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The x-ray polycapillary lens is an optical device with good optic performance. Similar to the traditional X-ray polycapillary lens, square polycapillary slice lens was regulated on X-ray based on the full reflection principle of X-ray in…
Focusing scattered light using wavefront shaping provides interesting perspectives to image deep in opaque samples, as e.g. in nonlinear fluorescence microscopy. Applying these technics to in vivo imaging remains challenging due to the…
In the field of beam physics, two frontier topics have taken center stage due to their potential to enable new approaches to discovery in a wide swath of science. These areas are: advanced, high gradient acceleration techniques, and x-ray…
Optical images of transparent three-dimensional objects can be different from a replica of the object's cross section in the image plane due to refraction at the surface or in the body of the object. Simulations of the object's image are…
Intensity, wavevector, phase, and polarization are the most important parameters of any light beam. Understanding the wavevector distribution has emerged as a very important problem in recent days, especially at nanoscale. It provides…
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical…
Focusing light into opaque random or scattering media such as biological tissue is a much sought-after goal for biomedical applications such as photodynamic therapy, optical manipulation, and photostimulation. However, focusing with…
The lateral resolution of an X-ray photoelectron spectroscopy instrument, which is equipped with a focused X-ray beam, is limited by the nominal X-ray beam diameter and the long tail intensity distri-bution of the X-ray beam. The long tail…
In the context of the LAUE project devoted to build a long focal-length focusing optics for soft $\gamma$-ray astronomy (80 - 600 keV), we present the results of reflectivity measurements of bent crystals in different configurations,…
The research and development of silicon-based X-ray fluorescence detectors achieved its submicron sensitivity. Its initial use is intended for in-situ beam monitoring at advanced light-source facilities. The effectively functioning…
A setup of a unique x-ray source is put forward employing a relativistic electron beam interacting with two counter-propagating laser pulses in the nonlinear few-photon regime. In contrast to Compton scattering sources, the envisaged x-ray…
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The…
We report on new results on the development activity of broad band Laue lenses for hard X-/gamma-ray astronomy (70/100-600 keV). After the development of a first prototype, whose performance was presented at the SPIE conference on…
Nowadays powerful X-ray sources like synchrotrons and free-electron lasers are considered as ultimate tools for probing microscopic properties in materials. However, the correct interpretation of such experiments requires a good…
Eyeframe lens tracing is an important process in the optical industry that requires sub-millimeter precision to ensure proper lens fitting and optimal vision correction. Traditional frame tracers rely on mechanical tools that need precise…
Microscopy and optical imaging are drastically limited by the inhomogeneities encountered by the light while propagating from the object of interest to the detection system. In this context, adaptive optics and wavefront manipulation are…
Three-photon (3P) microscopy is getting traction due to its superior performance in deep tissues. Yet, aberrations and light scattering still pose one of the main limitations in the attainable depth ranges for high-resolution imaging. Here,…
Three-dimensional spatiotemporal tracking of microscopic particles in multiple colors is a challenging optical imaging task. Existing approaches require a trade-off between photon-efficiency, field of view, mechanical complexity, spectral…
The ability to detect light over a broad spectral range is central for practical optoelectronic applications, and has been successfully demonstrated with photodetectors of two-dimensional layered crystals such as graphene and MoS2. However,…
A new instrument for spot profile analysis of electron diffraction - SPA-LEED - has been set up. The instrument works either with a transparent phosphor screen for visual inspection of the pattern or in its main mode with a channeltron for…