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Piezoresponse force microscopy (PFM) is a powerful tool for probing nanometer-scale ferroelectric and piezoelectric properties. Hysteretic switching of the phase and amplitude of the PFM response are believed to be the hallmark of…

Materials Science · Physics 2016-10-04 Shilpa Sanwlani , Mohammad Balal , Shubhra Jyotsna , Goutam Sheet

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response…

Materials Science · Physics 2017-04-04 Daehee Seol , Bora Kim , Yunseok Kim

Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction…

Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…

Materials Science · Physics 2015-06-25 T. Jungk , A. Hoffmann , E. Soergel

To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside…

Materials Science · Physics 2009-11-10 Sergei V. Kalinin , Edgar Karapetian , Mark Kachanov

Electromechanical hysteresis loop measurements in Piezoresponse Force Microscopy (Piezoresponse Force Spectroscopy) have emerged as a powerful technique for probing ferroelectric switching behavior on the nanoscale. Interpretation of PFS…

Materials Science · Physics 2009-11-11 Anna N. Morozovska , Eugene A. Eliseev , Sergei V. Kalinin

Piezoresponse force microscopy (PFM) has been widely used for nanoscale analysis of piezoelectric properties and ferroelectric domains. Although PFM is useful because of its simple and nondestructive features, PFM measurements can be…

Applied Physics · Physics 2023-05-09 Jaegyu Kim , Seongwoo Cho , Jiwon Yeom , Seongmun Eom , Seungbum Hong

Piezoresponse Force Microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, the intensive study of conventional PFM has…

Applied Physics · Physics 2021-02-16 Qibin Zeng , Hongli Wang , Qicheng Huang , Zhen Fan , Kaiyang Zeng

Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful tool for probing polarization dynamics on the nanoscale. Application of a dc bias to a nanoscale probe in contact with a ferroelectric surface results in the nucleation and…

Materials Science · Physics 2007-05-23 Anna N. Morozovska , Sergei V. Kalinin , Eugene A. Eliseev , Sergei V. Svechnikov

We report the observation of $180^o$ phase switching on silicon wafers by piezo-response force microscopy (PFM). The switching is hysteretic and shows remarkable similarities with polarization switching in ferroelectrics. This is always…

Mesoscale and Nanoscale Physics · Physics 2014-04-29 Jagmeet S. Sekhon , Leena Aggarwal , Goutam Sheet

Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…

Materials Science · Physics 2018-04-26 Junxi Yu , Ehsan Nasr Esfahani , Qingfeng Zhu , Dongliang Shan , Tingting Jia , Shuhong Xie , Jiangyu Li

The extrinsic size effect in Piezoresponse Force Microscopy of ferroelectric and piezoelectric thin films on non-polar dielectric substrate is analyzed. Analytical expressions for effective piezoresponse, object transfer function…

Materials Science · Physics 2009-11-13 Anna N. Morozovska , Sergei V. Svechnikov , Eugene A. Eliseev , Sergei V. Kalinin

Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful technique for probing highly localized switching behavior and the role of microstructure and defects on switching. The application of a dc bias to a scanning probe microscope…

Signal formation mechanism of Piezoresponse Force Microscopy of piezoelectric surface layers and thin films on stiff and elastically matched substrates is analyzed and thickness dependence of effective piezoelectric response, object…

Materials Science · Physics 2009-11-13 Anna N. Morozovska , Eugene A. Eliseev , Sergei V. Kalinin

Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of…

Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes.…

Materials Science · Physics 2016-11-15 Sergei V. Kalinin , Andrei Rar , Stephen Jesse

The presence of electrostatic forces and associated artifacts complicates the interpretation of piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). Eliminating these artifacts provides an opportunity for…

Mesoscale and Nanoscale Physics · Physics 2021-12-20 Jason P. Killgore , Larry Robins , Liam Collins

Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and…

Materials Science · Physics 2007-05-23 Sergei V. Kalinin , Dawn A. Bonnell

The thermodynamics and kinetics of tip-induced polarization switching in Piezoresponse Force Microscopy in the presence of surface charge defects is studied using the combination of analytical and numerical techniques. The signature of the…

Domain dynamics in the Piezoresponse Force Spectroscopy (PFS) experiment is studied using the combination of local hysteresis loop acquisition with simultaneous domain imaging. The analytical theory for PFS signal from domain of arbitrary…

Materials Science · Physics 2009-11-13 I. Bdikin , A. Kholkin , A. N. Morozovska , S V. Svechnikov , S. -H. Kim , S. V. Kalinin
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