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The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…

Applied Physics · Physics 2023-01-26 Leonardo Corrêa , Eduardo Ortega , Arturo Ponce , Mônica Cotta , Daniel Ugarte

Phase-space procedure based on coherent state representation is proposed for investigation of reflection and transmission of light beams at a curved dielectric boundary. Numerical simulations of reflection and transmission of light at…

Optics · Physics 2011-01-06 Nikolai I. Petrov

The existence of large nonlinear optical coefficients is one of the preconditions for using nonlinear optical materials in nonlinear optical devices. For a crystal, such large coefficients can be achieved by matching photon energies with…

Materials Science · Physics 2018-12-27 J. L. Cheng , J. E. Sipe , S. W. Wu , Chunlei Guo

We report on a modified transfer technique for atomically thin materials integrated onto microelectromechanical systems (MEMS) for studying strain physics and creating strain-based devices. Our method tolerates the non-planar structures and…

Twistronics rooted in the twist operation towards bilayer van der Waals crystals is of both theoretical and technological importance. The realize of the correlated electronic behaviors under this operation encourages enormous effort to the…

Mesoscale and Nanoscale Physics · Physics 2018-11-22 Yu-Hao Shen , Wen-Yi Tong , He Hu , Chun-Gang Duan

Two-dimensional (2D) materials have attracted a great deal of interest in recent years. This family of materials allows for the realization of versatile electronic devices and holds promise for next-generation (opto)electronics. Their…

The structure of low-carbon steel after twist extrusion is tested with using electron backscattered diffraction. It has been shown that warm twist extrusion results in grain refinement with conservation of a substantial part of high-angle…

A thorough tensor analysis of the Bragg-forbidden reflection (00.3)$_h$ in corundum systems having a global center of inversion, like V$_2$O$_3$ and $\alpha$-Fe$_2$O$_3$, shows that anomalous x-ray resonant diffraction can access chiral…

Strongly Correlated Electrons · Physics 2007-05-23 S. Di Matteo , Y. Joly , A. Bombardi , L. Paolasini , F. de Bergevin , C. R. Natoli

Van der Waals heterostructures obtained by artificially stacking two-dimensional crystals represent the frontier of material engineering, demonstrating properties superior to those of the starting materials. Fine control of the interlayer…

We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to measure the (sub-pixel) difference in projection parameters…

Instrumentation and Detectors · Physics 2025-12-15 Ben Britton , Tianbi Zhang

In binary compound 2D insulators/semiconductors such as hexagonal boron nitride (hBN), the different electron affinities of atoms can give rise to out-of-plane electric polarizations across inversion asymmetric van der Waals interface of…

Mesoscale and Nanoscale Physics · Physics 2023-09-04 Hongyi Yu , Ziheng Zhou , Wang Yao

The use of coherent x-ray beams has been greatly developing for the past decades. They are now used by a wide scientific community to study biological materials, phase transitions in crystalline materials, soft matter, magnetism, strained…

Materials Science · Physics 2010-09-01 V. L. R. Jacques , S. Ravy , D. Le Bolloc'h , E. Pinsolle , M. Sauvage-Simkin , F. Livet

The optical and electronic properties of van der Waals (vdW) heterostructures depend strongly on the atomic stacking order of the constituent layers. This is exemplified by periodic variation of the local atomic registry, known as moire…

The diffraction of fast atoms at crystal surfaces is ideal for a detailed investigation of the surface electronic density. However, instead of sharp diffraction spots, most experiments show elongated streaks characteristic of inelastic…

Atomic Physics · Physics 2017-08-02 Philippe Roncin , Maxime Debiossac

Twisted 2D material heterostructures provide an exciting platform for investigating new fundamental physical phenomena. Many of the most interesting behaviours emerge at small twist angles, where the materials reconstruct to form areas of…

Etched multilayers obtained by forming a laminar grating pattern within interferential multilayer mirrors are used in the soft x-ray range to improve the spectral resolution of wavelength dispersive spectrometers equipped with periodic…

Instrumentation and Detectors · Physics 2012-09-03 Philippe Jonnard , Karine Le Guen , Jean-Michel André , Jean-René Coudevylle , Nathalie Isac

In this study we explore the possibility to use deep learning for the reconstruction of phase images from 4D scanning transmission electron microscopy (4D-STEM) data. The process can be divided into two main steps. First, the complex…

Materials Science · Physics 2023-02-15 Thomas Friedrich , Chu-Ping Yu , Jo Verbeeck , Sandra Van Aert

For the oblique helicoidal structure of the chiral twist-bend nematic-forming mixture of CB7CB/CB6OCB/5CB doped by light-sensitive chiral compound based on azo-fragment, two consequent states of Bragg reflection of the light in the visible…

Soft Condensed Matter · Physics 2024-04-08 H. Bogatyryova , V. Chornous , L. Lisetski , I. Gvozdovskyy

Electron-beam propagation experiments have been used to determine the energy and angle dependence of electron-electron (ee) scattering a two-dimensional electron gas (2DEG) in a very direct manner by a new spectroscopy method. The…

Mesoscale and Nanoscale Physics · Physics 2009-10-31 A. V. Yanovsky , H. Predel , H. Buhmann , R. N. Gurzhi , A. N. Kalinenko , A. I. Kopeliovich , L. W. Molenkamp

We measured the local composition and thickness of SiO2-based glass material from diffraction. By using four dimensional scanning transmission electron microscopy (4D-STEM), we obtained diffraction at each scanning point. Comparing the…

Materials Science · Physics 2020-05-20 K. Nakazawa , K. Mitsuishi , K. Shibata , S. Amma , T. Mizoguchi