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Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…

Instrumentation and Detectors · Physics 2015-05-19 Petr Cizmar , Andras E. Vladar , Michael T. Postek

The manuscript considers Scanning Transmission Electron Microscopy (STEM) images and derives transformations needed to correct various distortions occurring during scanning. These transformations form the basis for the correction algorithms…

Instrumentation and Detectors · Physics 2026-05-13 Pavel Potapov , Giulio Guzzinati

Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…

Materials Science · Physics 2023-05-03 Stephanie M. Ribet , Colin Ophus , Roberto dos Reis , Vinayak P. Dravid

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…

Image and Video Processing · Electrical Eng. & Systems 2020-02-05 Etienne Monier , Thomas Oberlin , Nathalie Brun , Xiaoyan Li , Marcel Tencé , Nicolas Dobigeon

Neutrino detectors, particle calorimeters and some dark matter detectors require dense and massive active materials. An extremely fine segmentation is desirable to achieve precise three-dimensional particle tracking. However, such systems…

Fast and sensitive detector arrays enable image scanning microscopy (ISM), overcoming the trade-off between spatial resolution and signal-to-noise ratio (SNR) typical of confocal microscopy. However, current ISM approaches cannot provide…

Detecting local features, such as corners, segments or blobs, is the first step in the pipeline of many Computer Vision applications. Its speed is crucial for real-time applications. In this paper we present ELSED, the fastest line segment…

Computer Vision and Pattern Recognition · Computer Science 2021-12-22 Iago Suárez , José M. Buenaposada , Luis Baumela

Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…

Since the introduction of Direct Electron Detectors (DEDs), the resolution and range of macromolecules amenable to this technique has significantly widened, generating a broad interest that explains the well over a dozen reviews in top…

Computer Vision and Pattern Recognition · Computer Science 2017-01-03 Carlos Oscar S. Sorzano , Jose Maria Carazo

A scanning pixel camera is a novel low-cost, low-power sensor that is not diffraction limited. It produces data as a sequence of samples extracted from various parts of the scene during the course of a scan. It can provide very detailed…

Computer Vision and Pattern Recognition · Computer Science 2022-08-02 Yusuf Duman , Jean-Yves Guillemaut , Simon Hadfield

With the decreasing sizes of integrated-circuit components, the semiconductor industry is in growing need of high-throughput strain mapping techniques that offer high precision and spatial resolution, with desired industry goals of…

Lidar sensors are widely used in various applications, ranging from scientific fields over industrial use to integration in consumer products. With an ever growing number of different driver assistance systems, they have been introduced to…

Computer Vision and Pattern Recognition · Computer Science 2020-12-09 Frederik Hasecke , Lukas Hahn , Anton Kummert

Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…

Computer Vision and Pattern Recognition · Computer Science 2026-03-20 Jilles S. van Hulst , W. P. M. H. Heemels , Duarte J. Antunes

With the development of high repetition rate laser sources and advanced multi-particle correlation analyses such as covariance mapping, particle detection techniques such as velocity map imaging (VMI) are poised to offer unprecedented views…

Instrumentation and Detectors · Physics 2026-03-06 Ian Gabalski , Eleanor Weckwerth , Chuan Cheng , Philip H. Bucksbaum

A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…

Materials Science · Physics 2024-09-18 Ian MacLaren , Andrew T. Fraser , Matthew R. Lipsett , Colin Ophus

Compressed sensing can decrease scanning transmission electron microscopy electron dose and scan time with minimal information loss. Traditionally, sparse scans used in compressed sensing sample a static set of probing locations. However,…

Machine Learning · Computer Science 2021-03-12 Jeffrey M. Ede

Spectroscopic mapping by scanning transmission electron microscopy coupled with electron energy loss spectroscopy (STEM-EELS) is a powerful technique for determining the structure and chemistry of a wide range of materials and interfaces.…

Materials Science · Physics 2020-07-21 Berit H. Goodge , David J. Baek , Lena F. Kourkoutis

Direct methods have recently emerged as an effective and efficient tool in automated medical image analysis and become a trend to solve diverse challenging tasks in clinical practise. Compared to traditional methods, direct methods are of…

Computer Vision and Pattern Recognition · Computer Science 2015-10-22 Xiantong Zhen , Shuo Li

The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the…

Materials Science · Physics 2025-12-04 Rafael V. Ferreira , Sebastian Calderon V. , Paulo J. Ferreira

One of the optimization goals of a particle accelerator is to reach the highest possible beam peak current. For that to happen the electron bunch propagating through the accelerator should be kept relatively short along the direction of its…

Instrumentation and Detectors · Physics 2018-06-28 Aleksander Mielczarek , Dariusz Makowski , Andrzej Napieralski , Christopher Gerth , Bernd Steffen
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