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Machine Learning (ML) is of increasing interest for modeling parametric effects in manufacturing processes. But this approach is limited to established processes for which a deep physics-based understanding has been developed over time,…

Machine Learning · Computer Science 2023-08-15 Jeremy Cleeman , Kian Agrawala , Rajiv Malhotra

Recent advances in deep learning have achieved impressive gains in classification accuracy on a variety of types of data, including images and text. Despite these gains, however, concerns have been raised about the calibration, robustness,…

Machine Learning · Computer Science 2018-11-20 Dallas Card , Michael Zhang , Noah A. Smith

Quality management in semiconductor manufacturing often relies on template matching with known golden standards. For Indium-Phosphide (InP) multi-project wafer manufacturing, low production scale and high design variability lead to such…

Computer Vision and Pattern Recognition · Computer Science 2025-06-13 Emílio Dolgener Cantú , Rolf Klemens Wittmann , Oliver Abdeen , Patrick Wagner , Wojciech Samek , Moritz Baier , Sebastian Lapuschkin

We present a deep learning approach to estimation of the bead parameters in welding tasks. Our model is based on a four-hidden-layer neural network architecture. More specifically, the first three hidden layers of this architecture utilize…

Machine Learning · Computer Science 2015-07-09 Soheil Keshmiri , Xin Zheng , Chee Meng Chew , Chee Khiang Pang

In the upcoming years, artificial intelligence (AI) is going to transform the practice of medicine in most of its specialties. Deep learning can help achieve better and earlier problem detection, while reducing errors on diagnosis. By…

Machine Learning · Computer Science 2023-09-07 Julie Payette , Sylvain G. Cloutier , Fabrice Vaussenat

Automated and semi-automated techniques in biomedical electron microscopy (EM) enable the acquisition of large datasets at a high rate. Segmentation methods are therefore essential to analyze and interpret these large volumes of data, which…

Computer Vision and Pattern Recognition · Computer Science 2023-08-08 Anusha Aswath , Ahmad Alsahaf , Ben N. G. Giepmans , George Azzopardi

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

Computer Vision and Pattern Recognition · Computer Science 2024-07-16 Bappaditya Dey , Vic De Ridder , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

This paper addresses the problem of fault diagnosis in multistation assembly systems. Fault diagnosis is to identify process faults that cause the excessive dimensional variation of the product using dimensional measurements. For such…

Applications · Statistics 2022-10-31 Jihoon Chung , Bo Shen , Zhenyu , Kong

Powder X-ray diffraction analysis is a critical component of materials characterization methodologies. Discerning characteristic Bragg intensity peaks and assigning them to known crystalline phases is the first qualitative step of…

Materials Science · Physics 2023-04-12 Jaimie Greasley , Patrick Hosein

Recent advances in machine unlearning have focused on developing algorithms to remove specific training samples from a trained model. In contrast, we observe that not all models are equally easy to unlearn. Hence, we introduce a family of…

Computer Vision and Pattern Recognition · Computer Science 2026-03-25 Amber Yijia Zheng , Yu-Shan Tai , Raymond A. Yeh

Predictive and real-time inference capability for the upstream separatrix electron density, $n_\text{e, sep}$, is essential for design and control of core-edge integrated plasma scenarios. In this study, both supervised and semi-supervised…

Plasma Physics · Physics 2023-01-18 A. Kit , A. Jaervinen , S. Wiesen , Y. Poels , L. Frassinetti

Predicting mechanical properties in metal additive manufacturing (MAM) is essential for ensuring the performance and reliability of printed parts, as well as their suitability for specific applications. However, conducting experiments to…

Machine Learning · Computer Science 2024-11-01 Parand Akbari , Masoud Zamani , Amir Mostafaei

Damage models for ductile materials typically need to be parameterized, often with the appropriate parameters changing for a given material depending on the loading conditions. This can make parameterizing these models computationally…

Materials Science · Physics 2023-07-31 Daniel N. Blaschke , Thao Nguyen , Mashroor Nitol , Daniel O'Malley , Saryu Fensin

Deep learning is a topic of considerable current interest. The availability of massive data collections and powerful software resources has led to an impressive amount of results in many application areas that reveal essential but hidden…

Machine Learning · Computer Science 2023-01-31 Gianluigi Pillonetto , Aleksandr Aravkin , Daniel Gedon , Lennart Ljung , Antônio H. Ribeiro , Thomas B. Schön

Few-shot learning (FSL) has shown promise in vision but remains largely unexplored for \emph{industrial} time-series data, where annotating every new defect is prohibitively expensive. We present a systematic FSL study on screw-fastening…

Machine Learning · Computer Science 2025-11-20 Xinyuan Tu

Objective functions that optimize deep neural networks play a vital role in creating an enhanced feature representation of the input data. Although cross-entropy-based loss formulations have been extensively used in a variety of supervised…

Computer Vision and Pattern Recognition · Computer Science 2023-12-19 Deen Dayal Mohan , Bhavin Jawade , Srirangaraj Setlur , Venu Govindaraj

This study investigates the application of an artificial neural network to predict the complex dielectric properties of granular catalysts commonly used in microwave reaction chemistry. The study utilizes finite element electromagnetic…

Applied Physics · Physics 2020-07-06 Robert Tempke , Liam Thomas , Christina Wildfire , Dushyant Shekhawat , Terence Musho

The semiconductors industry benefits greatly from the integration of Machine Learning (ML)-based techniques in Technology Computer-Aided Design (TCAD) methods. The performance of ML models however relies heavily on the quality and quantity…

Machine Learning · Computer Science 2023-09-06 Zeheng Wang , Liang Li , Ross C. C. Leon , Jinlin Yang , Junjie Shi , Timothy van der Laan , Muhammad Usman

Deep learning has led to state-of-the-art results for many medical imaging tasks, such as segmentation of different anatomical structures. With the increased numbers of deep learning publications and openly available code, the approach to…

Image and Video Processing · Electrical Eng. & Systems 2020-05-19 Tom van Sonsbeek , Veronika Cheplygina

This study introduces a machine learning framework tailored to large-scale industrial processes characterized by a plethora of numerical and categorical inputs. The framework aims to (i) discern critical parameters influencing the output…