Related papers: Design for a 10 KeV Multi-Pass Transmission Electr…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…
Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data…
The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…
A design of an efficient monochromatic electron source for Inverse Photoemission Spectroscopy (IPES) apparatus is described. The electron source consists of a BaO cathode, a focus electrostatic lens, a hemispherical deflection monochromator…
Photoemission electron microscopy (PEEM) has evolved into an indispensable tool for structural and magnetic characterization of surfaces at the nanometer scale. In strong contrast to synchrotron-radiation-based X-ray PEEM as a leading…
A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…
Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…
The strong electric field between the sample and the extractor is the core of cathode lenses and a pivotal determinant of high resolution. Nevertheless, fields in the range of 3-8 kV/mm can be a source of complications. Local field…
Three-dimensional electron diffraction (3DED) is a powerful technique providing for crystal structure solutions of sub-micron sized crystals too small for structure determination via X-ray techniques. The entry requirement, however, of a…
*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized…
Pushing the limits in temporal resolution for transmission electron microscopy (TEM) requires a revolutionary change in the electron source technology. In this paper we study the possibility of employing a radiofrequency photoinjector as…
The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…
Here we describe the development of the MALTS software which is a generalised tool that simulates Lorentz Transmission Electron Microscopy (LTEM) contrast of thin magnetic nanostructures. Complex magnetic nanostructures typically have…
When using an electron microscope for imaging of particles embedded in vitreous ice, the objective lens will inevitably corrupt the projection images. This corruption manifests as a band-pass filter on the micrograph. In addition, it causes…
Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image…
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent…
We construct a low-temperature microwave waveguide interferometer for measuring high-frequency properties of two-dimensional electron gases (2DEGs). Coupled plasmon-cyclotron resonance (PCR) spectra are used to extract effective mass, bulk…
High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scanning transmission electron microscope (STEM) has been shown…
The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…