Related papers: Tuning the convergence angle for optimum STEM perf…
Ptychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the…
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged…
Creating arbitrary light patterns finds applications in various domains including lithography, beam shaping, metrology, sensing and imaging. We study the formation of high-contrast light patterns that are obtained by transmission through an…
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…
An investigation on stochastic deflection of high-energy negatively charged particles in a bent crystal was carried out. On the basis of analytical calculation and numerical simulation it was shown that it exists a maximum angle at which…
The capability of the adaptive optics to correct for the segmentation error is analyzed in terms of the residual wavefront RMS and the power spectral density of the phase. The analytical model and the end-to-end simulation give…
Crystals with small thickness along the beam exhibit top performance for steering particle beams through planar channeling. For such crystals, the effect of nuclear dechanneling plays an important role because it affects their efficiency.…
Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector…
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or…
Computerized Tomography assembly and system configuration are optimized for enhanced invertibility in sparse data reconstruction. Assembly generating maximum principal components/condition number of weight matrix is designated as best…
One of the largest obstacles facing scanning probe microscopy is the constant need to correct flaws in the scanning probe in situ. This is currently a manual, time-consuming process that would benefit greatly from automation. Here we…
The ultimate sensitivity of optical detection is limited by the signal-to-noise ratio (SNR). The first part of the paper shows that coherence plays an important role in the noise analysis. Although interference between an auxiliary wave and…
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven by recent advancements in direct electron detector…
The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…
The Scanning Tunneling Microscope (STM) is a powerful instrument to study electronic density of states at surfaces down to atomic scale. Many interesting samples require studying variations as a function of the magnetic field, which is most…
STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a programmable scan engine that allows to arbitrarily set the…
It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…
Strain engineering enables the direct modification of the atomic bonding and is currently an active area of research aimed at improving the electrocatalytic activity. However, directly measuring the lattice strain of individual catalyst…
We perform transmission spectroscopy on single quantum dots and examine the effects of a resident carriers spin, the incident laser spot size, polarization, and power on the experimental contrast. We demonstrate a factor of 4 improvement in…
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous works have previously highlighted and contrasted performance…