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Despite the huge advancement in knowledge discovery and data mining techniques, the X-ray diffraction (XRD) analysis process has mostly remained untouched and still involves manual investigation, comparison, and verification. Due to the…
Quantitative measurements of extended defects in crystalline materials are important in understanding material behaviour. X-ray line profile analysis provides a complement to direct counting in the electron microscope, but is an indirect…
Enabled by x-ray free-electron lasers, nonlinear optical phenomena can be explored in the x-ray domain nowadays. Among the multitude of newly accessible processes, this theoretical study focuses parametric x-ray optical wavemixing for…
For over 40 years lithographic silicon scaling has driven circuit integration and performance improvement in the semiconductor industry. As silicon scaling slows down, the industry is increasingly dependent on IC package technologies to…
Hard X / soft gamma-ray polarimetric analysis can be performed efficiently by the study of Compton scattering anisotropy in a detector composed of fine pixels. But in the energy range above 100 keV where sources flux are extremely weak and…
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution…
Deep learning-based automated diagnosis of lung cancer has emerged as a crucial advancement that enables healthcare professionals to detect and initiate treatment earlier. However, these models require extensive training datasets with…
X-ray diffraction is ideal for probing sub-surface state during complex or rapid thermomechanical loading of crystalline materials. However, challenges arise as the size of diffraction volumes increases due to spatial broadening and…
New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…
Autonomous science platforms which make decisions on the fly are fundamentally changing the outlook for materials development. AI-driven schemes can effectively reduce the total number of iterations needed to arrive at the best…
The resolution of optical imaging is classically limited by the width of the point-spread function, which in turn is determined by the Rayleigh length. Recently, spatial-mode demultiplexing (SPADE) has been proposed as a method to achieve…
Precise knowledge of X-ray diffraction profile shape is crucial in the investigation of the properties of matter in crystals powder. Line-broadening analysis is a pre-processing step in most of the full powder pattern fitting softwares.…
Understanding the processes of perovskite crystallization is essential for improving the properties of organic solar cells. In situ real-time grazing-incidence X-ray diffraction (GIXD) is a key technique for this task, but it produces large…
Purpose: To accelerate MRI acquisition by incorporating the previous scans of a subject during reconstruction. Although longitudinal imaging constitutes much of clinical MRI, leveraging previous scans is challenging due to the complex…
We present a simplified model for dynamical diffraction of particles through a periodic thick perfect crystal based on repeated application of a coherent beam splitting unitary at coarse-grained lattice sites. By demanding translational…
We demonstrate that powder diffraction data can be collected from sub-micron crystals of a mbrane protein with nearly two orders of magnitude more atoms than the molecules commonly used for powder diffraction. The crystals of photosystem-1…
Deep-learning algorithms enable precise image recognition based on high-dimensional hierarchical image features. Here, we report the development and implementation of a deep-learning-based image segmentation algorithm in an autonomous…
A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…
Techniques for training artificial neural networks (ANNs) and convolutional neural networks (CNNs) using simulated dynamical electron diffraction patterns are described. The premise is based on the following facts. First, given a suitable…
We demonstrate dark-field x-ray microtomography in a compact, laboratory-based system capable of resolving attenuation, phase, and anisotropic scattering signals with micrometer-scale resolution across centimetre-scale samples. The method…