Related papers: Plasma Profiling Time-of-Flight Mass Spectrometry …

Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resolved elemental analysis as well as elemental depth profiling…

Mass spectrometry is a widespread approach to work out what are the constituents of a material. Atoms and molecules are removed from the material and collected, and subsequently, a critical step is to infer their correct identities based…

We describe a spin-resolved electron spectrometer capable of uniquely efficient and high energy resolution measurements. Spin analysis is obtained through polarimetry based on low-energy exchange scattering from a ferromagnetic thin-film…

X-ray photoelectron diffraction (XPD) has developed into a powerful technique for the structural analysis of solids. Extension of the technique into the hard-X-ray range (hXPD) gives access to true bulk information. Here we give a status…

The continuous technological development of electronic devices and the introduction of new materials leads to ever greater demands on the fabrication of semiconductor heterostructures and their characterization. This work focuses on…

Quantification of Ge in Si1-xGex structures (0.092<x<0.78) was carried by time-of-flight secondary ion mass spectrometry (TOF-SIMS) and electron-gas secondary neutral mass spectrometry (SNMS). A good linear correlation (R2>0.9997) of…

Time-of-flight (ToF) measurements is a possible alternative to anti-scatter grids in computed tomography (CT). Simulations have shown a possible 75% reduction in the detrimental scattering contribution with a 100 ps FWHM timing resolution.…

We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…

We introduce pulsed correlation time-of-flight (PC-ToF) sensing, a new operation mode for correlation time-of-flight range sensors that combines a sub-nanosecond laser pulse source with a rectangular demodulation at the sensor side. In…

We report the design of an angular array of electron Time-of-Flight (eToF) spectrometers intended for non-invasive spectral, temporal, and polarization characterization of single shots of high-repetition rate, quasi-continuous,…

Accurate Time-of-Flight (TOF) measurement with sub-100 picosecond resolution is a critical requirement for particle identification in future high-energy physics experiments, such as the Belle II $K_{L}$ and Muon (KLM) detector upgrade.…

Time-Of-Flight (TOF) methods are very effective to detect particles accelerated in laser-plasma interactions, but they shows significant limitations when used in experiments with high energy and intensity lasers, where both high-energy ions…

We demonstrate the implementation of a simple time-of-flight (ToF) mass spectrometer with medium-mass resolution ($m/\Delta m\sim50$) geared towards the demands of atomic, molecular, and chemical physics experiments. By utilizing a novel…

With the emergence of advanced Silicon (Si) sensor technologies such as LGADs, it is now possible to achieve exceptional time measurement precision below 50 ps. As a result, the implementation of time-of-flight (TOF) particle identification…

Depth cameras are emerging as a cornerstone modality with diverse applications that directly or indirectly rely on measured depth, including personal devices, robotics, and self-driving vehicles. Although time-of-flight (ToF) methods have…

Time-Of-Flight (TOF) technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions. Nevertheless, the presence of strong…

We study a simple modification to the conventional time of flight mass spectrometry (TOFMS) where a \emph{variable} and (pseudo)-\emph{random} pulsing rate is used which allows for traces from different pulses to overlap. This modification…

A novel detector based on a polycrystalline diamond sensor is here employed in an advanced Time-Of-Flight scheme for the characterization of energetic ions accelerated during laser-matter interactions. The optimization of the detector and…

The purpose of this study was to show how advanced concepts of compact, lossless and "Time Of Flight" (TOF) capable electronics similar to those foreseen for the LHC and ILC experiments could be fairly and easily transferred to the medical…

This paper describes the characterization of crystal matrices and silicon photomultiplier arrays for a novel Positron Emission Tomography (PET) detector, namely the external plate of the EndoTOFPET-US system. The EndoTOFPET-US collaboration…