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The quality inspection of solder balls by detecting and measuring the void is important to improve the board yield issues in electronic circuits. In general, the inspection is carried out manually, based on 2D or 3D X-ray images. For high…

Image and Video Processing · Electrical Eng. & Systems 2019-07-10 Vijay Kumar Neeluru , Vikas Ahuja

Printed circuit boards (PCBs) are essential components of electronic devices, and ensuring their quality is crucial in their production. However, the vast variety of components and PCBs manufactured by different companies makes it…

Computer Vision and Pattern Recognition · Computer Science 2023-04-18 Faranak Shamsafar , Sunil Jaiswal , Benjamin Kelkel , Kireeti Bodduna , Klaus Illgner-Fehns

Quality control is a critical aspect of manufacturing, particularly in ensuring the proper assembly of small components in production lines. Existing solutions often rely on single-view imaging or manual inspection, which are prone to…

Computer Vision and Pattern Recognition · Computer Science 2025-09-30 Ali Nazeri , Shashank Mishra , Achim Wagner , Martin Ruskowski , Didier Stricker , Jason Rambach

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many…

Image and Video Processing · Electrical Eng. & Systems 2021-03-26 Qianru Zhang , Meng Zhang , Chinthaka Gamanayake , Chau Yuen , Zehao Geng , Hirunima Jayasekara , Xuewen Zhang , Chia-wei Woo , Jenny Low , Xiang Liu

Line segment detection plays a cornerstone role in computer vision tasks. Among numerous detection methods that have been recently proposed, the ones based on edge drawing attract increasing attention owing to their excellent detection…

Computer Vision and Pattern Recognition · Computer Science 2023-05-11 Xinyu Lin , Yingjie Zhou , Yipeng Liu , Ce Zhu

The motor control board has various defects such as inconsistent color differences, incorrect plug-in positions, solder short circuits, and more. These defects directly affect the performance and stability of the motor control board,…

Computer Vision and Pattern Recognition · Computer Science 2025-05-26 Jingde Huang , Zhangyu Huang , Chenyu Li , Jiantong Liu

Motherboard defect detection is critical for ensuring reliability in high-volume electronics manufacturing. While prior research in PCB inspection has largely targeted bare-board or trace-level defects, assembly-level inspection of full…

Computer Vision and Pattern Recognition · Computer Science 2025-10-17 Brandon Hill , Kma Solaiman

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

Computer Vision and Pattern Recognition · Computer Science 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

Semiconductor manufacturing is a complex, multistage process. Automated visual inspection of Scanning Electron Microscope (SEM) images is indispensable for minimizing equipment downtime and containing costs. Most previous research considers…

Computer Vision and Pattern Recognition · Computer Science 2025-05-13 Manuel Barusco , Francesco Borsatti , Youssef Ben Khalifa , Davide Dalle Pezze , Gian Antonio Susto

Detecting edges is a fundamental problem in computer vision with many applications, some involving very noisy images. While most edge detection methods are fast, they perform well only on relatively clean images. Indeed, edges in such…

Computer Vision and Pattern Recognition · Computer Science 2021-10-06 Nati Ofir , Meirav Galun , Boaz Nadler , Ronen Basri

Large-scale transmission radiography scanners are used to image vehicles and cargo containers. Acquired images are inspected for threats by a human operator or a computer algorithm. To make accurate detections, it is important that image…

Instrumentation and Detectors · Physics 2016-08-15 Thomas W. Rogers , James Ollier , Edward J. Morton , Lewis D. Griffin

The recent development of electric and electronic devices has been remarkable. The miniaturization of electronic devices and high integration are progressing by advances in mounting technology. As a result, the reliability of fatigue life…

Materials Science · Physics 2007-09-13 S. Kondo , Qiang Yu , T. Shibutani , M. Shiratori

Cosmic voids are biased tracers of the large-scale structure of the universe. Separate universe simulations (SUS) enable accurate measurements of this biasing relation by implementing the peak-background split (PBS). In this work, we apply…

Cosmology and Nongalactic Astrophysics · Physics 2020-02-12 Kwan Chuen Chan , Yin Li , Matteo Biagetti , Nico Hamaus

In electronics manufacturing, solder joint defects are a common problem affecting a variety of printed circuit board components. To identify and correct solder joint defects, the solder joints on a circuit board are typically inspected…

Computer Vision and Pattern Recognition · Computer Science 2022-11-21 Hayden Gunraj , Paul Guerrier , Sheldon Fernandez , Alexander Wong

In some scenarios, a single input image may not be enough to allow the object classification. In those cases, it is crucial to explore the complementary information extracted from images presenting the same object from multiple perspectives…

Computer Vision and Pattern Recognition · Computer Science 2022-05-24 Gabriel Machado , Keiller Nogueira , Matheus Barros Pereira , Jefersson Alex dos Santos

We study the prospects for measuring the dark matter distribution of voids with stacked weak lensing. We select voids from a large set of $N$-body simulations, and explore their lensing signals with the full ray-tracing simulations…

Cosmology and Nongalactic Astrophysics · Physics 2015-06-12 Yuichi Higuchi , Masamune Oguri , Takashi Hamana

We present a deep learning system for testing graphics units by detecting novel visual corruptions in videos. Unlike previous work in which manual tagging was required to collect labeled training data, our weak supervision method is fully…

Machine Learning · Computer Science 2021-08-10 Adi Szeskin , Lev Faivishevsky , Ashwin K Muppalla , Amitai Armon , Tom Hope

The adoption of 3D packaging technology necessitates the development of new approaches to failure electronic device analysis. To that end, our team is developing a tool called the quantum diamond microscope (QDM) that leverages an ensemble…

Understanding the interactions between microstructure, strain, phase, and material behavior is crucial in many scientific fields. However, quantifying these correlations is challenging, as it requires the use of multiple instruments and…

The growing demand for intelligent security in consumer electronics, such as smart home cameras and personal monitoring systems, is often hindered by the high computational cost and large model sizes of advanced AI. These limitations…

Computer Vision and Pattern Recognition · Computer Science 2025-06-09 Wen-Dong Jiang , Chih-Yung Chang , Ssu-Chi Kuai , Diptendu Sinha Roy
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