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High pressure xenon Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double…

Electrochemistry is the underlying mechanism in a variety of energy conversion and storage systems, and it is well known that the composition, structure, and properties of electrochemical materials near active interfaces often deviates…

Materials Science · Physics 2018-02-07 Ahmad Eshghinejad , Ehsan Nasr Esfahani , Chihou Lei , Jiangyu Li

The advent of isolated and intense sub-femtosecond X-ray pulses enables tracking of quantummechanical motion of electrons in molecules and solids. The combination of X-ray spectroscopy and diffraction imaging is a powerful approach to…

Environmental transmission electron microscopy (E-TEM) enables direct observation of nanoscale chemical processes crucial for catalysis and materials design. However, the high-energy electron probe can dramatically alter reaction pathways…

Three-dimensional electron diffraction (3DED) is a powerful technique providing for crystal structure solutions of sub-micron sized crystals too small for structure determination via X-ray techniques. The entry requirement, however, of a…

Transmission electron microscopes (TEMs) enable atomic-scale imaging and characterisation, driving advances across fields from materials science to biology. Quantum correlations, specifically entanglement, may provide a basis for novel…

We conducted an inter-laboratory study of a metallic glass whose main component is nickel. Two determinations of the mass fractions of the different elements present within the sample were asked to the participants: one at an acceleration…

Materials Science · Physics 2015-09-02 Philippe Jonnard , François Brisset , Florence Robaut , Guillaume Wille , Jacky Ruste

We estimate the event rate for excitation of atomic transition by photino-like dark matter. For excitations of several eV, this event rate can exceed naive cross-section by many orders of magnitude. Although the event rate for these atomic…

High Energy Physics - Phenomenology · Physics 2009-10-28 Glenn D. Starkman , David N. Spergel

Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for low cost and accessible microstructural analysis. In this…

Materials Science · Physics 2025-10-17 Tianbi Zhang , Ruth Birch , Graeme Francolini , Ebru Karakurt Uluscu , Ben Britton

We introduce an approach for performing spectrally resolved electron microscopy without the need for an electron spectrometer. The method involves an electron beam prepared as a coherent superposition of multiple paths, one of which passes…

Materials Science · Physics 2025-04-24 F. Javier García de Abajo , Cruz I. Velasco

A non-destructive technique for obtaining voltage contrast information with photoelectron emission microscopy (PEEM) is described. Samples consisting of electrically isolated metal lines were used to quantify voltage contrast in PEEM. The…

Materials Science · Physics 2009-05-04 Vinod K. Sangwan , Vincent W. Ballarotto , Karen Siegrist , Ellen D. Williams

Electron beam energies in Transmission Electron Microscopes (TEMs) reach the relativistic realm constituting Quantum Electrodynamics (QED) the appropriate framework for the study of electron matter interaction in TEMs. We focus on the…

Atomic Physics · Physics 2026-01-12 Ioannis Iatrakis , Valerii Brudanin

Transition-edge sensors (TES) are photon-number resolving calorimetric spectrometers with near unit efficiency. Their recovery time, which is on the order of microseconds, limits the number resolving ability and timing accuracy in high…

Instrumentation and Detectors · Physics 2018-12-21 Jianwei Lee , Lijiong Shen , Alessandro Cerè , Thomas Gerrits , Adriana E. Lita , Sae Woo Nam , Christian Kurtsiefer

Progress in electron-beam spectroscopies has recently enabled the study of optical excitations with combined space, energy and time resolution in the nanometer, millielectronvolt and femtosecond domain, thus providing unique access into…

Optics · Physics 2019-11-13 Albert Polman , Mathieu Kociak , F. Javier García de Abajo

The Experiment to Detect the Global Epoch of Reionisation Signature (EDGES) collaboration has recently reported an important result related to the absorption signal in the Cosmic Microwave Background radiation spectrum. This signal…

General Relativity and Quantum Cosmology · Physics 2023-06-30 Saurya Das , Mitja Fridman , Gaetano Lambiase , Antonio Stabile , Elias C. Vagenas

The energy-energy correlator (EEC) is an event shape observable which probes the angular correlations of energy depositions in detectors at high energy collider facilities. It has been investigated extensively in the context of precision…

High Energy Physics - Phenomenology · Physics 2021-05-19 Hai Tao Li , Yiannis Makris , Ivan Vitev

Several theories of beyond-the-standard-model physics predict light scalars that couple to fermions. By extending classical electrodynamics to include an electron-scalar coupling, we calculate the nonlinear Thomson scattering of light…

High Energy Physics - Phenomenology · Physics 2019-03-06 Barry M. Dillon , B. King

We investigate the storage of light in an atomic sample with a lambda-type coupling scheme driven by optical fields at variable two-photon detuning. In the presence of electromagnetically induced transparency (EIT), light is stored and…

Atomic Physics · Physics 2015-05-13 Leon Karpa , Gor Nikoghosyan , Frank Vewinger , Michael Fleischhauer , Martin Weitz

Further progress in the development of ECR ion sources (ECRIS) requires deeper understanding of the underlying physics. One of the topics that remains obscure, though being crucial for the performance of the ECRIS, is the electron energy…

Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…