Related papers: Mirror Effect from Atomic Force Microscopy Profile…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both, the…
A thorough understanding of biological species and of emerging nanomaterials requires, among others, their in-depth characterization with optical techniques capable of nano-resolution. Nanoscopy techniques based on tip-enhanced optical…
We investigate the structure of the [bmim][Tf2N]/silica interface by simulating the indentation of a thin (4 nm) [bmim][Tf2N] film by a hard nanometric tip. The ionic liquid/silica interface is represented in atomistic detail, while the tip…
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning imperfections, and tip-sample interactions. To address this…
In this paper we consider the application of electromagnetic theory to the analysis of the Scanning Near-field Optical Microscope (SNOM) in order to predict experimentally observable quantities such as the transmission or reflection…
An analytical model of the electrostatic force between the tip of a non-contact Atomic Force Microscope (nc-AFM) and the (001) surface of an ionic crystal is reported. The model is able to account for the atomic contrast of the local…
Silicon nanostructuring imparts unique material properties including antireflectivity, antifogging, anti-icing, self-cleaning, and/or antimicrobial activity. To tune these properties however, a good control over features size and shape is…
As shown in recent experiments [Auslaender et al., Nature Physics 5, 35 (2009)] magnetic force microscopy permits one not only to image but also to manipulate an individual vortex in type-II superconductors, and this manipulation provides a…
We consider the problem of reconstructing a nanocrystal at atomic resolution from electron microscopy images taken at a few tilt angles. A popular reconstruction approach called discrete tomography confines the atom locations to a coarse…
Powerful mid-infrared illumination combined with mechanical detection via force microscopy provides access to nanoscale spectroscopic imaging in Materials and Life Sciences. Photo-induced force microscopy (PiFM) employs pulsed illumination…
Atomic force microscopy (AFM) can be used to characterise several aspects of the surface degradation and reinforcement mechanisms of zirconia based ceramics, such as crack propagation, martensitic relief formation, grains pull-out and…
We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of…
Deconvolution serves as a computational means of removing the effect of optical aberrations from recorded images and is employed in many technical and scientific fields of study. In most imaging scenarios the nature of the blurring kernel…
Two-point incremental forming (TPIF) is a flexible sheet metal forming process, commonly divided into positive and negative configurations. In order to improve the dimensional accuracy, thickness distribution, and overall formability of…
We perform simulations and experiments on an oscillating atomic force microscope cantilever approaching a surface, where the intermodulation response of the cantilever driven with two pure harmonic tones is investigated. In the simulations,…
We present a very efficient and accurate method to simulate scanning tunneling microscopy images and spectra from first-principles density functional calculations. The wave-functions of the tip and sample are calculated separately on the…
We model friction acting on the tip of an atomic force microscope as it is dragged across a surface at non-zero temperatures. We find that stick-slip motion occurs and that the average frictional force follows $|\ln v|^{2/3}$, where $v$ is…
We discuss experimental studies of the interaction between a nanoscopic object and a photonic crystal membrane resonator of quality factor Q=55000. By controlled actuation of a glass fiber tip in the near-field of a photonic crystal, we…
We report a carbon-fiber-tip based nanomanipulation system integrated into a scanning electron microscope for individual nanoparticle (NP) manipulation on a surface. Electrochemically etched amorphous carbon fiber tips with excellent…