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Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of…

On- and off-axis electron energy loss spectroscopy (EELS) is a powerful method for probing local electronic structure on single atom level. However, many materials undergo electron-beam induced transformation during the scanning…

Materials Science · Physics 2023-10-23 Kevin M. Roccapriore , Riccardo Torsi , Joshua Robinson , Sergei V. Kalinin , Maxim Ziatdinov

DETR is the first end-to-end object detector using a transformer encoder-decoder architecture and demonstrates competitive performance but low computational efficiency on high resolution feature maps. The subsequent work, Deformable DETR,…

Computer Vision and Pattern Recognition · Computer Science 2022-03-07 Byungseok Roh , JaeWoong Shin , Wuhyun Shin , Saehoon Kim

Characterisation of rare microstructural features in scanning electron microscopy (SEM) requires imaging large areas at high resolution. This leads to prohibitively long acquisition times. We present an open-source Python framework that…

Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience.…

Applied Physics · Physics 2022-09-07 C. Gao , C. Hofer , D. Jannis , A. Béché , J. Verbeeck , T. J. Pennycook

Scanning transmission electron microscopy (STEM) is a powerful tool to reveal the morphologies and structures of materials, thereby attracting intensive interests from the scientific and industrial communities. The outstanding spatial…

Image and Video Processing · Electrical Eng. & Systems 2024-09-26 Hanlei Zhang , Jincheng Bai , Xiabo Chen , Can Li , Chuanjian Zhong , Jiye Fang , Guangwen Zhou

Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…

Materials Science · Physics 2011-12-15 Robert Hovden , Huolin L. Xin , David A. Muller

In this work, we perform semantic segmentation of multiple defect types in electron microscopy images of irradiated FeCrAl alloys using a deep learning Mask Regional Convolutional Neural Network (Mask R-CNN) model. We conduct an in-depth…

Computer Vision and Pattern Recognition · Computer Science 2021-10-18 Ryan Jacobs , Mingren Shen , Yuhan Liu , Wei Hao , Xiaoshan Li , Ruoyu He , Jacob RC Greaves , Donglin Wang , Zeming Xie , Zitong Huang , Chao Wang , Kevin G. Field , Dane Morgan

Image edge detection (ED) requires specialized architectures, reliable supervision, and rigorous evaluation criteria to ensure accurate localization. In this work, we present a framework for high-precision ED that jointly addresses…

Computer Vision and Pattern Recognition · Computer Science 2026-02-09 Hao Shu

For large scale applications, hybrid pixel detectors, in which sensor and read-out IC are separate entities, constitute the state of the art in pixel detector technology to date. They have been developed and start to be used as tracking…

Instrumentation and Detectors · Physics 2010-01-22 Norbert Wermes

The rapid development of deep learning has made a great progress in image segmentation, one of the fundamental tasks of computer vision. However, the current segmentation algorithms mostly rely on the availability of pixel-level…

Computer Vision and Pattern Recognition · Computer Science 2023-02-16 Wei Shen , Zelin Peng , Xuehui Wang , Huayu Wang , Jiazhong Cen , Dongsheng Jiang , Lingxi Xie , Xiaokang Yang , Qi Tian

The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…

Computer Vision and Pattern Recognition · Computer Science 2016-02-18 Wichai Shanklin

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of deep convolutional neural networks, is implemented on an…

Disordered Systems and Neural Networks · Physics 2022-07-27 Kevin M. Roccapriore , Matthew G. Boebinger , Ondrej Dyck , Ayana Ghosh , Raymond R. Unocic , Sergei V. Kalinin , Maxim Ziatdinov

The HASPIDE (Hydrogenated Amorphous Silicon PIxels DEtectors) project aims at the development of thin hydrogenated amorphous silicon (a-Si:H) detectors on flexible substrates (mostly Polyimide) for beam monitoring, neutron detection and…

Automatic medical image segmentation plays a crucial role in computer aided diagnosis. However, fully supervised learning approaches often require extensive and labor-intensive annotation efforts. To address this challenge, weakly…

Computer Vision and Pattern Recognition · Computer Science 2025-03-20 Lei Shi , Xi Fang , Naiyu Wang , Junxing Zhang

The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling contrast imaging (ECCI), and electron back scatter diffraction (EBSD) are reviewed. The dynamical diffraction…

Materials Science · Physics 2019-04-12 AJ Wilkinson , PB Hirsch

Dual-energy computed tomography (DECT) enables material-specific imaging through acquisitions at two different X-ray energy spectra. Material decomposition from DECT data is an ill-posed inverse problem that is highly sensitive to noise…

A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…

Materials Science · Physics 2021-12-15 Chu-Ping Yu , Thomas Friedrich , Daen Jannis , Sandra Van Aert , Johan Verbeeck

Detection Transformers (DETR) are renowned object detection pipelines, however computationally efficient multiscale detection using DETR is still challenging. In this paper, we propose a Cross-Resolution Encoding-Decoding (CRED) mechanism…

Computer Vision and Pattern Recognition · Computer Science 2024-10-08 Ashish Kumar , Jaesik Park

Thin planar pixel modules are promising candidates to instrument the inner layers of the new ATLAS pixel detector for HL-LHC, thanks to the reduced contribution to the material budget and their high charge collection efficiency after…

Instrumentation and Detectors · Physics 2016-09-21 Anna Macchiolo , Richard Nisius , Natascha Savic , Stefano Terzo