English
Related papers

Related papers: The Group Loss for Deep Metric Learning

200 papers

Learning with few labeled data is a key challenge for visual recognition, as deep neural networks tend to overfit using a few samples only. One of the Few-shot learning methods called metric learning addresses this challenge by first…

Computer Vision and Pattern Recognition · Computer Science 2022-03-28 Li Ke , Meng Pan , Weigao Wen , Dong Li

We address the problem of acoustic source separation in a deep learning framework we call "deep clustering." Rather than directly estimating signals or masking functions, we train a deep network to produce spectrogram embeddings that are…

Neural and Evolutionary Computing · Computer Science 2015-08-19 John R. Hershey , Zhuo Chen , Jonathan Le Roux , Shinji Watanabe

A key obstacle in automated analytics and meta-learning is the inability to recognize when different datasets contain measurements of the same variable. Because provided attribute labels are often uninformative in practice, this task may be…

Machine Learning · Computer Science 2019-09-12 Jonas Mueller , Alex Smola

In this work, we investigate several methods and strategies to learn deep embeddings for face recognition, using joint sample- and set-based optimization. We explain our framework that expands traditional learning with set-based supervision…

Computer Vision and Pattern Recognition · Computer Science 2020-09-09 Baris Gecer , Vassileios Balntas , Tae-Kyun Kim

Active learning is commonly used to train label-efficient models by adaptively selecting the most informative queries. However, most active learning strategies are designed to either learn a representation of the data (e.g., embedding or…

Machine Learning · Computer Science 2022-02-07 Namrata Nadagouda , Austin Xu , Mark A. Davenport

Deep Metric Learning (DML) models often require strong local and global representations, however, effective integration of local and global features in DML model training is a challenge. DML models are often trained with specific loss…

Computer Vision and Pattern Recognition · Computer Science 2021-12-30 Mohammad K. Ebrahimpour , Gang Qian , Allison Beach

We present a powerful new loss function and training scheme for learning binary hash codes with any differentiable model and similarity function. Our loss function improves over prior methods by using log likelihood loss on top of an…

Machine Learning · Computer Science 2018-10-03 Martin Loncaric , Bowei Liu , Ryan Weber

Recent advances in deep learning have pushed the performances of visual saliency models way further than it has ever been. Numerous models in the literature present new ways to design neural networks, to arrange gaze pattern data, or to…

Computer Vision and Pattern Recognition · Computer Science 2019-07-05 Alexandre Bruckert , Hamed R. Tavakoli , Zhi Liu , Marc Christie , Olivier Le Meur

Deep Metric Learning (DML) is helpful in computer vision tasks. In this paper, we firstly introduce DML into image co-segmentation. We propose a novel Triplet loss for Image Segmentation, called IS-Triplet loss for short, and combine it…

Computer Vision and Pattern Recognition · Computer Science 2021-03-22 Zhengwen Li , Xiabi Liu

The top-k error is a common measure of performance in machine learning and computer vision. In practice, top-k classification is typically performed with deep neural networks trained with the cross-entropy loss. Theoretical results indeed…

Machine Learning · Computer Science 2018-02-22 Leonard Berrada , Andrew Zisserman , M. Pawan Kumar

Embedded spaces are a key feature in deep learning. Good embedded spaces represent the data well to support classification and advanced techniques such as open-set recognition, few-short learning and explainability. This paper presents a…

Machine Learning · Computer Science 2024-08-06 Stefan Scholl

Recently, deep metric learning techniques received attention, as the learned distance representations are useful to capture the similarity relationship among samples and further improve the performance of various of supervised or…

Computer Vision and Pattern Recognition · Computer Science 2023-04-21 Zhiyuan Li , Anca Ralescu

Most classification models can be considered as the process of matching templates. However, when intra-class uncertainty/variability is not considered, especially for datasets containing unbalanced classes, this may lead to classification…

Computer Vision and Pattern Recognition · Computer Science 2021-04-13 He Zhu , Shan Yu

One of the main challenges for feature representation in deep learning-based classification is the design of appropriate loss functions that exhibit strong discriminative power. The classical softmax loss does not explicitly encourage…

Computer Vision and Pattern Recognition · Computer Science 2022-06-24 Xiong Zhou , Xianming Liu , Deming Zhai , Junjun Jiang , Xin Gao , Xiangyang Ji

In this paper, we introduce the Label-Aware Ranked loss, a novel metric loss function. Compared to the state-of-the-art Deep Metric Learning losses, this function takes advantage of the ranked ordering of the labels in regression problems.…

Signal Processing · Electrical Eng. & Systems 2022-10-26 Lorenzo Servadei , Huawei Sun , Julius Ott , Michael Stephan , Souvik Hazra , Thomas Stadelmayer , Daniela Sanchez Lopera , Robert Wille , Avik Santra

We introduce two-scale loss functions for use in various gradient descent algorithms applied to classification problems via deep neural networks. This new method is generic in the sense that it can be applied to a wide range of machine…

Numerical Analysis · Mathematics 2021-09-03 Leonid Berlyand , Robert Creese , Pierre-Emmanuel Jabin

Deep clustering against self-supervised learning is a very important and promising direction for unsupervised visual representation learning since it requires little domain knowledge to design pretext tasks. However, the key component,…

Computer Vision and Pattern Recognition · Computer Science 2020-08-21 Weijie Chen , Shiliang Pu , Di Xie , Shicai Yang , Yilu Guo , Luojun Lin

As shown in recent research, deep neural networks can perfectly fit randomly labeled data, but with very poor accuracy on held out data. This phenomenon indicates that loss functions such as cross-entropy are not a reliable indicator of…

Machine Learning · Statistics 2019-06-13 Yiding Jiang , Dilip Krishnan , Hossein Mobahi , Samy Bengio

Person re-identification (ReID) is an important task in computer vision. Recently, deep learning with a metric learning loss has become a common framework for ReID. In this paper, we also propose a new metric learning loss with hard sample…

Computer Vision and Pattern Recognition · Computer Science 2017-10-10 Qiqi Xiao , Hao Luo , Chi Zhang

Despite the undeniable progress in visual recognition tasks fueled by deep neural networks, there exists recent evidence showing that these models are poorly calibrated, resulting in over-confident predictions. The standard practices of…

Computer Vision and Pattern Recognition · Computer Science 2024-02-01 Balamurali Murugesan , Bingyuan Liu , Adrian Galdran , Ismail Ben Ayed , Jose Dolz
‹ Prev 1 8 9 10 Next ›