Related papers: Near-field imaging beyond the probe aperture limit
The negatively-charged nitrogen-vacancy center (NV) in diamond forms a versatile system for quantum sensing applications. Combining the advantageous properties of this atomic-sized defect with scanning probe techniques such as atomic force…
First discovered by Ernest Abbe in 1873, the resolution limit of a far-field microscope is considered determined by the numerical aperture and wavelength of light, approximately $\lambda$/2NA. With the advent of modern fluorescence…
Near-field optical microscopes with two independent tips for simultaneous excitation and detection can be essential tools for studying localized optical phenomena on the subwavelength scale. Here, we report on the implementation of a fully…
Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not only takes a lot of instrument and operator time, but also…
The performance of tip-enhanced optical microscopy is often limited by inefficient coupling of the excitation field to the plasmonic tip apex, as well as by thermal drift and optical aberrations. Here, we demonstrate that adaptive wavefront…
Super-resolution effects in optical and fluorescence biological systems are analyzed and their relations with uncertainty relations are discussed. Super-resolutions obtained in the optical systems, including especially NSOM, SIM and…
Optical near-fields of small dielectric particles are of particular importance and interests for nanoscale optical engineering such as field localization, fabrication, characterization, sensing and imaging. This paper represents a…
Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far…
As science progresses at the nanoscopic level, it becomes more and more important to comprehend the interactions taking place at the nanoscale, where optical near-fields play a key role. Their phenomenology differs significantly from the…
Ultrafast electron microscopy aims for imaging transient phenomena occurring on nanoscale. One of its goals is to visualize localized optical and plasmonic modes generated by coherent excitation in the vicinity of various types of…
Many microscopy applications are limited by the total amount of usable light and are consequently challenged by the resulting levels of noise in the acquired images. This problem is often addressed via (supervised) deep learning based…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
A simple model of near-field pixel-to-pixel image transfer using magneto-inductive arrays is presented. The response of N-dimensional rectangular arrays is first found as an excitation of eigenmodes. This analytical method involves…
The resolution of near-field beamforming is an important metric to measure how effectively users with different locations can be located. This letter identifies the condition under which the resolution of near-field beamforming is not…
In computational phase imaging with a microscope equipped with an array of light emitting diodes as illumination unit, conventional Fourier ptychographic microscopy achieves high resolution and wide-field reconstructions but is constrained…
The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical…
We present an analytical description and an experimental realization of interscale mixing microscopy, a diffraction-based imaging technique that is capable of detecting wavelength/10 objects in far-field measurements with both coherent and…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
Fourier Ptychographic Microscopy (FPM) is a recent technique to overcome the diffraction limit of a low numerical aperture (NA) objective lens by algorithmic post-processing of several lower resolved images. It can increase the…
We demonstrate that a deep neural network can significantly improve optical microscopy, enhancing its spatial resolution over a large field-of-view and depth-of-field. After its training, the only input to this network is an image acquired…