Related papers: High resolution strain measurements in highly diso…
The use of strongly bent crystals in spectrometers for pulses of a hard x-ray free-electron laser is explored theoretically. Diffraction is calculated in both dynamical and kinematical theories. It is shown that diffraction can be treated…
We study strain-controlled plastic deformation of crystalline solids via two-dimensional discrete dislocation dynamics simulations. To this end, we characterize the average stress-strain curves as well as the statistical properties of…
Object tracking in realistic scenarios is a difficult problem affected by various image factors such as occlusion, clutter, confusion, object shape, unstable speed, and zooming. While these conditions do affect tracking performance, there…
Multi-technique high resolution X-ray mapping enhanced by the recent advent of 4th generation synchrotron facilities can produce colossal datasets, challenging traditional analysis methods. Such difficulty is clearly materialized when…
Synchrotron Laue microdiffraction and Digital Image Correlation measurements were coupled to track the elastic strain field (or stress field) and the total strain field near a general grain boundary in a bent bicrystal. A 316L stainless…
Plastic deformation of micron-scale crystalline materials differ considerably from bulk ones, because it is characterized by random strain bursts. To obtain a detailed picture about this stochastic phenomenon, micron sized pillars have been…
In the present work, a method for the study of the structural deformations of two dimensional planar structures under uniaxial strain is presented. The method is based on molecular mechanics using the original stick and spiral model and a…
Multi-wavelength spectroscopy can be used to constrain the dust and gas properties in debris disks. Circumstellar dust absorbs and scatters incident stellar light. The scattered light is sometimes resolved spatially at visual and…
We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The…
Strain and composition play a fundamental role in semiconductor physics, since they are means to tune the electronic and optical properties of a material and hence develop new devices. Today it is still a challenge to measure strain in…
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…
Amorphous solids yield in strain-controlled protocols at a critical value of the strain. For larger strains the stress and energy display a generic complex serrated signal with elastic segments punctuated by sharp energy and stress plastic…
High-resolution imaging has delivered new prospects for detecting the material composition and structure of cultural treasures. Despite the various techniques for analysis, a significant diagnostic gap remained in the range of available…
The classical method of determining the atomic structure of complex molecules by analyzing diffraction patterns is currently undergoing drastic developments. Modern techniques for producing extremely bright and coherent X-ray lasers allow a…
2D materials offer an ideal platform to study the strain fields induced by individual atomic defects, yet challenges associated with radiation damage have so-far limited electron microscopy methods to probe these atomic-scale strain fields.…
While amorphous materials are often approximated to have a statistically homogeneous atomic structure, they frequently exhibit localized structural heterogeneity that challenges simplified models. This study uses 4D scanning transmission…
Disordered hyperuniform dispersions are exotic amorphous two-phase materials characterized by an anomalous suppression of long-wavelength volume-fraction fluctuations, endowing them with novel physical properties. While such unusual…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
Optical stellar interferometers have demonstrated milli-arcsecond resolution with few apertures spaced hundreds of meters apart. To obtain rich direct images, many apertures will be needed, for a better sampling of the incoming wavefront.…
The analysis of the electronic properties of strained or lattice deformed graphene combines ideas from classical condensed matter physics, soft matter, and geometrical aspects of quantum field theory (QFT) in curved spaces. Recent…