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Related papers: Amplitude dependence of resonance frequency and it…

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Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…

Applied Physics · Physics 2025-06-18 Kenichi Umeda , Karen Kamoshita , Noriyuki Kodera

In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions often depend on the tip velocity and the past tip trajectory.…

Mesoscale and Nanoscale Physics · Physics 2013-01-31 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Small oscillation amplitudes in dynamic atomic force microscopy can lead to invasive and high resolution imaging. Here we discuss small oscillation amplitude imaging in the context of ambient conditions and simultaneously excite the second…

Mesoscale and Nanoscale Physics · Physics 2014-01-30 Sergio Santos

In the Tapping mode, a variation of the oscillation amplitude and phase as a function of the tip sample distance is the necessary measurement to access quantitatively to the properties of the surface. In the present work, we give a…

Atomic and Molecular Clusters · Physics 2016-08-16 Jean-Pierre Aimé , Rodolphe Boisgard , Laurent Nony , Gérard Couturier

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

Materials Science · Physics 2007-05-23 Franz-Josef Elmer

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

Instrumentation and Detectors · Physics 2015-11-24 Luca Costa , Mario S Rodrigues

Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects of sidewall beam and its probe, an analytical method is…

Applied Physics · Physics 2020-09-15 Sina Eftekhar , Seyyed Mostafa Mousavi Janbeh Sarayi

Thermal fluctuation of the cantilever position sets a fundamental limit for the precision of any Scanning Force Microscope. In the present work we analyse how these fluctuations limit the determination of the resonance frequency of the…

Mesoscale and Nanoscale Physics · Physics 2010-03-03 J. Colchero , M. Cuenca , J. F. Gonzalez Martinez , J. Abad , E. Palacios-Lidon , J. Abellan

Pump and probe scalar atomic magnetometers show incredible potential for real-world, traditionally difficult measurement environments due to their high dynamic range and linearity. Previously, it has been assumed these scalar magnetometer…

Atomic Physics · Physics 2024-10-25 M. E. Limes , L. Rathbun , E. L. Foley , T. Kornack , Z. Hainsel , A. Braun

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…

Mesoscale and Nanoscale Physics · Physics 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholen , David B. Haviland

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…

Applied Physics · Physics 2024-06-19 Omur E Dagdeviren

Precision spectroscopy of atoms and molecules allows one to search for and to put stringent limits on the variation of fundamental constants. These experiments are typically interpreted in terms of variations of the fine structure constant…

We analyze time-resolved spontaneous emission from excitons confined in self-assembled $\mathrm{InAs}$ quantum dots placed at various distances to a semiconductor-air interface. The modification of the local density of optical states due to…

Other Condensed Matter · Physics 2010-11-05 Søren Stobbe , Jeppe Johansen , Philip Trøst Kristensen , Jørn M. Hvam , Peter Lodahl

The interactions between parametrically and directly driven vibration modes of a clamped-clamped beam resonator are studied. An integrated piezoelectric transducer is used for direct and parametric excitation. First, the parametric…

Mesoscale and Nanoscale Physics · Physics 2011-10-26 H. J. R. Westra , D. M. Karabacak , S. H. Brongersma , M. Crego-Calama , H. S. J. van der Zant , W. J. Venstra

The dynamic properties of membranes have been object of many researches since they can be used as sensor heads in different devices. Some methods have been proposed to solve the problem of determining the resonance frequencies and their…

Instrumentation and Detectors · Physics 2010-08-16 I. Lucas , R. P. del Real , M. D. Michelena , V. de Manuel , M. Duch , J. Esteve , J. A. Plaza

Strong frequency dependence is unlikely in diffusive or over-damped systems. When exceptions do occur, such as in the case of stochastic resonance, it signals an interesting underlying phenomenon. We find that such a case appears in the…

Statistical Mechanics · Physics 2015-12-11 Ayse Ferhan Yesil , M. Cemal Yalabik

We investigate whether the force and torque exerted by light pressure on an irregularly shaped dielectric resonator allow to detect resonant frequencies, delivering information complemental to the scattering cross section by mechanical…

Optics · Physics 2007-05-23 Henning Schomerus , Jan Wiersig , Martina Hentschel

We use a guiding center code ORBIT to study the broadening of resonances and the parametric dependence of the resonance frequency broadening width $\Delta\Omega$ on the nonlinear particle trapping frequency $\omega_b$ of wave-particle…

Plasma Physics · Physics 2018-08-01 G. Meng , N. N. Gorelenkov , V. N. Duarte , H. L. Berk , R. B. White , A. Bhattacharjee , X. G. Wang

Dynamic spectroscopies in Scanning Probe Microscopy (SPM) are critical for probing material properties, such as force interactions, mechanical properties, polarization switching, and electrochemical reactions and ionic dynamics. However,…

The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical…

Optics · Physics 2007-05-23 T. J. Kippenberg , H. Rokhsari , K. J. Vahala
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