Related papers: Electron Bessel beam diffraction for precise and a…
Electrochemical strains are a ubiquitous feature of solid state ionic devices ranging from ion batteries and fuel cells to electroresistive and memristive memories. Recently, we proposed a scanning probe microscopy (SPM) based approach,…
Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…
In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific…
Elastoresistivity, the relation between resistivity and strain, can elucidate subtle properties of the electronic structure of a material and is an increasingly important tool for the study of strongly correlated materials. To date,…
Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design.…
We present a method to measure transverse size and position of an electron or proton beam, close to the injection point in plasma wakefields, where other diagnostics are not available. We show that transverse size measurements are in…
The possibility of tailoring the critical strain of 2D materials will be crucial for the fabrication of flexible devices. In this paper, the fracture in polycrystalline MoS2 films with two different grain orientations is studied at the…
Fiber optical strain sensors are used to measure the strain at a particular sensor position inside the fiber. In order to deduce the strain in the surrounding matrix material, one can employ the strain transfer principle. Its application is…
Ultrafast Bessel beams demonstrate a significant capacity of structuring transparent materials with high degree of accuracy and exceptional aspect ratio. The ability to localize energy on the nanometer scale (bypassing the 100 nm milestone)…
Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is…
To obtain the best resolution for any measurement there is an ever-present challenge to achieve maximal differentiation between signal and noise over as fine of sampling dimensions as possible. In diffraction science these issues are…
Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…
The microscopic distribution of strain and stress plays a crucial role for the performance, safety, and lifetime of components in aeronautics, automotive and critical infrastructure [1]. While non-destructive methods for measuring the…
We show that torsion resonators can experience massive dissipation dilution due to nanoscale strain, and draw a connection to a century-old theory from the torsion balance community which suggests that a simple torsion ribbon is naturally…
We propose a spintronic strain sensor capable of sensing strain with a sensitivity of 1E-13/sqrt{Hz} at room temperature with an active sensing area of 1 cmE2 and power dissipation of 1 watt. This device measures strain by monitoring the…
Diffraction of high-energy X-rays produced at synchrotron sources can provide rapid strain measurements, with high spatial resolution, and good penetrating power. With an uncollimated diffracted beam, through thickness averages of strain…
Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a…
Diffraction gratings with high upward diffraction efficiency and large effective length are required for chip-scale light detection and ranging. In this paper, we propose a diffraction grating based on a multilayer silicon nitride…
Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…
When calculating residual strain via neutron or X-ray diffraction, uncertainties propagated from the peak fit are often inadequate to describe the true scatter of measurements about a singular strain state, such as one that should describe…