Related papers: High-angular resolution electron backscatter diffr…
Electron backscatter diffraction is one of the most prevalent techniques used for microstructural characterization. In recent years, there has been an increase in the use of data-driven methods to analyze raw Kikuchi patterns. However, most…
Strain and composition play a fundamental role in semiconductor physics, since they are means to tune the electronic and optical properties of a material and hence develop new devices. Today it is still a challenge to measure strain in…
The in situ synchrotron high-energy X-ray powder diffraction (XRD) technique is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g., battery materials) or in complex sample…
Convergent beam electron diffraction (CBED) performed on two-dimensional (2D) materials recently emerged as a powerful tool to study structural and stacking defects, adsorbates, atomic 3D displacements in the layers, and the interlayer…
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…
High energy electron radiography (HEER) is a promising tool for high energy density physics diagnostics, apart from other tools like X/{\gamma} ray shadowgraphy and high energy proton radiography. Impressive progresses have been made in…
The present paper reports on the recent activity of the data analysis software development for total-reflection high-energy positron diffraction (TRHEPD), a novel experimental technique for surface structure determination. Experiments using…
The information content of crystalline materials becomes astronomical when collective electronic behavior and their fluctuations are taken into account. In the past decade, improvements in source brightness and detector technology at modern…
Optimizing the performance of organic solar cells (OSCs) hinges on a comprehensive understanding of their nanostructures, yet traditional characterization methods often fall short, delivering incomplete structural snapshots. We introduce…
Materials performance is deeply linked to their microstructures, which govern key properties such as strength, durability, and fatigue resistance. EBSD is a major technique for characterizing these microstructures, but acquiring large and…
Nanoindentation is a widely used method for sensitive exploration of the mechanical properties of micromechanical systems. We derived an empirical analysis technique to extract stress-strain field gradient and divergence representations…
Three-dimensional electron diffraction (3DED) is a powerful technique providing for crystal structure solutions of sub-micron sized crystals too small for structure determination via X-ray techniques. The entry requirement, however, of a…
Resonant X-ray scattering (RXS) is a spectroscopy where both the power of site selective diffraction and the power of local absorption spectroscopy regarding atomic species are combined. By virtue of the dependence on the core level state…
We present the formulation for finding the distribution of eigenstrains, i.e. the sources of residual stress, from a set of measurements of residual elastic strain (e.g. by diffraction), or residual stress, or stress redistribution, or…
High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…
Crystal orientation and strain mapping of an individual curved and asymmetrical core-shell hetero-nanowire is performed based on transmission electron microscopy. It relies on a comprehensive analysis of scanning nanobeam electron…
Hyperspectral imaging (HSI) has been widely used in agricultural applications for non-destructive estimation of plant nutrient composition and precise quantification of sample nutritional elements. Recently, 3D reconstruction methods, such…
High-temperature superconductor $Bi_{2}Sr_{2}CaCu_{2}O_{8}+x$ has been investigated by the high-resolution electron microscope (HREM) and the photodensitometric technique in order to resolve the sub-atomic shifts in the modulated structure.…
Delineating farm boundaries through segmentation of satellite images is a fundamental step in many agricultural applications. The task is particularly challenging for smallholder farms, where accurate delineation requires the use of high…
Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…