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Probing the local structure and chemistry of wide-bandgap amorphous oxide thin films remains challenging due to the limitations of lab-based spectroscopy. This work integrates X-ray photoelectron spectroscopy (XPS), hard X-ray photoemission…

The development of new high dielectric materials is essential for advancement in modern electronics. Oxides are generally regarded as the most promising class of high dielectric materials for industrial applications as they possess both…

Materials Science · Physics 2019-09-11 Jingyu Qu , David Zageceta , Weiwei Zhang , Qiang Zhu

Materials characterization remains a significant, time-consuming undertaking. Generally speaking, spectroscopic techniques are used in conjunction with empirical and ab-initio calculations in order to elucidate structure. These experimental…

Materials Science · Physics 2014-05-15 William J. Brouwer , James D. Kubicki , Jorge O. Sofo , C. Lee Giles

We demonstrate high-resolution non-iterative holographic coherent diffraction imaging with hard X-rays using a novel phase-shifting reference, fabricated by atomic layer deposition to produce nanosharp 3D structure. The method surpasses the…

Mesoscale and Nanoscale Physics · Physics 2016-10-17 Mirna Saliba , Jeroen Bosgra , Christoph Rau , Christian David , Aaron D. Parsons , Ulrich H. Wagner , Pierre Thibault

Atomic layer deposition (ALD) enables the conformal coating of porous materials, making the technique suitable for pore size tuning at the atomic level, e.g., for applications in catalysis, gas separation and sensing. It is, however, not…

As symbolized by the Nobel Prize in Physics 2016, "topology" has been recognized as an essential standpoint to understand and control the physics of condensed matter. This concept may be spreading even into application areas such as novel…

Strongly Correlated Electrons · Physics 2018-03-09 Masaki Uchida , Masashi Kawasaki

Phase-sensitive integrated photonic devices are highly susceptible to minor manufacturing deviations, resulting in significant performance inconsistencies. This variability has limited the scalability and widespread adoption of these…

Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…

Applied Physics · Physics 2024-06-26 Aileen Luo , Tao Zhou , Martin V. Holt , Andrej Singer , Mathew J. Cherukara

Synchrotron-based x-ray reflectivity is increasingly employed as an \textit{in situ} probe of surface morphology during thin film growth, but complete interpretation of the results requires modeling the growth process. Many models have been…

Materials Science · Physics 2013-05-29 Arthur R. Woll , Tushar V. Desai , James R. Engstrom

Concurrent structural and electronic transformations in VO2 thin films are of twofold importance: enabling fine-tuning of the emergent electrical properties in functional devices, yet creating an intricate interfacial domain structure of…

Crystallization of thin film materials by exploiting laser induced crystallization has been advancing for the past four decades. This unique thin film technique has been predominantly used in processing thin film materials made of a single…

Applied Physics · Physics 2020-07-31 Brian Giraldo , Wenchang Yeh , Nobuhiko P. Kobayashi

Electron microscopy techniques are instrumental in the characterization of energy storage materials, with atomic resolution images providing the detailed structural features that are needed to understand their properties. Atomically…

Materials Science · Physics 2026-04-21 Ninon Scherz , Shashwat Anand , Colin Ophus , Tucker Holstun , Mary Scott , Tara P. Mishra , Gerbrand Ceder

The novel strain-driven morphotropic phase boundary (MPB) in highly-strained BiFeO3 thin film is featured by ordered mixed phase nanodomains (MPNs). Through scanning probe microscopy and synchrotron X-ray diffraction, eight structural…

Materials Science · Physics 2012-03-01 Lu You , Zuhuang Chen , Xi Zou , Hui Ding , Weigang Chen , Lang Chen , Guoliang Yuan , Junling Wang

In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a…

Interpreting spectroscopy data is a critical bottleneck in automating chemical research and industrial characterization. Particularly within infrared (IR) spectroscopy, identifying compounds in complex, liquid-phase chemical mixtures…

Materials Science · Physics 2026-02-26 Yannah J. U. Melle , Thanh Nguyen , Jeffrey Lopez , Daniel Schwalbe-Koda

Energy carrier transport and recombination in emerging semiconductors can be directly monitored with optical microscopy, leading to the measurement of the diffusion coefficient (D), a critical property for design of efficient optoelectronic…

We report on the near edge X-ray absorption fine structure (NEXAFS) spectroscopy of hybrid organic-inorganic resists. These materials are nonchemically amplified systems based on Si, Zr, and Ti oxides, synthesized from organically modified…

The ability to efficiently detect the software protections used is at a prime to facilitate the selection and application of adequate deob-fuscation techniques. We present a novel approach that combines semantic reasoning techniques with…

Computation and Language · Computer Science 2019-11-19 Ramtine Tofighi-Shirazi , Irina Mariuca Asavoae , Philippe Elbaz-Vincent

We search for new superhard B-N-O compounds with an iterative machine learning (ML) procedure, where ML models are trained using sample crystal structures from evolutionary algorithm. We first use cohesive energy to evaluate the…

Materials Science · Physics 2022-06-22 Wei-Chih Chen , Yogesh K. Vohra , Cheng-Chien Chen

Transition metal dichalcogenides (TMDs) are layered two-dimensional semiconductors explored for various optoelectronic applications, ranging from light-emitting diodes to single-photon emitters. To interact strongly with light, such devices…

Mesoscale and Nanoscale Physics · Physics 2024-07-15 Juri G. Crimmann , Moritz N. Junker , Yannik M. Glauser , Nolan Lassaline , Gabriel Nagamine , David J. Norris
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