance. However, our understanding of the factors controlling emitter orientation is limited as current measurements only…

Optical methods are most convenient to analyze spatially periodic patterns with wavevector $\bm q$ in a thin layer of a nematic liquid crystal. In the standard experimental setup a beam of parallel light with a 'short' wavelength $\lambda…

Soft Condensed Matter · Physics 2015-06-15 Werner Pesch , Alexei Krekhov

Polarimetric data provide key insights into infrared emission mechanisms in the inner disks of YSOs and the details of dust formation around AGB stars. While polarization measurements are well-established in radio interferometry, they…

Instrumentation and Methods for Astrophysics · Physics 2025-09-15 Linling Shuai , John D. Monnier , Benjamin R. Setterholm , Stefan Kraus , Narsireddy Anugu , Tyler Gardner , Jean-Baptiste Le Bouquin , Gail H. Schaefer

The stability and emissivity of the online calibration blackbody used in high-precision infrared remote sensing detectors in extreme environments are the primary limiting factors for their measurement accuracy. Due to the limitations of…

In materials science and particularly electron microscopy, Electron Back-scatter Diffraction (EBSD) is a common and powerful mapping technique for collecting local crystallographic data at the sub-micron scale. The quality of the…

Computer Vision and Pattern Recognition · Computer Science 2019-03-08 Florian Strub , Marie-Agathe Charpagne , Tresa M. Pollock

In the present work, a set of ZrO2 thin films have been deposited at 82 degree angle of deposition at several substrate rotation speeds and at 0 degree. The effect of substrate rotation on optical, structural, morphological properties and…

Spectroscopic data, particularly diffraction data, contain detailed crystal and microstructure information and thus are crucial for materials discovery. Powder X-ray diffraction (XRD) patterns are greatly effective in identifying crystals.…

Materials Science · Physics 2025-02-18 Bin Cao , Yang Liu , Zinan Zheng , Ruifeng Tan , Jia Li , Tong-yi Zhang

We show that diffraction intensity into the First Order Laue Zone (FOLZ) of a crystal can have a strong azimuthal dependence, where this FOLZ ring appears solely because of unidirectional atom position modulation. Such a modulation was…

Materials Science · Physics 2023-10-03 Aurys Silinga , Christopher S. Allen , Juri Barthel , Colin Ophus , Ian MacLaren

We use the state-of-the-art high-resolution cosmological simulations by IllustrisTNG to derive the velocity distribution and local density of dark matter in galaxies like our Milky Way and find a substantial spread in both quantities. Next…

High Energy Physics - Phenomenology · Physics 2020-08-26 Andrzej Hryczuk , Ekaterina Karukes , Leszek Roszkowski , Matthew Talia

Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new material that may have nanoscale size or heterogeneities. Here we…

We demonstrate a smart laser-diffraction analysis technique for particle mixture identification. We retrieve information about the size, geometry, and ratio concentration of two-component heterogeneous particle mixtures with an efficiency…

Image and Video Processing · Electrical Eng. & Systems 2022-02-03 Arturo Villegas , Mario A. Quiroz-Juarez , Alfred U'Ren , Juan P. Torres , Roberto de J. Leon-Montiel