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Correlation plenoptic imaging (CPI) is a scanning-free diffraction-limited 3D optical imaging technique exploiting the peculiar properties of correlated light sources. CPI has been further extended to samples of interest to microscopy, such…

The goal of our work is to perform pixel label semantic segmentation on 3D biomedical volumetric data. Manual annotation is always difficult for a large bio-medical dataset. So, we consider two cases where one dataset is fully labeled and…

Computer Vision and Pattern Recognition · Computer Science 2020-04-07 Shreya Roy , Anirban Chakraborty

Cryo-electron microscopy (cryo-EM) is an emerging experimental method to characterize the structure of large biomolecular assemblies. Single particle cryo-EM records 2D images (so-called micrographs) of projections of the three-dimensional…

Applications · Statistics 2013-12-02 Mikhail Langovoy , Michael Habeck , Bernhard Schoelkopf

Independently from electron beam based procedures, photon beam based diagnostics is an alternative way for alignment and commissioning of the numerous undulator cells in a high-gain short-wavelength free-electron laser (FEL). In this paper,…

Accelerator Physics · Physics 2014-10-15 Chao Feng , Haixiao Deng , Manzhou Zhang , Shunqiang Tian , Meng Zhang , Bo Liu , Zhimin Dai

Confocal laser scanning microscopy (CLSM) stands out as one of the most widely used microscopy techniques, thanks to its three-dimensional imaging capability and its sub-diffraction spatial resolution, achieved through the closure of a…

State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…

Computational Physics · Physics 2023-03-31 I. Lobato , T. Friedrich , S. Van Aert

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

Computer Vision and Pattern Recognition · Computer Science 2017-09-13 Benjamin Berkels , Benedikt Wirth

In this work we develop a simple equivalent circuit model (ECM) that predicts the spectral response of a lumped-element loaded single patterned layer reflective metasurface. The proposed ECM maintains accuracy across varying design…

Light and matter share fundamental statistical properties, yet the experimental probes of quantum optics and many-body physics have largely evolved along separate trajectories. While many-body physics explores emergent collective phenomena,…

Differentiating signals from the background in micrographs is a critical initial step for cryogenic electron microscopy (cryo-EM), yet it remains laborious due to low signal-to-noise ratio (SNR), the presence of contaminants and densely…

Image and Video Processing · Electrical Eng. & Systems 2025-09-30 Szu-Chi Chung , Po-Cheng Chou

Hierarchical multi-label classification (HMLC) is essential for modeling complex label dependencies in remote sensing. Existing methods, however, struggle with multi-path hierarchies where instances belong to multiple branches, and they…

Computer Vision and Pattern Recognition · Computer Science 2026-03-13 Marjan Stoimchev , Boshko Koloski , Jurica Levatić , Dragi Kocev , Sašo Džeroski

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

Instrumentation and Detectors · Physics 2016-01-06 Ing-Shouh Hwang

The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…

Characterizing crystal structures and interfaces down to the atomic level is an important step for designing advanced materials. Modern electron microscopy routinely achieves atomic resolution and is capable to resolve complex arrangements…

Materials Science · Physics 2023-09-07 Andreas Leitherer , Byung Chul Yeo , Christian H. Liebscher , Luca M. Ghiringhelli

Histopathology imaging is crucial for the diagnosis and treatment of skin diseases. For this reason, computer-assisted approaches have gained popularity and shown promising results in tasks such as segmentation and classification of skin…

Computer Vision and Pattern Recognition · Computer Science 2024-10-28 Luis Carlos Rivera Monroy , Leonhard Rist , Martin Eberhardt , Christian Ostalecki , Andreas Baur , Julio Vera , Katharina Breininger , Andreas Maier

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of deep convolutional neural networks, is implemented on an…

Disordered Systems and Neural Networks · Physics 2022-07-27 Kevin M. Roccapriore , Matthew G. Boebinger , Ondrej Dyck , Ayana Ghosh , Raymond R. Unocic , Sergei V. Kalinin , Maxim Ziatdinov

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…

We present a finite-element simulation tool for calculating light fields in 3D nano-optical devices. This allows to solve challenging problems on a standard personal computer. We present solutions to eigenvalue problems, like Bloch-type…

Optics · Physics 2009-05-28 S. Burger , R. Klose , A. Schaedle , F. Schmidt , L. Zschiedrich

We report the development and detailed calibration of a multiphoton fluorescence lifetime imaging system (FLIM) using a streak camera. The present system is versatile with high spatial (0.2 micron) and temporal (50 psec) resolution and…

Quantitative Methods · Quantitative Biology 2009-11-10 R. V. Krishnan , H. Saitoh , H. Terada , V. E. Centonze , B. Herman

A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…

Instrumentation and Detectors · Physics 2016-04-07 Gediminas Seniutinas , Armandas Balcytis , Saulius Juodkazis