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X-ray resonant magnetic reflectivity (XRMR) allows for the simultaneous measurement of structural, optical and magnetooptic properties and depth profiles of a variety of thin film samples. However, a same-beamtime same-sample systematic…

Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the…

Instrumentation and Methods for Astrophysics · Physics 2015-09-09 D. Spiga , A. Mirone , G. Pareschi , R. Canestrari , V. Cotroneo , C. Ferrari , C. Ferrero , L. Lazzarini , D. Vernani

X-ray reflectivity (XRR) is widely used for thin-film structure analysis, and XRR data analysis involves minimizing the difference between an XRR curve calculated from model parameters describing the thin-film structure. This analysis takes…

Disordered Systems and Neural Networks · Physics 2022-03-31 Kook Tae Kim , Dong Ryeol Lee

X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple artificial neural network model can be used to predict the…

X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substrates. Due to the nested nature of equations modeling this…

Materials Science · Physics 2015-06-12 Donald Windover , David L. Gil , Yasushi Azuma , Toshiyuki Fujimoto

Over the past decade, reflection matrix microscopy (RMM) and advanced image reconstruction algorithms have emerged to address the fundamental imaging depth limitations of optical microscopy in thick biological tissues and complex media. In…

Optics · Physics 2024-07-03 Sungsam Kang , Seokchan Yoon , Wonshik Choi

Many nano and quantum devices, with their sizes often spanning from millimeters down to sub-nanometer, have intricate low-dimensional, non-uniform, or hierarchical structures on surfaces and interfaces. Since their functionalities are…

We test the reproducibility of X-ray reflectometry(XRR) measurements and optimizations using an National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and Technology (AIST) pre-standard. Based on…

Materials Science · Physics 2014-11-03 Donald Windover , David Gil , Yasushi Azuma , Toshiyuki Fujimoto

The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-ray energy is tuned to an absorption edge, this homogeneity…

Mesoscale and Nanoscale Physics · Physics 2015-08-31 M. Zwiebler , J. E. Hamann-Borrero , M. Vafaee , P. Komissinskiy , S. Macke , R. Sutarto , F. He , B. Büchner , G. A. Sawatzky , L. Alff , J. Geck

We present x-ray resonant magnetic reflectivity (XRMR) as a very sensitive tool to detect proximity induced interface spin polarization in Pt/Fe, Pt/Ni$_{33}$Fe$_{67}$, Pt/Ni$_{81}$Fe$_{19}$ (permalloy), and Pt/Ni bilayers. We demonstrate…

A versatile X-ray/neutron reflectivity (specular) simulator using LabVIEW(National Instruments Corp.) for structural study of a multi-layer thin film having any combination, including the repetitions, of nano-scale layers of different…

Mesoscale and Nanoscale Physics · Physics 2013-09-27 Sirshendu Gayen

Multilayer X-ray mirrors consist of a coating of a large number of alternate layers of high Z and low Z materials with a typical thickness of 10-100 Angstrom, on a suitable substrate. Such coatings play an important role in enhancing the…

Structured Adaptive Mesh Refinement (Structured AMR) enables simulations to adapt the domain resolution to save computation and storage, and has become one of the dominant data representations used by scientific simulations; however,…

Graphics · Computer Science 2020-09-08 Ingo Wald , Stefan Zellmann , Will Usher , Nate Morrical , Ulrich Lang , Valerio Pascucci

The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has…

Strongly Correlated Electrons · Physics 2015-05-13 A. Verna , B. A. Davidson , Y. Szeto , A. Yu. Petrov , A. Mirone , A. Giglia , N. Mahne , S. Nannarone

By adjusting the incidence angle of incoming X-ray near the critical angle of X-ray total reflection, the photoelectron intensity is strongly modulated due to the variation of X-ray penetration depth. Photoelectron spectroscopy (PES)…

Materials Science · Physics 2021-11-23 Julien E. Rault , Cheng-Tai Kuo , Henrique P. Martins , Giuseppina Conti , Slavomir Nemšák

Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnetic structures in a film. While magnetic arrays patterned by…

Mesoscale and Nanoscale Physics · Physics 2009-11-07 W. -T. Lee , S. G. E. te Velthuis , G. P. Felcher , F. Klose , T. Gredig , D. Dahlberg , B. V. Toperverg

Surface magnetic properties of perovskite manganites have been a recurrent topic during last years since they play a major role in the implementation of magnetoelectronic devices. Magneto-optical techniques, such as X-ray magnetic circular…

Materials Science · Physics 2007-06-07 S. Valencia , A. Gaupp , W. Gudat , Ll. Abad , Ll. Balcells , B. Martinez

This work demonstrates the Python package mlreflect which implements an optimized pipeline for the automized analysis of reflectometry data using machine learning. The package combines several training and data treatment techniques…

Functional Magnetic Resonance Imaging (fMRI) data is a widely used kind of four-dimensional biomedical data, which requires effective compression. However, fMRI compressing poses unique challenges due to its intricate temporal dynamics, low…

Image and Video Processing · Electrical Eng. & Systems 2024-03-01 Ruoran Li , Runzhao Yang , Wenxin Xiang , Yuxiao Cheng , Tingxiong Xiao , Jinli Suo

While a linear growth behavior is one of the fingerprints of textbook atomic layer deposition processes, the growth often deviates from that behavior in the initial regime, i.e. the first few cycles of a process. To properly understand the…

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