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Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning…

The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,…

Tomography can be used to reveal internal properties of a 3D object using any penetrating wave. Advanced tomographic imaging techniques, however, are vulnerable to both systematic and random errors associated with the experimental…

Numerical Analysis · Mathematics 2019-02-08 Anthony P. Austin , Zichao Wendy Di , Sven Leyffer , Stefan M. Wild

Display-camera communication has become a promising direction in both computer vision and wireless communication communities. However, the consistency of the channel measurement is an open issue since precise calibration of the experimental…

Multimedia · Computer Science 2021-09-06 Changsheng Chen , Wai Ho Mow

Trained neural networks are promising tools to analyze the ever-increasing amount of scientific image data, but it is unclear how to best customize these networks for the unique features in transmission electron micrographs. Here, we…

Materials Science · Physics 2022-11-23 Katherine Sytwu , Catherine Groschner , Mary C. Scott

The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…

Optics · Physics 2025-01-29 Francisco Vega Ibáñez , Jo Verbeeck

Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…

In this study, we have used a Zr-Nb alloy containing well-defined nano-precipitates as a model material in which to study imaging contrast inversions (atomic number or diffraction contrast) observed with the forescattered electron imaging…

So far most studies on mathematical models for microelectromechanical systems (MEMS) are focused on the so-called small aspect ratio model which is a wave or beam equation with a singular source term. It is formally derived by setting the…

Analysis of PDEs · Mathematics 2016-01-25 Philippe Laurençot , Christoph Walker

The weak-lensing science of the LSST project drives the need to carefully model and separate the instrumental artifacts from the intrinsic lensing signal. The dominant source of the systematics for all ground based telescopes is the spatial…

Instrumentation and Methods for Astrophysics · Physics 2015-05-20 M. James Jee , J. Anthony Tyson

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of deep convolutional neural networks, is implemented on an…

Disordered Systems and Neural Networks · Physics 2022-07-27 Kevin M. Roccapriore , Matthew G. Boebinger , Ondrej Dyck , Ayana Ghosh , Raymond R. Unocic , Sergei V. Kalinin , Maxim Ziatdinov

Cosmic Microwave Background (CMB) lensing is a powerful probe of the matter distribution in the Universe. The standard quadratic estimator, which is typically used to measure the lensing signal, is known to be suboptimal for low-noise…

Cosmology and Nongalactic Astrophysics · Physics 2019-04-26 Benjamin Horowitz , Simone Ferraro , Blake D. Sherwin

The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…

Computer Vision and Pattern Recognition · Computer Science 2016-02-18 Wichai Shanklin

Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appearance of scan distortions. Whilst several strategies exist…

Instrumentation and Detectors · Physics 2023-08-09 Jonathan J. P Peters , Tiarnan Mullarkey , James A. Gott , Elizabeth Nelson , Lewys Jones

Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error…

Materials Science · Physics 2019-04-16 Tomohito Tanaka , Angus J. Wilkinson

Glass nanopipettes are widely used for various applications in nanosciences. In most of the applications, it is important to characterize their geometrical parameters, such as the aperture size and the inner cone angle at the tip region.…

Spectroscopic ellipsometry is a widely used optical technique both in industry and research for determining the optical properties and thickness of thin films. The effective use of spectroscopic ellipsometry on micro-structures is inhibited…

Optics · Physics 2023-02-28 Ralfy Kenaz , Ronen Rapaport

Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…

Instrumentation and Detectors · Physics 2018-12-05 Ali Motazedifard , S. Dehbod , A. Salehpour

Defects in crystalline materials control the properties of materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and…

Materials Science · Physics 2019-03-19 Daniel S. Gianola , T. Ben Britton , Stefan Zaefferer

Fine-grained understanding of human actions is essential for safe and intuitive human--robot interaction. We study the challenge of recognizing nearly symmetric actions, such as picking up vs. placing down a tool or opening vs. closing a…

Computer Vision and Pattern Recognition · Computer Science 2026-02-24 Thinesh Thiyakesan Ponbagavathi , Alina Roitberg