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The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…
Describing the behaviour of strongly interacting particles in the presence of disorder is among the most challenging problems in quantum many-body physics. The controlled setting of cold atom experiments provides a new avenue to address…
Probing the local transport properties of two-dimensional electron systems (2DES) confined at buried interfaces requires a non-invasive technique with a high spatial resolution operating in a broad temperature range. In this paper, we…
Inelastic dark matter, in which WIMP-nucleus scatterings occur through a transition to an excited WIMP state ~ 100 keV above the ground state, provides a compelling explanation of the DAMA annual modulation signal. We demonstrate that the…
Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
Three-dimensional (3D) simulations of electron beams propagating in high energy density (HED) plasmas using the quasi-static Particle-in-Cell (PIC) code QuickPIC demonstrate a significant increase in stopping power when beam electrons…
The Interaction Enhanced Imaging technique allows to detect the spatial distribution of strongly interacting impurities embedded within a gas of background atoms used as a contrast medium. Here we present a detailed study of this technique,…
Detection of electron recoils by dark matter (DM) may reveal the structure of the dark sector. We consider a scenario where a heavier DM particle inelastically scatters off an electron and is converted into a lighter DM particle. A small…
We dispersively interface an ensemble of one thousand atoms trapped in the evanescent field surrounding a tapered optical nanofiber. This method relies on the azimuthally-asymmetric coupling of the ensemble with the evanescent field of an…
In a recently developed methodology termed photon induced near-field electron microscopy (PINEM), the inelastic scattering of electrons off illuminated nanostructures provides direct experimental access to the structure of optical…
Surface scattering of free electrons strongly modifies the electromagnetic response near the interface. Due to the inherent anisotropy of the surface scattering that necessarily reverses the normal the interface component of the electron…
We report a theoretical study of a double-well Ramsey interferometer using internal state labelling. We consider the use of a thermal ensemble of cold atoms rather than a Bose-Einstein condensate to minimize the effects of atomic…
We propose to use the defect creation energy loss in commonly used high energy physics solid state detectors as a tool to statistically identify dark matter signal from background. We simulate the energy loss in the process of defect…
Absorption-line systems detected in high resolution quasar spectra can be used to compare the value of dimensionless fundamental constants such as the fine-structure constant, alpha, and the proton-to-electron mass ratio, mu = m_p/m_e, as…
Helium-ion beams (HIB) focused to sub-nanometer scales have emerged as powerful tools for high-resolution imaging as well as nano-scale lithography, ion milling or deposition. Quantifying irradiation effects is essential for reliable device…
We present a simple and fast method for thickness characterization of suspended graphene flakes that is based on transmission electron microscopy (TEM) techniques. For this method, the dynamical theory of electron diffraction (Bloch-wave…
We present analytical estimates and numerical calculations showing that the energy level density in open-shell atoms increases exponentially with increase of excitation energy. As an example, we use the relativistic Hartree-Fock and…
Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective…
Electrical Impedance Tomography (EIT) is a powerful imaging technique with diverse applications, e.g., medical diagnosis, industrial monitoring, and environmental studies. The EIT inverse problem is about inferring the internal conductivity…