Related papers: Atomic-Scale Defect Detection by Nonlinear Light S…
An original idea of semiconductor defects identification in CCD matrix was presented in the article. The procedure is simple and easy to execute because of no need for special and expensive equipment. The method classifies defects into two…
We report on the optical characterization of semicontinuous nanostructured silver films exhibiting tunable optical reflectance asymmetries. The films are obtained using a multi-step process, where a nanocrystalline silver film is first…
Laser Light Scattering (LLS) method, combined with a long-distance microscope was utilized to detect micrometer-sized particles on a smooth substrate. LLS was capable to detect individual particle release, shrink, or fragmentation during…
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
Defect engineering has been profoundly employed to confer desirable functionality to materials that pristine lattices inherently lack. Although single atomic-resolution scanning transmission electron microscopy (STEM) images are widely…
Optical scattering presents a major obstacle to high resolution imaging in biological tissue and other turbid media. Conventional photoacoustic imaging can partially overcome this obstacle, enabling imaging of optical absorption in the…
Strained coherent heteroepitaxy of III-V semiconductor films such as In$_x$Ga$_{1-x}$As/GaAs has potential for electronic and optoelectronic applications such as high density logic, quantum computing architectures, laser diodes, and other…
Non-invasive detection of objects embedded inside an optically scattering medium is essential for numerous applications in engineering and sciences. However, in most applications light at visible or near-infrared wavebands is scattered by…
Anomaly Detection (AD), as a critical problem, has been widely discussed. In this paper, we specialize in one specific problem, Visual Defect Detection (VDD), in many industrial applications. And in practice, defect image samples are very…
Determination of the pairing symmetry in monolayer FeSe films on SrTiO3 is a requisite for understanding the high superconducting transition temperature in this system, which has attracted intense theoretical and experimental studies but…
Vertically stacked atomic layers from different layered crystals can be held together by van der Waals forces, which can be used for building novel heterostructures, offering a platform for developing a new generation of atomically thin,…
Sub-micrometer scale light patterns play a pivotal role in various fields, including biology, biophysics, and AMO physics. High-resolution, in situ observation of light profiles is essential for their design and application. However,…
We present a first-principles derivation of spatial atomic-sublevel decoherence near dielectric and metallic surfaces. The theory is based on the electromagnetic-field quantization in absorbing dielectric media. We derive an expression for…
The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…
What does the diffraction pattern from a single atom look like? How does it differ from the scattering from long range potential? With the development of new high-dynamic range pixel array detectors to measure the complete momentum…
Disordered nanostructures are commonly encountered in many nanophotonic systems, from colloid dispersions for sensing, to heterostructured photocatalysts. Randomness, however, imposes severe challenges for nanophotonics modeling, often…
An approach based on He scattering is used to develop an atomic-level structural model for an epitaxially grown disordered sub-monolayer of Ag on Pt(111) at 38K. Quantum scattering calculations are used to fit structural models to the…
Polycrystalline solids can exhibit material properties that differ significantly from those of equivalent single-crystal samples, in part, because of a spontaneous redistribution of mobile point defects into so-called space-charge regions…
Detection of surface defects is one of the most important issues in the field of image processing and machine vision. In this article, a method for detecting surface defects based on energy changes in co-occurrence matrices is presented.…
Reconstruction-based anomaly detection via denoising diffusion model has limitations in determining appropriate noise parameters that can degrade anomalies while preserving normal characteristics. Also, normal regions can fluctuate…