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Depth completion involves estimating a dense depth image from sparse depth measurements, often guided by a color image. While linear upsampling is straight forward, it results in artifacts including depth pixels being interpolated in empty…

Computer Vision and Pattern Recognition · Computer Science 2019-03-14 Saif Imran , Yunfei Long , Xiaoming Liu , Daniel Morris

An automated and accurate fabric defect inspection system is in high demand as a replacement for slow, inconsistent, error-prone, and expensive human operators in the textile industry. Previous efforts focused on certain types of fabrics or…

Computer Vision and Pattern Recognition · Computer Science 2022-04-21 Hao Zhou , Yixin Chen , David Troendle , Byunghyun Jang

In the journey of computer vision system development, the acquisition and utilization of annotated images play a central role, providing information about object identity, spatial extent, and viewpoint in depicted scenes. However, thermal…

Mesoscale and Nanoscale Physics · Physics 2025-09-09 Mohsen Asghari Ilani , Yaser Mike Banad

Model efficiency has become increasingly important in computer vision. In this paper, we systematically study neural network architecture design choices for object detection and propose several key optimizations to improve efficiency.…

Computer Vision and Pattern Recognition · Computer Science 2020-07-28 Mingxing Tan , Ruoming Pang , Quoc V. Le

Analyzing a huge amount of malware is a major burden for security analysts. Since emerging malware is often a variant of existing malware, automatically classifying malware into known families greatly reduces a part of their burden.…

Cryptography and Security · Computer Science 2022-10-25 Rikima Mitsuhashi , Takahiro Shinagawa

Automatic defect detection is a challenging task because of the variability in texture and type of fabric defects. An effective defect detection system enables manufacturers to improve the quality of processes and products. Automation…

Computer Vision and Pattern Recognition · Computer Science 2021-01-19 Samit Chakraborty , Marguerite Moore , Lisa Parrillo-Chapman

In this paper, we propose multi-stage and deformable deep convolutional neural networks for object detection. This new deep learning object detection diagram has innovations in multiple aspects. In the proposed new deep architecture, a new…

Computer Vision and Pattern Recognition · Computer Science 2014-09-12 Wanli Ouyang , Ping Luo , Xingyu Zeng , Shi Qiu , Yonglong Tian , Hongsheng Li , Shuo Yang , Zhe Wang , Yuanjun Xiong , Chen Qian , Zhenyao Zhu , Ruohui Wang , Chen-Change Loy , Xiaogang Wang , Xiaoou Tang

Accurate polyp segmentation in colonoscopy is essential for early colorectal cancer detection, yet real-world clinical environments pose persistent challenges such as motion blur, specular reflections, and illumination instability. Most…

Computer Vision and Pattern Recognition · Computer Science 2026-05-19 Zhuoyu Wu , Wenhui Ou , Lexi Zhang , Pei-Sze Tan , Dongjun Wu , Junhe Zhao , Wenqi Fang , Raphaël C. -W. Phan

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to…

Computer Vision and Pattern Recognition · Computer Science 2023-10-18 Nitish Shukla

Efficient quality control is inevitable in the manufacturing of light-emitting diodes (LEDs). Because defective LED chips may be traced back to different causes, a time and cost-intensive electrical and optical contact measurement is…

Image and Video Processing · Electrical Eng. & Systems 2020-04-02 Maike Lorena Stern , Martin Schellenberger

With the increased availability of condition monitoring data and the increased complexity of explicit system physics-based models, the application of data-driven approaches for fault detection and isolation has recently grown. While…

Systems and Control · Electrical Eng. & Systems 2020-01-01 Manuel Arias Chao , Chetan Kulkarni , Kai Goebel , Olga Fink

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is…

Computer Vision and Pattern Recognition · Computer Science 2023-10-18 Nitish Shukla

High-performance computing (HPC) requires resilience techniques such as checkpointing in order to tolerate failures in supercomputers. As the number of nodes and memory in supercomputers keeps on increasing, the size of checkpoint data also…

Distributed, Parallel, and Cluster Computing · Computer Science 2019-06-13 Kai Keller , Leonardo Bautista Gomez

Superpixel segmentation has recently seen important progress benefiting from the advances in differentiable deep learning. However, the very high-resolution superpixel segmentation still remains challenging due to the expensive memory and…

Computer Vision and Pattern Recognition · Computer Science 2021-08-24 Yaxiong Wang , Yunchao Wei , Xueming Qian , Li Zhu , Yi Yang

Deep neural networks have demonstrated state-of-the-art performance for feature-based image matching through the advent of new large and diverse datasets. However, there has been little work on evaluating the computational cost, model size,…

Computer Vision and Pattern Recognition · Computer Science 2021-02-08 Roy Miles , Krystian Mikolajczyk

Within (semi-)automated visual inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery. The…

Computer Vision and Pattern Recognition · Computer Science 2024-01-18 André Luiz B. Vieira e Silva , Francisco Simões , Danny Kowerko , Tobias Schlosser , Felipe Battisti , Veronica Teichrieb

Deep Learning (DL) has shown great promise in the unsupervised task of clustering. That said, while in classical (i.e., non-deep) clustering the benefits of the nonparametric approach are well known, most deep-clustering methods are…

Machine Learning · Computer Science 2022-03-29 Meitar Ronen , Shahaf E. Finder , Oren Freifeld

Medical imaging plays a vital role in modern diagnostics; however, interpreting high-resolution radiological data remains time-consuming and susceptible to variability among clinicians. Traditional image processing techniques often lack the…

Computer Vision and Pattern Recognition · Computer Science 2025-10-21 Melika Filvantorkaman , Maral Filvan Torkaman

Steel pipes are widely used in high-risk and high-pressure scenarios such as oil, chemical, natural gas, shale gas, etc. If there is some defect in steel pipes, it will lead to serious adverse consequences. Applying object detection in the…

Computer Vision and Pattern Recognition · Computer Science 2021-11-23 Dingming Yang , Yanrong Cui , Zeyu Yu , Hongqiang Yuan

Defects are a universal feature of crystalline solids, dictating the key properties and performance of many functional materials. Given their crucial importance yet inherent difficulty in measuring experimentally, computational methods…

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