Related papers: Image-Histogram-based Secondary Electron Counting …
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons…
High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scanning transmission electron microscope (STEM) has been shown…
We propose a new objective numerical figure of merit to aid in the evaluation and comparison of tissue-selective images generated from dual-energy radiography systems. A metric is developed through identification of the requirements of a…
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…
Photon-counting energy resolving detectors are subject to intense research interest, and there is a need for a general framework for performance assessment of these detectors. The commonly used linear-systems theory framework, which…
The efficiency of a radiation detector, intended as probability of detection of an incident quantum, depends on various factors: the detected fraction of quanta ascribed to the noise-less detector, the intrinsic noise of the detector, the…
Purpose: Developing photon-counting CT detectors requires understanding the impact of parameters such as converter material, absorption length and pixel size. We apply a novel linear-systems framework, incorporating spatial and energy…
Low dose electron imaging applications such as electron cyro-microscopy are now benefitting from the improved performance and flexibility of recently introduced electron imaging detectors in which electrons are directly incident on…
We report our detailed investigation of high-resolution imaging using secondary electrons (SE) with a subnanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire…
The aim of the present note is to derive a general formula for a detective quantum efficiency (DQE) of a neutron image plate detector which includes all essential parameters of the system. Relying on that formula, the effects of a variety…
A novel calorimeter sensor for electron, photon and hadron energy measurement based on Secondary Emission(SE) to measure ionization is described, using sheet-dynodes directly as the active detection medium; the shower particles in an SE…
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam. Multiple types of measurement noise limit the ultimate…
The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…
Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast…
We have used Molecular Beam Epitaxy (MBE)-based delta doping technology to demonstrate near 100% internal quantum efficiency (QE) on silicon electron-multiplied Charge Coupled Devices (EMCCDs) for single photon counting detection…
Quantum detector tomography is a fundamental technique for calibrating quantum devices and performing quantum engineering tasks. In this paper, a novel quantum detector tomography method is proposed. First, a series of different probe…
In this paper a general and unified treatment of the DQE is exposed, both in the space-domain and in the frequency-domain. The meaning of the DQE as quantum efficiency appears to be of paramount importance for a correct interpretation of…
Under the constraint of constant illumination, an information criterion is formulated for the Fisher information that compressed sensing measurements in optical and transmission electron microscopy contain about the underlying parameters.…
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material's properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution…