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As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the…

Computer Vision and Pattern Recognition · Computer Science 2023-11-23 Qiyu Wei , Wei Zhao , Xiaoyan Zheng , Zeng Zeng

Active nematics is an emerging paradigm for characterising biological systems. One aspect of particularly intense focus is the role active nematic defects play in these systems, as they have been found to mediate a growing number of…

Soft Condensed Matter · Physics 2024-01-25 Andrew Killeen , Thibault Bertrand , Chiu Fan Lee

The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and…

Computer Vision and Pattern Recognition · Computer Science 2023-11-22 Peng Wang , Haiming Yao , Wenyong Yu

We propose a novel deep learning framework for predicting permeability of porous media from their digital images. Unlike convolutional neural networks, instead of feeding the whole image volume as inputs to the network, we model the…

Image and Video Processing · Electrical Eng. & Systems 2021-10-13 Ali Kashefi , Tapan Mukerji

Hetero-epitaxial crystalline films underlie many electronic and optical technologies but are prone to forming defects at their hetero-interfaces. Atomic-scale defects such as threading dislocations that propagate into a film impede the flow…

Scanning transmission electron microscopy (STEM) is a powerful tool to reveal the morphologies and structures of materials, thereby attracting intensive interests from the scientific and industrial communities. The outstanding spatial…

Image and Video Processing · Electrical Eng. & Systems 2024-09-26 Hanlei Zhang , Jincheng Bai , Xiabo Chen , Can Li , Chuanjian Zhong , Jiye Fang , Guangwen Zhou

As a data-driven method, the performance of deep convolutional neural networks (CNN) relies heavily on training data. The prediction results of traditional networks give a bias toward larger classes, which tend to be the background in the…

Computer Vision and Pattern Recognition · Computer Science 2022-03-04 N. Anantrasirichai , David Bull

Feature foundation models - usually vision transformers - offer rich semantic descriptors of images, useful for downstream tasks such as (interactive) segmentation and object detection. For computational efficiency these descriptors are…

Computer Vision and Pattern Recognition · Computer Science 2025-09-01 Ronan Docherty , Antonis Vamvakeros , Samuel J. Cooper

Regular inspection of rail valves and engines is an important task to ensure the safety and efficiency of railway networks around the globe. Over the past decade, computer vision and pattern recognition based techniques have gained traction…

Computer Vision and Pattern Recognition · Computer Science 2019-12-10 Ramanpreet Singh Pahwa , Jin Chao , Jestine Paul , Yiqun Li , Ma Tin Lay Nwe , Shudong Xie , Ashish James , Arulmurugan Ambikapathi , Zeng Zeng , Vijay Ramaseshan Chandrasekhar

Surface defect inspection based on machine vision is often affected by uneven illumination. In order to improve the inspection rate of surface defects inspection under uneven illumination condition, this paper proposes a method for…

Computer Vision and Pattern Recognition · Computer Science 2023-07-18 Hao Wu , Yulong Liu , Wenbin Gao , Xiangrong Xu

Image segmentation is fundamental to microstructural analysis for defect identification and structure-property correlation, yet remains challenging due to pronounced heterogeneity in materials images arising from varied processing and…

Computer Vision and Pattern Recognition · Computer Science 2026-03-17 Sanjeev S. Navaratna , Nikhil Thawari , Gunashekhar Mari , Amritha V P , Murugaiyan Amirthalingam , Rohit Batra

This paper addresses the problem of defect segmentation in semiconductor manufacturing. The input of our segmentation is a scanning-electron-microscopy (SEM) image of the candidate defect region. We train a U-net shape network to segment…

Computer Vision and Pattern Recognition · Computer Science 2022-10-20 Nati Ofir , Ran Yacobi , Omer Granoviter , Boris Levant , Ore Shtalrid

Automatic defect recognition is one of the research hotspots in steel production, but most of the current methods mainly extract features manually and use machine learning classifiers to recognize defects, which cannot tackle the situation,…

Computer Vision and Pattern Recognition · Computer Science 2019-09-18 Jingwen Fu , Xiaoyan Zhu , Yingbin Li

Hybrid quantum-classical machine learning offers a promising direction for advancing automated quality control in industrial settings. In this study, we investigate two hybrid quantum-classical approaches for classifying defects in…

Computer Vision and Pattern Recognition · Computer Science 2026-04-01 Akshaya Srinivasan , Xiaoyin Cheng , Jianming Yi , Alexander Geng , Desislava Ivanova , Andreas Weinmann , Ali Moghiseh

Efficient automated print defect mapping is valuable to the printing industry since such defects directly influence customer-perceived printer quality and manually mapping them is cost-ineffective. Conventional methods consist of…

Computer Vision and Pattern Recognition · Computer Science 2020-01-29 Augusto C. Valente , Cristina Wada , Deangela Neves , Deangeli Neves , Fábio V. M. Perez , Guilherme A. S. Megeto , Marcos H. Cascone , Otavio Gomes , Qian Lin

Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…

Understanding elementary mechanisms behind solid-state phase transformations and reactions is the key to optimizing desired functional properties of many technologically relevant materials. Recent advances in scanning transmission electron…

Materials characterization remains a labor-intensive process, with a large amount of expert time required to post-process and analyze micrographs. As a result, machine learning has become an essential tool in materials science, including…

Materials Science · Physics 2024-03-20 Isaiah A. Moses , Chengyin Wu , Wesley F. Reinhart

In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods,…

Computer Vision and Pattern Recognition · Computer Science 2025-07-09 Shuai Li , Shihan Chen , Wanru Geng , Zhaohua Xu , Xiaolu Liu , Can Dong , Zhen Tian , Changlin Chen

Under the semi-supervised framework, we propose an end-to-end memory-based segmentation network (MemSeg) to detect surface defects on industrial products. Considering the small intra-class variance of products in the same production line,…

Computer Vision and Pattern Recognition · Computer Science 2022-05-03 Minghui Yang , Peng Wu , Jing Liu , Hui Feng