Related papers: Electron Backscattered Diffraction using a New Mon…
Monolithic Active Pixel Sensors (MAPS) have been developed since the late 1990s based on silicon substrates with a thin epitaxial layer (thickness of 10-15 $\mu$m) in which charge is collected on an electrode, albeit by disordered and slow…
We present a procedure for fitting an ellipse to powder diffraction patterns recorded on a planar 2D detector, which uses the peak intensities as weights. This procedure works for complete and spotty diffraction rings. We outline all the…
Since the discovery of electron-wave duality, electron scattering instrumentation has developed into a powerful array of techniques for revealing the atomic structure of matter. Beyond detecting local lattice variations in equilibrium…
Compressed sensing can increase resolution, and decrease electron dose and scan time of electron microscope point-scan systems with minimal information loss. Building on a history of successful deep learning applications in compressed…
We present studies on electron backscattering from the surface of plastic scintillator beta detectors. By using a setup of two detectors coaxial with a strong external magnetic field - one detector serving as primary detector, the other as…
Optimizing the performance of organic solar cells (OSCs) hinges on a comprehensive understanding of their nanostructures, yet traditional characterization methods often fall short, delivering incomplete structural snapshots. We introduce…
Energy carrier transport and recombination in emerging semiconductors can be directly monitored with optical microscopy, leading to the measurement of the diffusion coefficient (D), a critical property for design of efficient optoelectronic…
Refraction of an optical probe beam by a plasma can be measured with angular filter refractometry (AFR), which produces an image containing intensity contours that correspond to curves of constant refraction angle. Further analysis is…
Exploiting light field data makes it possible to obtain dense and accurate depth map. However, synthetic scenes with limited disparity range cannot contain the diversity of real scenes. By training in synthetic data, current learning-based…
The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…
Use of electron vortex beams (EVB), that is convergent electron beams carrying an orbital angular momentum (OAM), is a novel development in the field of transmission electron microscopy. They should allow measurement of element-specific…
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged…
Two inverse scattering schemes were recently developed in \cite{LiLiuShangSun} for locating multiple electromagnetic (EM) scatterers, respectively, of small size and regular size compared to the detecting EM wavelength. Both schemes make…
LiDAR sensors can be used to obtain a wide range of measurement signals other than a simple 3D point cloud, and those signals can be leveraged to improve perception tasks like 3D object detection. A single laser pulse can be partially…
Efficient imaging of biomolecules, 2D materials and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope using a…
Ptychography is an enabling coherent diffraction imaging technique for both fundamental and applied sciences. Its applications in optical microscopy, however, fall short for its low imaging throughput and limited resolution. Here, we report…
Laser-induced electron diffraction is an evolving tabletop method, which aims to image ultrafast structural changes in gas-phase polyatomic molecules with sub-{\AA}ngstr\"om spatial and femtosecond temporal resolution. Here, we provide the…
EBSD is a foundational technique for characterizing crystallographic orientation, phase distribution, and lattice strain. Embedded within EBSD patterns lies latent information on dislocation structures, subtly encoded due to their deviation…
The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to…
Single-photon detection via absorption in current-biased nanoscale superconducting structures has become a preferred technology in quantum optics and related fields. Single-mode fiber packaged devices have seen new records set in detection…