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Related papers: Ar+-sputtered Ge (001) surface nanostructuring at …

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Self-organized pattern formation by the process of reverse epitaxial growth has been investigated on GaAs (001) surfaces during 1 keV Ar+ bombardment at target temperature of 450 degC for a wide range of incident angles. Highly ordered…

Materials Science · Physics 2016-08-24 Debasree Chowdhury , Debabrata Ghose

Normal incidence ion irradiation at elevated temperatures, when amorphization is prevented, induces novel nanoscale patterns of crystalline structures on elemental semiconductors by a reverse epitaxial growth mechanism: on Ge surfaces…

Mesoscale and Nanoscale Physics · Physics 2015-06-15 Xin Ou , Adrian Keller , Manfred Helm , Jürgen Fassbender , Stefan Facsko

In this paper evolution of silicon surface topography, under low energy ion bombardment, is investigated at higher oblique incident angles in the range of 63\degree-83\degree. Si(100) substrates were exposed to 500 eV argon ions. Different…

Mesoscale and Nanoscale Physics · Physics 2015-06-04 Tanmoy Basu , Jyoti Ranjan Mohanty , T. Som

Topography evolution of Si(100) surface due to oblique incidence low energy ion beam sputtering (IBS) is investigated. Experiments were carried out at different elevated temperatures from 20$^{\circ}$C to 450$^{\circ}$C and at each…

Materials Science · Physics 2016-04-08 Debasree Chowdhury , Biswarup Satpati , Debabrata Ghose

Off-normal low energy ion beam sputtering of solid surfaces often leads to morphological instabilities resulting in the spontaneous formation of ripple structures in nanometer length scales. In the case of Si surfaces at ambient…

Materials Science · Physics 2009-04-09 Safiul A. Mollick , D. Ghose

We investigate the morphologies of the Ge(001) surface that are produced by bombardment with a normally incident, broad argon ion beam at sample temperatures above the recrystallization temperature. Two previously-observed kinds of…

A study of ripple formation on sapphire surfaces by 300-2000 eV Ar+ ion bombardment is presented. Surface characterization by in-situ synchrotron grazing incidence small angle x-ray scattering and ex-situ atomic force microscopy is…

We have investigated the formation and growth of nano sized ripple topography on ZnO thin films by 10 keV O1+ bombardment at impact angles of 80{\degree} and 60{\degree}, varying the ion fluence from 5{times}10^16 to 1{\times}10^18…

Mesoscale and Nanoscale Physics · Physics 2011-12-01 S. Bhattacharjee , P. Karmakar , V. Naik , A. K. Sinha , A. Charkrabarti

Ripple formation driven by Ehrlich-Schwoebel barrier is evidenced for normal incidence 30 eV Ar+ bombardment of GaAs (001) surface at elevated target temperature. The pattern follows the symmetry of the bombarded crystal surface. The…

Two-level modeling for nanoscale pattern formation on silicon target by Ar$^+$ ion sputtering is presented. Phase diagram illustrating possible nanosize surface patterns is discussed. Scaling characteristics for the structure wavelength…

Materials Science · Physics 2011-07-01 V. O. Kharchenko , D. O. Kharchenko

Normal incidence 1 keV Ar$^+$ ion bombardment leads to amorphization and ultrasmoothing of Ge at room temperature, but at elevated temperatures the Ge surface remains crystalline and is unstable to the formation of self-organized nanoscale…

We study solid surface morphology created by off-normal ion-beam sputtering with an atomistic, solid-on-solid model of sputter erosion. With respect to an earlier version of the model, we extend this model with the inclusion of lateral…

Materials Science · Physics 2009-09-29 Emmanuel O. Yewande , Reiner Kree , Alexander K. Hartmann

The morphology evolution of Si (100) surfaces under 1200 eV Ar+ ion bombardment at normal incidence with and without metal incorporation is presented. The formation of nanodot patterns is observed only when the stationary Fe concentration…

Materials Science · Physics 2015-05-18 Jing Zhou , Stefan Facsko , Ming Lu , Wolfhard Moeller

We modify the theory of nanoscale patterns produced by ion bombardment with concurrent impurity deposition to take into account the effect that the near-surface impurities have on the collision cascades. As the impurity concentration is…

Materials Science · Physics 2016-05-04 R. Mark Bradley

Ion beam irradiation of semiconductors is a method to produce regular periodic nanoscale patterns self-organized on wafer scale. At low temperatures, the surface of semiconductors is typically amorphized by the ion beam. Above a material…

Mesoscale and Nanoscale Physics · Physics 2016-11-22 Martin Engler , Tomáš Škereň , Stefan Facsko

Coherent grazing-incidence small-angle X-ray scattering is used to investigate the average kinetics and the fluctuation dynamics during self-organized nanopatterning of silicon by Ar$^+$ bombardment at 65$^{\circ}$ polar angle. At early…

We have reported the dependence of projectile mass, chemical reactivity and effect of molecular beams on the ion induced nano structure formation, when 8 keV He1+, N1+, O1+, Ar1+ atomic ions and 16 keV N21+ and O21+ molecular ions are…

Materials Science · Physics 2015-06-03 S. Bhattacharjee , P. Karmakar , A. Chakrabarti

We derive a stochastic nonlinear continuum theory to describe the morphological evolution of amorphous surfaces eroded by ion bombardment. Starting from Sigmund's theory of sputter erosion, we calculate the coefficients appearing in the…

Materials Science · Physics 2007-05-23 Maxim Makeev , Rodolfo Cuerno , Albert-László Barabási

Despite extensive study, fundamental understanding of self-organized patterning by broad-beam ion bombardment is still incomplete and controversial. Understanding the nanopatterning of elemental semiconductors, particularly silicon, is both…

Si/Ge heteroepitaxial dots under tensile strain are grown on nanostructured Ge substrates produced by high-temperature flash heating exploiting the spontaneous faceting of the Ge(001) surface close to the onset of surface melting. A very…

Mesoscale and Nanoscale Physics · Physics 2019-04-18 L. Persichetti , M. Fanfoni , B. Bonanni , M. De Seta , L. Di Gaspare , C. Goletti , L. Ottaviano , A. Sgarlata
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