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Related papers: Origin and nature of killer defects in 3C-SiC for …

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The silicon vacancy is a prominent intrinsic defect of cubic SiC (3C-SiC) to which much effort has been devoted so far, experimentally and theoretically. We calculate its properties using the GW approximation that does not suffer from the…

Materials Science · Physics 2015-05-20 Fabien Bruneval , Guido Roma

In this study, a multiphysics model fully coupling mass transport, deformation, phase field, and fatigue damage was developed to investigate the cracking and fracturing behaviours of Si particles during the single lithiation-delithiation…

Applied Physics · Physics 2026-01-06 Jie Yang , Wei Tan

Dimension reduction procedure is the recipe to represent defects in two dimensional dislocation dynamics according to the changes in the geometrical properties of the defects triggered by different conditions such as radiation, high…

Materials Science · Physics 2015-01-30 Ahmet Ilker Topuz

By applying our methodology, we propose a defect in 4H-SiC which combines a Si vacancy and a C atom substituted with S (VSiSC) to have a spin-triplet ground state with the spin qubit functionality. Our calculations confirm that all…

Materials Science · Physics 2026-04-17 Marisol Alcántara Ortigoza , Sergey Stolbov

Integrating light emitters based on III-V materials with silicon-based electronics is crucial for further increase in data transfer rates in communication systems since the indirect bandgap of silicon prevents its direct use as a light…

We investigate the effects of topological defects (dislocations) to the ground state of the solid-on-solid (SOS) model on a simple cubic disordered substrate utilizing the min-cost-flow algorithm from combinatorial optimization. The…

Disordered Systems and Neural Networks · Physics 2009-10-31 Frank O. Pfeiffer , Heiko Rieger

Quantum technologies would benefit from the development of high performance quantum defects acting as single-photon emitters or spin-photon interface. Finding such a quantum defect in silicon is especially appealing in view of its favorable…

Materials Science · Physics 2024-05-09 Yihuang Xiong , Jiongzhi Zheng , Shay McBride , Xueyue Zhang , Sinéad M. Griffin , Geoffroy Hautier

The primary factors controlling defect stability in phase-field crystal (PFC) models are examined, with illustrative examples involving several existing variations of the model. Guidelines are presented for constructing models with stable…

Materials Science · Physics 2015-06-11 Joel Berry , Nikolas Provatas , Jörg Rottler , Chad W. Sinclair

Crystalline defects critically influence material properties, necessitating accurate simulation methods. Existing approaches, from atomic-scale configurations to continuum elasticity, face inherent limitations in modeling…

Materials Science · Physics 2025-10-09 Xinyi Wei , Yangshuai Wang , Kai Jiang , Lei Zhang

This paper aims to critically review electrically active defects studied by junction spectroscopy techniques (deep-level transient spectroscopy and minority carrier transient spectroscopy) in the three most commonly used silicon carbide…

Materials Science · Physics 2025-05-27 Ivana Capan

Rapid solidification leads to unique microstructural features, where a less studied topic is the formation of various crystalline defects, including high dislocation densities, as well as gradients and splitting of the crystalline…

Due to their technological importance, point defects in silicon are among the best studied physical systems. The experimental examination of point defects buried in bulk is difficult and evidence for the various defects usually indirect.…

Materials Science · Physics 2009-11-07 Stefan Goedecker , Luc Billard , Thierry Deutsch

Micropipes are among the most detrimental defects in SiC wafer and are closely linked to catastrophic device failure. However, the microscopic defect nature of their internal sidewalls and the mechanism of the associated leakage current…

This review provides an overview of defects in silicon carbide (SiC) with potential applications as quantum qubits. It begins with a brief introduction to quantum qubits and existing qubit platforms, outlining the essential criteria a…

Materials Science · Physics 2025-05-22 Ivana Capan

The migration of point defects and formation of spin defects in 3C-SiC were investigated using molecular dynamics simulations, with migration barriers obtained from Nudged Elastic Band (NEB) calculations and finite temperature diffusivities…

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

Materials Science · Physics 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser

The morphology of defects formed in collision cascades is an essential aspect of the subsequent evolution of the microstructure. The morphological composition of a defect decides its stability, interaction, and migration properties. We…

Materials Science · Physics 2023-11-06 Utkarsh Bhardwaj , Andrea E. Sand , Manoj Warrier

Reliability has taken centre stage in the development of high-performance computing processors. A Surge of interest is noticeable in recent times in formulating fault and failure models, understanding failure mechanism and strategizing…

Hardware Architecture · Computer Science 2022-03-16 Shashikiran Venkatesha , Ranjani Parthasarathi

Identifying scalable materials systems that exhibit quantum behavior is a central challenge in quantum information science. Point defects in certain wide-bandgap semiconductors are promising in this regard due to the maturity of…

Quantum Physics · Physics 2026-03-17 Michael Kuban

Valence excitation spectra are computed for all deep-center silicon-vacancy defect types in 3C, 4H, and 6H silicon carbide (SiC) and comparisons are made with literature photoluminescence measurements. Nuclear geometries surrounding the…

Chemical Physics · Physics 2018-03-14 Jesse J. Lutz , Xiaofeng F. Duan , Larry W. Burggraf