Related papers: Low-Energy Electron Potentiometry
Phase-shaped electron energy-loss spectroscopy (PSEELS) measures the scattering probability of structured free electron beams by a target. Over the last decade, it was shown that this scheme can be employed to emulate polarized optical…
Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free…
The optimized effective potential (OEP) method allows for calculation of the local, effective single particle potential of density functional theory for explicitly orbital-dependent approximations to the exchange-correlation energy…
A method for modeling the full steady-state and small-signal behavior of practical capacitive structures, such as metal-insulator-metal capacitors, diodes, and transistors, is presented. Simple lumped element models fail to properly…
Van der Waals (vdW) materials exhibit intriguing structural, electronic and photonic properties. Electron Energy Loss Spectroscopy (EELS) within Scanning Transmission Electron Microscope (STEM) allows for nanoscale mapping of such…
This paper provides a theoretical investigation of negative refraction and focusing of elastic guided waves in a free-standing plate with a step-like thickness change. Under certain conditions, a positive phase velocity (forward) Lamb mode…
Epsilon-Near-Zero materials exhibit a transition in the real part of the dielectric permittivity from positive to negative value as a function of wavelength. Here we study metal-dielectric layered metamaterials in the homogenised regime…
Dielectric tensor tomography is an imaging technique for mapping three-dimensional distributions of dielectric properties in transparent materials. This work introduces an enhanced illumination strategy employing a micro-electromechanical…
Electron microscopy techniques such as electron energy-loss spectroscopy (EELS) facilitate the spatio-spectral characterization of plasmonic nanostructures. In this work, a time-dependent perspective is presented, which significantly…
Ellipsometry is a powerful and well-established optical technique used in the characterisation of materials. It works by combining the components of elliptically polarized light in order to draw information about the optical system. We…
Accurate prediction of rock thermal conductivity under in-situ conditions is essential for characterizing subsurface heat flow. This study presents a numerical framework based on the Lattice Element Method (LEM) for simulating the effective…
Extreme Ultraviolet (EUV) lithography is the newest technology that will be used in the semiconductor industry for printing circuitry in the sub-20 nm scale. Low-energy electrons (LEEs) produced upon illumination of resist materials with…
The performance of electron energy-loss spectrometers can often be limited by their electron-optical aberrations. Due to recent developments in high energy-resolution and momentum-resolved electron energy loss spectroscopy (EELS), there is…
Standard Adjacency Spectral Embedding (ASE) relies on a global low-rank assumption often incompatible with the sparse, transitive structure of real-world networks, causing local geometric features to be 'smeared'. To address this, we…
The key challenge in current research into electromagnetic cloaking is to achieve invisibility over an extended bandwidth. There has been significant progress towards this using the idea of cloaking by sweeping under the carpet of Li and…
It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…
This paper models light scattering through flat surfaces with finite transmission, reflection and absorption rates, with wave packets approaching the mirror from both sides. While using the same notion of photons as in free space, our model…
A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…
A consistent theory of electron energy-loss spectroscopy (EELS) includes two indispensable elements: (i) electronic response of the target system and (ii) quantum kinematics of probing electrons. While for the bulk materials and their…
Millimetre-wave observations represent an important tool for Cosmology studies. The Line Intensity Mapping (LIM) technique has been proposed to map in three dimensions the specific intensity due to line (e.g. [CII], CO) emission, for…