Related papers: Tuning the convergence angle for optimum STEM perf…
The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…
The Five-hundred-metre Aperture Spherical Telescope (FAST) uses adaptive spherical panels to achieve a huge collecting area for radio waves. In this paper, we try to explore the optimal parameters for the curvature radius of spherical…
Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM…
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent…
The performance of telescope systems working at microwave or visible/IR wavelengths is typically described in terms of different parameters according to the wavelength range. Most commercial ray tracing packages have been specifically…
Automated experiments in scanning transmission electron microscopy (STEM) require rapid image segmentation to optimize data representation for human interpretation, decision-making, site-selective spectroscopies, and atomic manipulation.…
Electron tomography has been studied in various fields. Various methods have been developed to align projection sets to construct ideally focused reconstruction. In this paper, we present how to align the projection set to distinguish…
Quantitative analysis methods based on the usage of a scanning electron microscope (SEM), such as energy dispersive x-ray spectroscopy, often require specimens to have a flat surface oriented normal to the electron beam. In-situ procedures…
Point-spread function of the probe forming optics ($PSF_{optics} $) is reported for the first time in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, the electron probe information is lost as the…
In optical metrology, grating-like structures are used as tools to evaluate the performance of lithographic techniques. In particular, several shape parameters characterize those structures. One of them, termed side-wall angle, suffers from…
We describe the optimum telescope focal ratio for a two-element, three surface, telecentric image-transfer microlens-to-fiber coupled integral field unit within the constraints imposed by micro-optics fabrication and optical aberrations. We…
The transmission electron microscope facilitates the highest-resolution imaging of any instrument ever created, and its limiting factor is no longer spatial resolution but dose efficiency. Low electron doses avoid sample damage but produce…
A possibility of a few MeV electron beam diagnostics (Lorentz factor ~ 10) using polarization characteristics of the optical transition radiation (OTR) have been considered. Determinaton of the electron beam divergence have been performed…
This study investigates the significance of flip angle, an imaging parameter, in enhancing Magnetic Resonance image quality under various imaging conditions. It specifically explores the extent to which the Ernst angle, an optimal flip…
It is well known that a minimum error quantum measurement for arbitrary binary optical coherent states can be realized by a receiver that comprises interfering with a coherent reference light, photon counting, and feedback control. We show…
For quantitative electron microscopy high precision position information is necessary so that besides an adequate resolution and sufficiently strong contrast of atoms, small width of peaks which represent atoms in structural images is…
Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive…
The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift…
The need to acquire multiple angle-resolved electron energy loss spectra (EELS) is one of the several critical challenges associated with electron magnetic circular dichroism (EMCD) experiments. If the experiments are performed by scanning…