Related papers: Patterned Probes for High Precision 4D-STEM Bragg …
Coherent precipitation of ordered phases is responsible for providing exceptional high temperature mechanical properties in a wide range of compositionally complex alloys (CCAs). Ordered phases are also essential to enhance the magnetic or…
The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present a precession electron diffraction assisted 4D-STEM…
Moir\'e fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another reference lattice. This method was recently demonstrated in…
The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to…
Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by…
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…
Due to their superior fatigue strength, martensitic steels are the material of choice for high cyclic loading applications such as coil springs. However, crack propagation is influenced by residual stresses and their interaction is poorly…
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…
Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction pattern from a projected area of a few unit cells…
Bragg coherent diffraction imaging (BCDI) is a unique and powerful method for tracking three-dimensional strain fields non-destructively. While BCDI has been successfully applied to many scientific research fields and receives high demands,…
The recently developed precession electron diffraction (PED) technique in scanning transmission electron microscopy (STEM) has been used to elucidate the local strain distribution and crystalline misorientation in CMOS fabricated strained…
Continuum robots in robot-assisted minimally invasive surgeries provide adequate access to target anatomies that are not directly reachable through small incisions. Achieving precise and reliable motion control of such snake-like…
Dynamically compressed materials in longitudinal waves are described by two physical models: hydrostatic pressure, with equal, normal, principal stresses or material uniaxially strained in the wave propagation direction. These models are…
Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…
Recently, a number of reconstruction algorithms have been presented for residual strain tomography from Bragg-edge neutron transmission measurements. In this paper, we examine whether strain tomography can also be achieved from diffraction…
We report on a new high resolution apparatus for measuring magnetostriction suitable for use at cryogenic temperatures in pulsed high magnetic fields which we have developed at the Hochfeld-Magnetlabor Dresden. Optical fibre strain gauges…
In the past few decades, fibre Bragg grating (FBG) sensors have gained a lot of attention in the field of distributed point strain measurement. One of the most interesting properties of these sensors is the presumed linear relationship…
Understanding lattice deformations is crucial in determining the properties of nanomaterials, which can become more prominent in future applications ranging from energy harvesting to electronic devices. However, it remains challenging to…
Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error…
We introduce a denoising method for four-dimensional scanning transmission electron microscopy (4D-STEM) that relies on processing local, scan position-independent electron event-sparse data stacks, called event-sparse stack denoising. This…