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We propose a novel method for testing isotropy of a three-dimensional distribution using Shannon entropy. We test the method on some Monte Carlo simulations of isotropic and anisotropic distributions and find that the method can effectively…

Cosmology and Nongalactic Astrophysics · Physics 2016-08-24 Biswajit Pandey

A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam…

Harnessing electron spin is crucial in developing energy-saving and high-speed devices for the next generation. In this scheme, visualizing spin-polarized electronic states aids in designing and developing new materials and devices.…

Materials Science · Physics 2024-04-03 Koichiro Yaji , Shunsuke Tsuda

Shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy (XMCD-PEEM) is a recent technique, in which the photon intensity in the shadow of an object lying on a surface, may be used to gather information about the…

Ultrasound is a continually developing technology that is broadly used for fast, non-destructive mechanical property detection of hard and soft materials in applications ranging from manufacturing to biomedical. In this study, a novel…

Medical Physics · Physics 2019-10-17 Yuqi Jin , Ezekiel Walker , Arkadii Krokhin , Hyeonu Heo , Tae-Youl Choi , Arup Neogi

Single molecule X-ray scattering experiments using free electron lasers hold the potential to resolve both single structures and structural ensembles of biomolecules. However, molecular electron density determination has so far not been…

Computational Physics · Physics 2026-04-17 Steffen Schultze , Helmut Grubmüller

By adjusting the incidence angle of incoming X-ray near the critical angle of X-ray total reflection, the photoelectron intensity is strongly modulated due to the variation of X-ray penetration depth. Photoelectron spectroscopy (PES)…

Materials Science · Physics 2021-11-23 Julien E. Rault , Cheng-Tai Kuo , Henrique P. Martins , Giuseppina Conti , Slavomir Nemšák

The dynamics of photo-excited charge carriers, particularly their transport and interactions with defects and interfaces, play an essential role in determining the performance of a wide range of solar and optoelectronic devices. A thorough…

Materials Science · Physics 2017-08-07 Bolin Liao , Ebrahim Najafi

Scanning Tunneling Microscopy (STM) has revolutionized our atomic scale understanding of surfaces and accelerated progress in nanotechnology. This technique, however, is restricted to metal or semiconducting samples, as it requires a tiny…

Instrumentation and Detectors · Physics 2026-04-16 M. J. Rost

Band gap variations in thin film structures, across grain boundaries, and in embedded nanoparticles are of increasing interest in the materials science community. As many common experimental techniques for measuring band gaps do not have…

Materials Science · Physics 2018-10-22 Cecilie S. Granerød , Wei Zhan , Øystein Prytz

Understanding and manipulating two-dimensional materials for real-world applications remains challenging due to a lack of effective and high-throughput characterization techniques. Soft X-ray time-of-flight photoemission electron microscopy…

Materials Science · Physics 2025-12-22 Aashwin Mishra , Daniel Ratner , Quynh Nguyen

The reduced dimensionality in two-dimensional materials leads a wealth of unusual properties, which are currently explored for both fundamental and applied sciences. In order to study the crystal structure, edge states, the formation of…

Mesoscale and Nanoscale Physics · Physics 2021-01-04 Felix Kern , Martin Linck , Daniel Wolf , Nasim Alem , Himani Arora , Sibylle Gemming , Artur Erbe , Alex Zettl , Bernd Büchner , Axel Lubk

Scanning Electron Microscopy (SEM) is critical in nanotechnology, materials science, and biological imaging due to its high spatial resolution and depth of focus. Signal-to-noise ratio (SNR) is an essential parameter in SEM because it…

Machine Learning · Computer Science 2025-10-10 K. S. Sim , I. Bukhori , D. C. Y. Ong , K. B. Gan

Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…

Computer Vision and Pattern Recognition · Computer Science 2026-03-20 Jilles S. van Hulst , W. P. M. H. Heemels , Duarte J. Antunes

While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost…

Linear polarization analysis of hard x-rays is employed to probe electronic anisotropies in metal-containing complexes with very high selectivity. We use the pronounced linear dichroism of nuclear resonant x-ray scattering to determine…

Scanning electron microscopy is a powerful tool for nanoscale imaging of organic and inorganic materials. An important metric for characterizing the limits of performance of these microscopes is the Detective Quantum Efficiency (DQE), which…

Instrumentation and Detectors · Physics 2020-08-17 Akshay Agarwal , John Simonaitis , Karl K. Berggren

We aim to improve segmentation through the use of machine learning tools during region agglomeration. We propose an active learning approach for performing hierarchical agglomerative segmentation from superpixels. Our method combines…

Computer Vision and Pattern Recognition · Computer Science 2015-03-13 Juan Nunez-Iglesias , Ryan Kennedy , Toufiq Parag , Jianbo Shi , Dmitri B. Chklovskii

Electrochemical strains are a ubiquitous feature of solid state ionic devices ranging from ion batteries and fuel cells to electroresistive and memristive memories. Recently, we proposed a scanning probe microscopy (SPM) based approach,…

Materials Science · Physics 2015-06-03 A. N. Morozovska , E. A. Eliseev , S. V. Kalinin

It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…

Instrumentation and Detectors · Physics 2015-12-29 Wei-Tse Chang , Chun-Yueh Lin , Wei-Hao Hsu , Mu-Tung Chang , Yi-Sheng Chen , En-Te Hwu , Ing-Shouh Hwang