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The J\"ulich Electric Dipole moment Investigation (JEDI) collaboration aims at a direct measurement of the Electric Dipole Moment (EDM) of protons and deuterons using a storage ring. The measurement is based on a polarization measurement.…

Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is…

Computational Physics · Physics 2018-07-18 Thomas Benjamin Britton , Vivian Tong , Jim Hickey , Alex Foden , Angus Wilkinson

Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…

Materials Science · Physics 2018-11-15 Vivian S Tong , Alexander J Knowles , David Dye , T Ben Britton

An electron transport is studied in the system which consists of scanning tunneling microscopy-single molecule magnet-metal. Due to quantum tunneling of magnetization in single-molecule magnet, linear response conductance exhibits stepwise…

Mesoscale and Nanoscale Physics · Physics 2009-11-10 Gwang-Hee Kim , Tae-Suk Kim

Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited…

Signal Processing · Electrical Eng. & Systems 2021-12-23 Daniel Nicholls , Alex Robinson , Jack Wells , Amirafshar Moshtaghpour , Mounib Bahri , Angus Kirkland , Nigel Browning

Recently, a new device to measure the Orbital Angular Momentum (OAM) electronic spectrum after elastic/inelastic scattering in a transmission electron microscope has been introduced. We modified the theoretical framework needed to describe…

Instrumentation and Detectors · Physics 2020-05-28 Matteo Zanfrognini , Enzo Rotunno , Stefano Frabboni , Alicia Sit , Ebrahim Karimi , Ulrich Hohenester , Vincenzo Grillo

We show that de-focused single particle images recorded using a cryo-electron microscope (cryoEM) system may be processed like a Fresnel zone in-line hologram to obtain physically meaningful quantitative phase maps associated with…

Image and Video Processing · Electrical Eng. & Systems 2021-11-24 Apoorv Pant , Manidipa Banerjee , Kedar Khare

Transmission electron microscopes (TEMs) enable atomic-scale imaging and characterisation, driving advances across fields from materials science to biology. Quantum correlations, specifically entanglement, may provide a basis for novel…

AC susceptometry, unlike static susceptometry, offers a deeper insight into magnetic materials. By employing AC susceptibility measurements, one can glean into crucial details regarding magnetic dynamics. Nevertheless, traditional AC…

Quantum Physics · Physics 2024-05-24 Dasika Shishir , Matthew L. Markham , Kasturi Saha

The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…

Instrumentation and Detectors · Physics 2016-03-23 Armand Béché , Bart Goris , Bert Freitag , Jo Verbeeck

Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration…

sEMG pattern recognition algorithms have been explored extensively in decoding movement intent, yet are known to be vulnerable to changing recording conditions, exhibiting significant drops in performance across subjects, and even across…

Machine Learning · Computer Science 2024-01-08 Joao Pereira , Dimitrios Chalatsis , Balint Hodossy , Dario Farina

Sub-micrometer scale light patterns play a pivotal role in various fields, including biology, biophysics, and AMO physics. High-resolution, in situ observation of light profiles is essential for their design and application. However,…

Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…

The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…

Materials Science · Physics 2021-03-30 Jacob Madsen , Timothy J. Pennycook , Toma Susi

Nitrogen-vacancy centers in diamond have been shown to be capable of detecting AC magnetic fields with high sensitivity, spectral resolution, and spatial resolution. However, most studies so far have focused on the regime of time-averaged…

What does the diffraction pattern from a single atom look like? How does it differ from the scattering from long range potential? With the development of new high-dynamic range pixel array detectors to measure the complete momentum…

Instrumentation and Detectors · Physics 2017-11-29 Michael C. Cao , Yimo Han , Zhen Chen , Yi Jiang , Kayla X. Nguyen , Emrah Turgut , Greg Fuchs , David A. Muller

The measurement of shifts in the energy of X-ray emission lines is important for understanding the electronic structure and physical properties of materials. In this study, we demonstrate a method using a synchrotron source to introduce…

Instrumentation and Detectors · Physics 2025-02-19 Tejas Guruswamy , Orlando Quaranta , Lisa Gades , Umeshkumar Patel , Antonino Miceli

A prototype experiment to measure the neutron electric dipole moment (nEDM) by spin-rotation in a non-centrosymmetric crystal in Laue geometry was carried out in order to investigate the statistical sensitivity and systematic effects of the…

High Energy Physics - Experiment · Physics 2007-05-23 V. V. Fedorov , E. G. Lapin , E. Lelievre-Berna , V. Nesvizhevsky , A. Petoukhov , S. Yu. Semenikhin , T. Soldner , F. Tasset , V. V. Voronin

We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This…

Materials Science · Physics 2024-05-29 Jiadong Dan , Cheng Zhang , Xiaoxu Zhao , N. Duane Loh
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